Publications

McLain, Michael L.; McDonald, Joseph K.; Hembree, Charles E.; Hartman, Elmer F.; Harper-Slaboszewicz, V.H.; Sheridan, Timothy J.

Abstract not provided.

IEEE Transactions on Nuclear Science

McLain, Michael L.; McDonald, Joseph K.; Hembree, Charles E.; Sheridan, Timothy J.; Weingartner, Thomas A.; Dodd, Paul E.; Shaneyfelt, Marty R.; Hartman, Elmer F.; Black, Dolores A.

The effect of a linear accelerator's (LINAC's) microstructure (i.e., train of narrow pulses) on devices and the associated transient photocurrent models are investigated. The data indicate that the photocurrent response of Si-based RF bipolar junction transistors and RF p-i-n diodes is considerably higher when taking into account the microstructure effects. Similarly, the response of diamond, SiO2, and GaAs photoconductive detectors (standard radiation diagnostics) is higher when taking into account the microstructure. This has obvious hardness assurance implications when assessing the transient response of devices because the measured photocurrent and dose rate levels could be underestimated if microstructure effects are not captured. Indeed, the rate the energy is deposited in a material during the microstructure peaks is much higher than the filtered rate which is traditionally measured. In addition, photocurrent models developed with filtered LINAC data may be inherently inaccurate if a device is able to respond to the microstructure.

McLain, Michael L.; McDonald, Joseph K.; Hembree, Charles E.; Sheridan, Timothy J.; Weingartner, Thomas A.; Dodd, Paul E.; Shaneyfelt, Marty R.; Hartman, Elmer F.; Black, Dolores A.

Abstract not provided.

Bielejec, Edward S.; Hembree, Charles E.; McDonald, Joseph K.; Wampler, William R.; Sheridan, Timothy J.; Griffin, Patrick J.

Abstract not provided.

IEEE Transactions on Nuclear Science

McLain, Michael L.; Hjalmarson, Harold P.; Sheridan, Timothy J.; Mickel, Patrick R.; Hanson, Donald J.; McDonald, Joseph K.; Hughart, David R.; Marinella, Matthew J.

This paper investigates the effects of high dose rate ionizing radiation and total ionizing dose (TID) on tantalum oxide (TaOx) memristors. Transient data were obtained during the pulsed exposures for dose rates ranging from approximately 5.0 × 107rad(Si)/s to 4.7 × 108rad(Si)/s and for pulse widths ranging from 50 ns to 50 μs. The cumulative dose in these tests did not appear to impact the observed dose rate response. Static dose rate upset tests were also performed at a dose rate of ∼3.0 × 108rad(Si)/s. This is the first dose rate study on any type of memristive memory technology. In addition to assessing the tolerance of TaOx memristors to high dose rate ionizing radiation, we also evaluated their susceptibility to TID. The data indicate that it is possible for the devices to switch from a high resistance off-state to a low resistance on-state in both dose rate and TID environments. The observed radiation-induced switching is dependent on the irradiation conditions and bias configuration. Furthermore, the dose rate or ionizing dose level at which a device switches resistance states varies from device to device; the enhanced susceptibility observed in some devices is still under investigation. Numerical simulations are used to qualitatively capture the observed transient radiation response and provide insight into the physics of the induced current/voltages.

McLain, Michael L.; Sheridan, Timothy J.; Hjalmarson, Harold P.; Mickel, Patrick R.; Hanson, Donald J.; McDonald, Joseph K.; Hughart, David R.; Marinella, Matthew J.

Abstract not provided.

Hartman, Elmer F.; Zarick, Thomas A.; Sheridan, Timothy J.

We performed measurements and analyses of the prompt radiation-induced conductivity (RIC) in thin samples of polyurethane foam and glass microballoon foam at the Little Mountain Medusa LINAC facility in Ogden, UT. The RIC coefficient was non-linear with dose rate for polyurethane foam; however, typical values at 1E11 rad(si)/s dose rate was measured as 0.8E-11 mho/m/rad/s for 5 lb./cu ft. foam and 0.3E-11 mho/m/rad/s for 10 lb./cu ft. density polyurethane foam. For encapsulated glass microballoons (GMB) the RIC coefficient was approximately 1E-15 mho/m/rad/s and was not a strong function of dose rate.

McDonald, Joseph K.; Sheridan, Timothy J.; Chantler, Gary C.; Mickel, Patrick R.; Hanson, Donald J.; Hughart, David R.; Marinella, Matthew J.

Abstract not provided.

Hartman, Elmer F.; Zarick, Thomas A.; McLain, Michael L.; Sheridan, Timothy J.

In this report, measurements of the prompt radiation-induced conductivity (RIC) in 3 mil samples of Pyralux® are presented as a function of dose rate, pulse width, and applied bias. The experiments were conducted with the Medusa linear accelerator (LINAC) located at the Little Mountain Test Facility (LMTF) near Ogden, UT. The nominal electron energy for the LINAC is 20 MeV. Prompt conduction current data were obtained for dose rates ranging from ~2 x 10⁹ rad(Si)/s to ~1.1 x 10¹¹ rad(Si)/s and for nominal pulse widths of 50 ns and 500 ns. At a given dose rate, the applied bias across the samples was stepped between -1500 V and 1500 V. Calculated values of the prompt RIC varied between 1.39x10^-8 Ω^-1 · m^-1 and 2.67x10^-7 Ω^-1 · m^-1 and the prompt RIC coefficient varied between 1.25x10^-18 Ω^-1 · m^-1/(rad/s) and 1.93x10^-17 Ω^-1 · m^-1/(rad/s).

