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Accomplishments of Sandia and Kitware CMake/CTest/CDash Contract for (FY2017-2020)

Bartlett, Roscoe; Galbreath, Zack

We describe the accomplishments jointly achieved by Kitware and Sandia over the fiscal years 2016 through 2020 to benefit the Advanced Scientific Computed (ASC) Advanced Technology Development and Mitigation (ATDM) project. As a result of our collaboration, we have improved the Trilinos and ATDM application developer experience by decreasing the time to build, making it easier to identify and resolve build and test defects, and addressing other issues . We have also reduced the turnaround time for continuous integration (CI) results. For example, the combined improvements likely cut the wall clock time to run automated builds of Trilinos posting to CDash by approximately 6x or more in many cases. We primarily achieved these benefits by contributing changes to the Kitware CMake/CTest/CDash suite of open source software development support tools. As a result, ASC developers can now spend more time improving code and less time chasing bugs. And, without this work, one can argue that the stabilization of Trilinos for the ATDM platforms would not have been feasible which would have had a large negative impact on an important internal FY20 L1 milestone.

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Extending sparse tensor accelerators to support multiple compression formats

Proceedings - 2021 IEEE 35th International Parallel and Distributed Processing Symposium, IPDPS 2021

Qin, Eric; Jeong, Geonhwa; Won, William; Kao, Sheng C.; Kwon, Hyoukjun; Das, Dipankar; Moon, Gordon E.; Rajamanickam, Sivasankaran; Krishna, Tushar

Sparsity, which occurs in both scientific applications and Deep Learning (DL) models, has been a key target of optimization within recent ASIC accelerators due to the potential memory and compute savings. These applications use data stored in a variety of compression formats. We demonstrate that both the compactness of different compression formats and the compute efficiency of the algorithms enabled by them vary across tensor dimensions and amount of sparsity. Since DL and scientific workloads span across all sparsity regions, there can be numerous format combinations for optimizing memory and compute efficiency. Unfortunately, many proposed accelerators operate on one or two fixed format combinations. This work proposes hardware extensions to accelerators for supporting numerous format combinations seamlessly and demonstrates ∼ 4 × speedup over performing format conversions in software.

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Data-driven learning of nonautonomous systems

SIAM Journal on Scientific Computing

Qin, Tong; Chen, Zhen; Jakeman, John D.; Xiu, Dongbin

We present a numerical framework for recovering unknown nonautonomous dynamical systems with time-dependent inputs. To circumvent the difficulty presented by the nonautonomous nature of the system, our method transforms the solution state into piecewise integration of the system over a discrete set of time instances. The time-dependent inputs are then locally parameterized by using a proper model, for example, polynomial regression, in the pieces determined by the time instances. This transforms the original system into a piecewise parametric system that is locally time invariant. We then design a deep neural network structure to learn the local models. Once the network model is constructed, it can be iteratively used over time to conduct global system prediction. We provide theoretical analysis of our algorithm and present a number of numerical examples to demonstrate the effectiveness of the method.

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Multiscale System Modeling of Single-Event-Induced Faults in Advanced Node Processors

IEEE Transactions on Nuclear Science

Cannon, Matthew J.; Rodrigues, Arun; Black, Dolores A.; Black, Jeff; Bustamante, Luis; Feinberg, Benjamin M.; Quinn, Heather M.; Clark, Lawrence T.; Brunhaver, John S.; Barnaby, Hugh; Mclain, Michael; Agarwal, Sapan; Marinella, Matthew

Integration-technology feature shrink increases computing-system susceptibility to single-event effects (SEE). While modeling SEE faults will be critical, an integrated processor's scope makes physically correct modeling computationally intractable. Without useful models, presilicon evaluation of fault-tolerance approaches becomes impossible. To incorporate accurate transistor-level effects at a system scope, we present a multiscale simulation framework. Charge collection at the 1) device level determines 2) circuit-level transient duration and state-upset likelihood. Circuit effects, in turn, impact 3) register-transfer-level architecture-state corruption visible at 4) the system level. Thus, the physically accurate effects of SEEs in large-scale systems, executed on a high-performance computing (HPC) simulator, could be used to drive cross-layer radiation hardening by design. We demonstrate the capabilities of this model with two case studies. First, we determine a D flip-flop's sensitivity at the transistor level on 14-nm FinFet technology, validating the model against published cross sections. Second, we track and estimate faults in a microprocessor without interlocked pipelined stages (MIPS) processor for Adams 90% worst case environment in an isotropic space environment.

