Publications Details

Effects of low-fluence helium plasma exposure characterized by helium ion microscopy scanning probes and in-situ ellipsometry

Kolasinski, Robert K.; Dasgupta, Dwaipayan; Wong, Chun-Shang W.; Friddle, Raymond W.; Engel, Aaron; Buchenauer, D.A.; Maroudas, Dimitrios; Wirth, Brian

Abstract not provided.