Publications Details

Layer-dependent measurements of electronic band alignment for individual MoS2 flakes supported on SiO2 using photoemission electron microscopy (PEEM) with deep ultraviolet illumination

Berg, Morgann B.; Ohta, Taisuke O.; Chan, Calvin C.; Keyshar, Kunttal; Mohite, Aditya D.; Bilgin, Ismail; Liu, Fangze; Yamaguchi, Hisato; Vajtai, Robert; Gupta, Gautam; Kar, Swastik; Ajayan, Pulickel

Abstract not provided.