Publications Details

Defect Investigation of Regrown Vertical GaN p-n Diodes Using Deep-Level Optical Spectroscopy

Pickrell, Gregory P.; Armstrong, Andrew A.; Allerman, A.A.; Crawford, Mary H.; Feezell, D.; Monavarian, M.; Aragon, A.A.; Talin, A.A.; Leonard, Francois L.; Celio, Kimberlee C.; Glaser, Caleb E.; Kempisty, Jeffrey M.; Abate, Vincent M.

Abstract not provided.