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Survivable debris shields for laboratory soft x-ray simulation sources

Spielman, Rick B.

A survivable debris shield is necessary if very high levels of cleanliness are to be achieved on samples exposed to soft x rays from laboratory simulation sources. These samples, often of optical quality, require a low or zero debris environment in order to distinguish low levels of soft x-ray damage from debris-induced effects. We will describe the development of survivable debris shield technology on the Sandia National Laboratories` Saturn x-ray simulation facility, which permits ultraclean exposure over sample areas of 58 cm{sup 2} {at} {approximately}0.35 cal/cm{sup 2}, 5 cm{sup 2}{at} {approximately}0.8 cal/cm{sup 2}, cm{sup 2}, 2.8 cm{sup 2} {at} {approximately}1.2 cal/cm{sup 2}, and 0.8 cm{sup 2} {at} {approximately}1.5 cal/cm{sup 2} with 3-keV argon K-shell photons. These new fluence-area produce test capabilities represent an order-of-magnitude improvement in the state of the art (previously 0.25 cm{sup 2} {at} {approximately} 1 cal/cm{sup 2} or 1.0 cm{sup 2} {at} {approximately}0.35 cal/cm{sup 2}) for soft x-ray simulators.