Sandia National Laboratories, New Mexico
Dies
Schottky barrier diodes
Performance testing
Documentation
Doped materials
Electrical properties
Electrodes
Fabrication
Impact shock
Manufacturing
Mechanical vibrations
Quality assurance
Radiation hardening
Reliability
Semiconductor materials
Sensitivity
Service life
Specifications
Technology assessment
Temperature effects
Hardening
Materials
Physical properties
Physical radiation effects
Radiation effects
Semiconductor devices
Semiconductor diodes
Testing
360605* - Materials- Radiation Effects
420500 - Engineering- Materials Testing
426000 - Engineering- Components, Electron Devices & Circuits- (1990-)