Publications Details

Full stress tensor measurement using fluorescence spectroscopy

Grutzik, Scott J.; Teague, Melissa C.

Photoluminescent spectral peak positions are known to shift as a function of mechanical stress state. This has been demonstrated at macroscales to determine mean stress and mesoscales to determine mean stress and a quantity related to shear stress. Here, we propose a method to utilize traction-free surface conditions and knowledge of material orientation to solve for two in-plane displacement fields given two measured spectral peak positions measured at a grid of points. It is then possible to calculate the full stress tensor at each measurement point. This is a significant advancement over the previous ability to measure one or two stress quantities. We validate the proposed method using a simple, two-grain geometry and show that it produces the same mean stress and shear stress measure as the existing direct method. Furthermore, we also demonstrate determination of the full stress field in a polycrystalline alumina specimen.