Publications Details

High resolution IDDQ characterization and testing - practical issues

Righter, Alan W.

IDDQ testing has become an important contributor to quality improvement of CMOS ICs. This paper describes high resolution IDDQ characterization and testing (from the sub-nA to μA level) and outlines test hardware and software issues. The physical basis of IDDQ is discussed. Methods for statistical analysis of IDDQ data are examined, as interpretation of the data is often as important as the measurement itself. Applications of these methods to set reasonable test limits for detecting defective product are demonstrated.