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Corrosion of SA1388-1 diodes

Krska, C.; Stimetz, C.; Braithwaite, J.; Sorensen, R.; Hlava, P.

After 5 y storage at Allied Signal, a subassembly with SA1388-1 diodes failed testing and the cause was an unacceptable current leak rate in one of the diodes. This was traced to a CuS deposit in a single production lot of diodes; however only about 0.3% failed the specification. A study was performed to determine the cause and potential long-term significance of this problem. Probable cause was determined to be the P-bearing braze material not being compatible with the Ag immersion plating solution (cyanide-based) and to the storage environment containing sulfur.