IEEE Transactions on Nuclear Science

McLain, Michael L.; Hartman, Elmer F.; Hjalmarson, Harold P.; Zarick, Thomas A.; Sheridan, Timothy J.; Gleason, Joseph G.

Abstract not provided.

Hjalmarson, Harold P.; Zarick, Thomas A.; Hartman, Elmer F.; Gleason, Joseph G.; McLain, Michael L.; Sheridan, Timothy J.

Abstract not provided.

Hartman, Elmer F.; Zarick, Thomas A.; Sheridan, Timothy J.

We performed measurements of the prompt radiation induced conductivity (RIC) in thin samples of Teflon (PTFE) at the Little Mountain Medusa LINAC facility in Ogden, UT. Three mil (76.2 microns) samples were irradiated with a 0.5 %CE%BCs pulse of 20 MeV electrons, yielding dose rates of 1E9 to 1E11 rad/s. We applied variable potentials up to 2 kV across the samples and measured the prompt conduction current. Details of the experimental apparatus and analysis are reported in this report on prompt RIC in Teflon.

McLain, Michael L.; Hartman, Elmer F.; Hjalmarson, Harold P.; Zarick, Thomas A.; Sheridan, Timothy J.

Abstract not provided.

McLain, Michael L.; Hartman, Elmer F.; Hjalmarson, Harold P.; Zarick, Thomas A.; Sheridan, Timothy J.

Abstract not provided.

McLain, Michael L.; Hartman, Elmer F.; Hjalmarson, Harold P.; Zarick, Thomas A.; Sheridan, Timothy J.

Abstract not provided.

McLain, Michael L.; Zarick, Thomas A.; Hartman, Elmer F.; Hjalmarson, Harold P.; Sheridan, Timothy J.

Abstract not provided.

McLain, Michael L.; Hartman, Elmer F.; Zarick, Thomas A.; Sheridan, Timothy J.

Abstract not provided.

Hartman, Elmer F.; Zarick, Thomas A.; Sheridan, Timothy J.

We performed measurements of the prompt radiation induced conductivity in thin samples of Alumina and Sapphire at the Little Mountain Medusa LINAC facility in Ogden, UT. Five mil thick samples were irradiated with pulses of 20 MeV electrons, yielding dose rates of 1E7 to 1E9 rad/s. We applied variable potentials up to 1 kV across the samples and measured the prompt conduction current. Analysis rendered prompt conductivity coefficients between 1E10 and 1E9 mho/m/(rad/s), depending on the dose rate and the pulse width for Alumina and 1E7 to 6E7 mho/m/(rad/s) for Sapphire.

Zarick, Thomas A.; Sheridan, Timothy J.; Hartman, Elmer F.

Abstract not provided.

Hartman, Elmer F.; Zarick, Thomas A.; Sheridan, Timothy J.

We performed measurements of the prompt radiation induced conductivity in thin samples of Kapton (polyimide) at the Little Mountain Medusa LINAC facility in Ogden, UT. Three mil samples were irradiated with a 0.5 {mu}s pulse of 20 MeV electrons, yielding dose rates of 1E9 to 1E10 rad/s. We applied variable potentials up to 2 kV across the samples and measured the prompt conduction current. Analysis rendered prompt conductivity coefficients between 6E-17 and 2E-16 mhos/m per rad/s, depending on the dose rate and the pulse width.

Harper-Slaboszewicz, V.H.; Hartman, Elmer F.; Shaneyfelt, Marty R.; Schwank, James R.; Sheridan, Timothy J.

A series of experiments on the MEDUSA linear accelerator radiation test facility were performed to evaluate the difference in dose measured using different methods. Significant differences in dosimeter-measured radiation dose were observed for the different dosimeter types for the same radiation environments, and the results are compared and discussed in this report.

Griffin, Patrick J.; Bielejec, Edward S.; Hembree, Charles E.; McDonald, Joseph K.; Sheridan, Timothy J.; Harper-Slaboszewicz, V.H.

Abstract not provided.

Bielejec, Edward S.; Hembree, Charles E.; McDonald, Joseph K.; Wampler, William R.; Fleming, Robert M.; Sheridan, Timothy J.; Harper-Slaboszewicz, V.H.; Griffin, Patrick J.

Abstract not provided.

McDonald, Joseph K.; Sheridan, Timothy J.; King, Donald B.; Hembree, Charles E.

Abstract not provided.

Hartman, Elmer F.; Zarick, Thomas A.; Sheridan, Timothy J.

Using a differential absorption spectrometer we obtained experimental spectral information for the PITHON Flash X-ray Machine located in San Leandro, California at L-3 Communications. Spectral information we obtained pertained to the 200 keV to 800 keV endpoint operation of PITHON. We also obtained data on the temporal behavior of high energy and low energy spectral content.