Publications

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Neural networks are largely based on matrix computations. During forward inference, the most heavily used compute kernel is the matrix-vector multiplication (MVM): $W \vec{x} $. Inference is a first frontier for the deployment of next-generation hardware for neural network applications, as it is more readily deployed in edge devices, such as mobile devices or embedded processors with size, weight, and power constraints. Inference is also easier to implement in analog systems than training, which has more stringent device requirements. The main processing kernel used during inference is the MVM.

We demonstrate SONOS (silicon-oxide-nitride-oxide-silicon) analog memory arrays that are optimized for neural network inference. The devices are fabricated in a 40nm process and operated in the subthreshold regime for in-memory matrix multiplication. Subthreshold operation enables low conductances to be implemented with low error, which matches the typical weight distribution of neural networks, which is heavily skewed toward near-zero values. This leads to high accuracy in the presence of programming errors and process variations. We simulate the end-To-end neural network inference accuracy, accounting for the measured programming error, read noise, and retention loss in a fabricated SONOS array. Evaluated on the ImageNet dataset using ResNet50, the accuracy using a SONOS system is within 2.16% of floating-point accuracy without any retraining. The unique error properties and high On/Off ratio of the SONOS device allow scaling to large arrays without bit slicing, and enable an inference architecture that achieves 20 TOPS/W on ResNet50, a > 10× gain in energy efficiency over state-of-The-Art digital and analog inference accelerators.

Non-volatile memory arrays require select devices to ensure accurate programming. The one-selector one-resistor (1S1R) array where a two-terminal nonlinear select device is placed in series with a resistive memory element is attractive due to its high-density data storage; however, the effect of the nonlinear select device on the accuracy of analog in-memory computing has not been explored. This work evaluates the impact of select and memory device properties on the results of analog matrix-vector multiplications. We integrate nonlinear circuit simulations into CrossSim and perform end-to-end neural network inference simulations to study how the select device affects the accuracy of neural network inference. We propose an adjustment to the input voltage that can effectively compensate for the electrical load of the select device. Our results show that for deep residual networks trained on CIFAR-10, a compensation that is uniform across all devices in the system can mitigate these effects over a wide range of values for the select device I-V steepness and memory device On/Off ratio. A realistic I-V curve steepness of 60 mV/dec can yield an accuracy on CIFAR-10 that is within 0.44% of the floating-point accuracy.

As transistors have been scaled over the past decade, modern systems have become increasingly susceptible to faults. Increased transistor densities and lower capacitances make a particle strike more likely to cause an upset. At the same time, complex computer systems are increasingly integrated into safety-critical systems such as autonomous vehicles. These two trends make the study of system reliability and fault tolerance essential for modern systems. To analyze and improve system reliability early in the design process, new tools are needed for RTL fault analysis.This paper proposes Eris, a novel framework to identify vulnerable components in hardware designs through fault-injection and fault propagation tracking. Eris builds on ESSENT - a fast C/C++ RTL simulation framework - to provide fault injection, fault tracking, and control-flow deviation detection capabilities for RTL designs. To demonstrate Eris' capabilities, we analyze the reliability of the open source Rocket Chip SoC by randomly injecting faults during thousands of runs on four microbenchmarks. As part of this analysis we measure the sensitivity of different hardware structures to faults based on the likelihood of a random fault causing silent data corruption, unrecoverable data errors, program crashes, and program hangs. We detect control flow deviations and determine whether or not they are benign. Additionally, using Eris' novel fault-tracking capabilities we are able to find 78% more vulnerable components in the same number of simulations compared to RTL-based fault injection techniques without these capabilities. We will release Eris as an open-source tool to aid future research into processor reliability and hardening.

