Publications Details

Radiation Effects on Network on Chips (NoC) Laboratory Directed Research and Development (LDRD) project

Cannon, Matthew J.; Thelen, Paul M.; Kumar, Amiya; Drum, Peter J.; Tabaczynski, Andrew J.; Myers, Nicholas T.; Lee, David S.; Cardella, Antonia J.

This document details the findings from the FY25 RAD-Tech LDRD titled “Radiation Effects on NoC (Network on Chips).” We utilized the Versal FPGA from AMD as an exemplar platform for NoC. We conducted two radiation tests, one at Texas A&M University (TAMU) in June 2025 and another at Lawrence Berkeley National Laboratory (LBNL) in August 2025. These experiments showed that radiation could upset the NoC and that it experiences a variety of failures, that we could detect those upsets,