Publications
Full stress tensor measurement using fluorescence spectroscopy
Photoluminescent spectral peak positions are known to shift as a function of mechanical stress state. This has been demonstrated at macroscales to determine mean stress and mesoscales to determine mean stress and a quantity related to shear stress. Here, we propose a method to utilize traction-free surface conditions and knowledge of material orientation to solve for two in-plane displacement fields given two measured spectral peak positions measured at a grid of points. It is then possible to calculate the full stress tensor at each measurement point. This is a significant advancement over the previous ability to measure one or two stress quantities. We validate the proposed method using a simple, two-grain geometry and show that it produces the same mean stress and shear stress measure as the existing direct method. We also demonstrate determination of the full stress field in a polycrystalline alumina specimen.