As transistors have been scaled over the past decade, modern systems have become increasingly susceptible to faults. Increased transistor densities and lower capacitances make a particle strike more likely to cause an upset. At the same time, complex computer systems are increasingly integrated into safety-critical systems such as autonomous vehicles. These two trends make the study of system reliability and fault tolerance essential for modern systems. To analyze and improve system reliability early in the design process, new tools are needed for RTL fault analysis.This paper proposes Eris, a novel framework to identify vulnerable components in hardware designs through fault-injection and fault propagation tracking. Eris builds on ESSENT - a fast C/C++ RTL simulation framework - to provide fault injection, fault tracking, and control-flow deviation detection capabilities for RTL designs. To demonstrate Eris' capabilities, we analyze the reliability of the open source Rocket Chip SoC by randomly injecting faults during thousands of runs on four microbenchmarks. As part of this analysis we measure the sensitivity of different hardware structures to faults based on the likelihood of a random fault causing silent data corruption, unrecoverable data errors, program crashes, and program hangs. We detect control flow deviations and determine whether or not they are benign. Additionally, using Eris' novel fault-tracking capabilities we are able to find 78% more vulnerable components in the same number of simulations compared to RTL-based fault injection techniques without these capabilities. We will release Eris as an open-source tool to aid future research into processor reliability and hardening.

To support the increasing demands for efficient deep neural network processing, accelerators based on analog in-memory computation of matrix multiplication have recently gained significant attention for reducing the energy of neural network inference. However, analog processing within memory arrays must contend with the issue of parasitic voltage drops across the metal interconnects, which distort the results of the computation and limit the array size. This work analyzes how parasitic resistance affects the end-to-end inference accuracy of state-of-the-art convolutional neural networks, and comprehensively studies how various design decisions at the device, circuit, architecture, and algorithm levels affect the system's sensitivity to parasitic resistance effects. A set of guidelines are provided for how to design analog accelerator hardware that is intrinsically robust to parasitic resistance, without any explicit compensation or re-training of the network parameters.

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This project aimed to identify the performance-limiting mechanisms in mid- to far infrared (IR) sensors by probing photogenerated free carrier dynamics in model detector materials using scanning ultrafast electron microscopy (SUEM). SUEM is a recently developed method based on using ultrafast electron pulses in combination with optical excitations in a pump- probe configuration to examine charge dynamics with high spatial and temporal resolution and without the need for microfabrication. Five material systems were examined using SUEM in this project: polycrystalline lead zirconium titanate (a pyroelectric), polycrystalline vanadium dioxide (a bolometric material), GaAs (near IR), InAs (mid IR), and Si/SiO 2 system as a prototypical system for interface charge dynamics. The report provides detailed results for the Si/SiO 2 and the lead zirconium titanate systems.

Automated vehicles (AV) hold great promise for improving safety, as well as reducing congestion and emissions. In order to make automated vehicles commercially viable, a reliable and highperformance vehicle-based computing platform that meets ever-increasing computational demands will be key. Given the state of existing digital computing technology, designers will face significant challenges in meeting the needs of highly automated vehicles without exceeding thermal constraints or consuming a large portion of the energy available on vehicles, thus reducing range between charges or refills. The accompanying increases in energy for AV use will place increased demand on energy production and distribution infrastructure, which also motivates increasing computational energy efficiency.

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Integration-technology feature shrink increases computing-system susceptibility to single-event effects (SEE). While modeling SEE faults will be critical, an integrated processor's scope makes physically correct modeling computationally intractable. Without useful models, presilicon evaluation of fault-tolerance approaches becomes impossible. To incorporate accurate transistor-level effects at a system scope, we present a multiscale simulation framework. Charge collection at the 1) device level determines 2) circuit-level transient duration and state-upset likelihood. Circuit effects, in turn, impact 3) register-transfer-level architecture-state corruption visible at 4) the system level. Thus, the physically accurate effects of SEEs in large-scale systems, executed on a high-performance computing (HPC) simulator, could be used to drive cross-layer radiation hardening by design. We demonstrate the capabilities of this model with two case studies. First, we determine a D flip-flop's sensitivity at the transistor level on 14-nm FinFet technology, validating the model against published cross sections. Second, we track and estimate faults in a microprocessor without interlocked pipelined stages (MIPS) processor for Adams 90% worst case environment in an isotropic space environment.

