Publications Details
Increased stuck-at fault coverage with reduced I sub DDQ test sets
Simplified ATPG and fault simulation algorithms, reduced test set sizes, and increased fault coverage are achieved with I {sub DDQ} testing for stuck-at faults. In addition, I {sub DDQ} testing will detect logically redundant and multiple stuck-at faults, and improve the detection of non-stuck-at fault defects. 17 refs., 6 figs., 6 tabs.