Multiscale Modeling of Single Event-Induced Faults in FinFET-based Processors
Cannon, Matthew J.; Rodrigues, Arun; Black, Dolores A.; Black, Jeffrey B.; Bustamante, Luis G.; Feinberg, Benjamin F.; Clark,
L.; Brunhaver, John B.; Barnaby, Hugh B.; Agarwal, Sapan A.; Marinella, Matthew J.
Abstract not provided.