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Over the past decade as Moore's Law has slowed, the need for new forms of computation that can provide sustainable performance improvements has risen. A new method, called in situ computing, has shown great potential to accelerate matrix vector multiplication (MVM), an important kernel for a diverse range of applications from neural networks to scientific computing. Existing in situ accelerators for scientific computing, however, have a significant limitation: These accelerators provide no acceleration for preconditioning-A key bottleneck in linear solvers and in scientific computing workflows. This paper enables in situ acceleration for state-of-The-Art linear solvers by demonstrating how to use a new in situ matrix inversion accelerator for analog preconditioning. As existing techniques that enable high precision and scalability for in situ MVM are inapplicable to in situ matrix inversion, new techniques to compensate for circuit non-idealities are proposed. Additionally, a new approach to bit slicing that enables splitting operands across multiple devices without external digital logic is proposed. For scalability, this paper demonstrates how in situ matrix inversion kernels can work in tandem with existing domain decomposition techniques to accelerate the solutions of arbitrarily large linear systems. The analog kernel can be directly integrated into existing preconditioning workflows, leveraging several well-optimized numerical linear algebra tools to improve the behavior of the circuit. The result is an analog preconditioner that is more effective (up to 50% fewer iterations) than the widely used incomplete LU factorization preconditioner, ILU(0), while also reducing the energy and execution time of each approximate solve operation by 1025x and 105x respectively.

Over the past decade as Moore's Law has slowed, the need for new forms of computation that can provide sustainable performance improvements has risen. A new method, called in situ computing, has shown great potential to accelerate matrix vector multiplication (MVM), an important kernel for a diverse range of applications from neural networks to scientific computing. Existing in situ accelerators for scientific computing, however, have a significant limitation: These accelerators provide no acceleration for preconditioning-A key bottleneck in linear solvers and in scientific computing workflows. This paper enables in situ acceleration for state-of-The-Art linear solvers by demonstrating how to use a new in situ matrix inversion accelerator for analog preconditioning. As existing techniques that enable high precision and scalability for in situ MVM are inapplicable to in situ matrix inversion, new techniques to compensate for circuit non-idealities are proposed. Additionally, a new approach to bit slicing that enables splitting operands across multiple devices without external digital logic is proposed. For scalability, this paper demonstrates how in situ matrix inversion kernels can work in tandem with existing domain decomposition techniques to accelerate the solutions of arbitrarily large linear systems. The analog kernel can be directly integrated into existing preconditioning workflows, leveraging several well-optimized numerical linear algebra tools to improve the behavior of the circuit. The result is an analog preconditioner that is more effective (up to 50% fewer iterations) than the widely used incomplete LU factorization preconditioner, ILU(0), while also reducing the energy and execution time of each approximate solve operation by 1025x and 105x respectively.

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Analog hardware accelerators, which perform computation within a dense memory array, have the potential to overcome the major bottlenecks faced by digital hardware for data-heavy workloads such as deep learning. Exploiting the intrinsic computational advantages of memory arrays, however, has proven to be challenging principally due to the overhead imposed by the peripheral circuitry and due to the non-ideal properties of memory devices that play the role of the synapse. We review the existing implementations of these accelerators for deep supervised learning, organizing our discussion around the different levels of the accelerator design hierarchy, with an emphasis on circuits and architecture. We explore and consolidate the various approaches that have been proposed to address the critical challenges faced by analog accelerators, for both neural network inference and training, and highlight the key design trade-offs underlying these techniques.

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Non-volatile memory arrays can deploy pre-trained neural network models for edge inference. However, these systems are affected by device-level noise and retention issues. Here, we examine damage caused by these effects, introduce a mitigation strategy, and demonstrate its use in fabricated array of SONOS (Silicon-Oxide-Nitride-Oxide-Silicon) devices. On MNIST, fashion-MNIST, and CIFAR-10 tasks, our approach increases resilience to synaptic noise and drift. We also show strong performance can be realized with ADCs of 5-8 bits precision.