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Contribution of deep-level defects to decreasing radiative efficiency of InGaN/GaN quantum wells with increasing emission wavelength

Armstrong, Andrew A.; Crawford, Mary H.; Koleske, Daniel K.

Deep-level optical spectroscopy (DLOS) and photoluminescence (PL) were used to understand the role of defects in reducing the internal quantum efficiency (IQE) of InxGa1-xN/GaN multiple quantum wells (MQWs) as the emission wavelength increased from approximately 450 to 530 nm, i.e., the "green gap". DLOS studies of light emitting diodes (LEDs) identified QW defects whose concentration increased significantly with increasing x. The effect of increased QW defect density on IQE was assessed by examining the PL of MQW samples. Green-emitting MQWs had lower IQE and required higher pump power to reach peak IQE, corroborating the important impact of enhanced non-radiative recombination at defects. © 2014 The Japan Society of Applied Physics.