Publications Details

A general purpose I{sub DDQ} measurement circuit

Righter, A.W.

A relatively high-speed I{sub DDQ} measurement circuit called QuiC-Mon is described. Depending upon IC settling times, upper measurement rates range from 50 kHz to 250 kHz at 100 nA resolution. It provides an inexpensive solution for fast, sensitive I{sub DDQ} measurements in CMOS IC wafer probe or packaged part production testing.