Atomistic simulations and In Situ TEM Compression of Sapphire Particles
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Acta Materialia
Nickel superalloys with cubic L1
Acta Materialia
The displacement damage induced in W and W-5 wt.% Re and W-5 wt.% Ta alloys by 2 MeV W+ irradiation to doses 3.3 × 1017-2.5 × 1019 W+/m2 at temperatures ranging from 300 to 750 °C has been characterised by transmission electron microscopy. An automated sizing and counting approach based on Image J (a Java-based image processing programme developed at the National Institutes of Health) [1] has been performed for all near-bulk irradiation data. In all cases the damage comprised dislocation loops, mostly of interstitial type, with Burgers vectors b = 1/2〈1 1 1〉 (>60%) and b = 〈1 0 0〉. The diameters of loops did not exceed 20 nm with most being ≤6 nm diameter. The loop number density varied between 1022 and 1023 loops/m3. With increasing irradiation temperature, the loop size distributions shifted towards larger sizes, and there was a substantial decrease in loop number densities. The damage microstructure was less sensitive to dose than to temperature. Under the same irradiation conditions, loop number densities in the W-Re and W-Ta alloys were higher than in pure W but loops were smaller. In grains with normals close to z = 〈0 0 1〉, loop strings developed in pure W at temperatures ≥500 °C and doses ≥1.2 dpa, but such strings were not observed in the W-Re or W-Ta alloys. However, in other grain orientations complex structures appeared in all materials and dense dislocation networks formed at higher doses.
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Applied Physics Letters
We study the interplay between the contributions of electron thermal flux and interface scattering to the Kapitza conductance across metal-metal interfaces through measurements of thermal conductivity of copper-niobium multilayers. Thermal conductivities of copper-niobium multilayer films of period thicknesses ranging from 5.4 to 96.2 nm and sample thicknesses ranging from 962 to 2677 nm are measured by time-domain thermoreflectance over a range of temperatures from 78 to 500 K. The Kapitza conductances between the Cu and Nb interfaces in multilayer films are determined from the thermal conductivities using a series resistor model and are in good agreement with the electron diffuse mismatch model. Our results for the thermal boundary conductance between Cu and Nb are compared to literature values for the thermal boundary conductance across Al-Cu and Pd-Ir interfaces, and demonstrate that the interface conductance in metallic systems is dictated by the temperature derivative of the electron energy flux in the metallic layers, rather than electron mean free path or scattering processes at the interface.
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Acta Materialia
We report on the use of quantitative in situ microcompression experiments in a scanning electron microscope to systematically investigate the effect of self-ion irradiation damage on the full plastic response of <111> Ni. In addition to the well-known irradiationinduced increases in the yield and flow strengths with increasing dose, we measure substantial changes in plastic flow intermittency behavior, manifested as stress drops accompanying energy releases as the driven material transits critical states. At low irradiation doses, the magnitude of stress drops reduces relative to the unirradiated material and plastic slip proceeds on multiple slip systems, leading to quasi-homogeneous plastic flow. In contrast, highly irradiated specimens exhibit pronounced shear localization on parallel slip planes, which we ascribe to the onset of defect free channels normally seen in bulk irradiated materials. Our in situ testing system and approach allows for a quantitative study of the energy release and dynamics associated with defect free channel formation and subsequent localization. As a result, this study provides fundamental insight to the nature of interactions between mobile dislocations and irradiation-mediated and damage-dependent defect structures.