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Simulation of powder bed metal additive manufacturing microstructures with coupled finite difference-Monte Carlo method

Additive Manufacturing

Rodgers, Theron M.; Abdeljawad, Fadi; Moser, Daniel R.; Bays, Nathan R.; Carroll, J.D.; Jared, Bradley H.; Bolintineanu, Dan S.; Mitchell, John A.; Madison, Jonathan D.

Grain-scale microstructure evolution during additive manufacturing is a complex physical process. As with traditional solidification methods of material processing (e.g. casting and welding), microstructural properties are highly dependent on the solidification conditions involved. Additive manufacturing processes however, incorporate additional complexity such as remelting, and solid-state evolution caused by subsequent heat source passes and by holding the entire build at moderately high temperatures during a build. We present a three-dimensional model that simulates both solidification and solid-state evolution phenomena using stochastic Monte Carlo and Potts Monte Carlo methods. The model also incorporates a finite-difference based thermal conduction solver to create a fully integrated microstructural prediction tool. The three modeling methods and their coupling are described and demonstrated for a model study of laser powder-bed fusion of 300-series stainless steel. The investigation demonstrates a novel correlation between the mean number of remelting cycles experienced during a build, and the resulting columnar grain sizes.

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A Computational Information Criterion for Particle-Tracking with Sparse or Noisy Data

Advances in Water Resources

Tran, Nhat T.V.; Benson, David A.; Schmidt, Michael J.; Pankavich, Stephen D.

Traditional probabilistic methods for the simulation of advection-diffusion equations (ADEs) often overlook the entropic contribution of the discretization, e.g., the number of particles, within associated numerical methods. Many times, the gain in accuracy of a highly discretized numerical model is outweighed by its associated computational costs or the noise within the data. We address the question of how many particles are needed in a simulation to best approximate and estimate parameters in one-dimensional advective-diffusive transport. To do so, we use the well-known Akaike Information Criterion (AIC) and a recently-developed correction called the Computational Information Criterion (COMIC) to guide the model selection process. Random-walk and mass-transfer particle tracking methods are employed to solve the model equations at various levels of discretization. Numerical results demonstrate that the COMIC provides an optimal number of particles that can describe a more efficient model in terms of parameter estimation and model prediction compared to the model selected by the AIC even when the data is sparse or noisy, the sampling volume is not uniform throughout the physical domain, or the error distribution of the data is non-IID Gaussian.

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A Fast Solver for the Fractional Helmholtz Equation

SIAM Journal on Scientific Computing

Glusa, Christian; D'Elia, Marta; Antil, Harbir; Weiss, Chester J.; Van Bloemen Waanders, Bart

The purpose of this paper is to study a Helmholtz problem with a spectral fractional Laplacian, instead of the standard Laplacian. Recently, it has been established that such a fractional Helmholtz problem better captures the underlying behavior in Geophysical Electromagnetics. In this work, we establish the well-posedness and regularity of this problem. We introduce a hybrid spectral-finite element approach to discretize it and show well-posedness of the discrete system. In addition, we derive a priori discretization error estimates. Finally, we introduce an efficient solver that scales aswell as the best possible solver for the classical integer-order Helmholtz equation. We conclude withseveral illustrative examples that confirm our theoretical findings.

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An asymptotically compatible treatment of traction loading in linearly elastic peridynamic fracture

Computer Methods in Applied Mechanics and Engineering

Yu, Yue; You, Huaiqian; Trask, Nathaniel A.

Meshfree discretizations of state-based peridynamic models are attractive due to their ability to naturally describe fracture of general materials. However, two factors conspire to prevent meshfree discretizations of state-based peridynamics from converging to corresponding local solutions as resolution is increased: quadrature error prevents an accurate prediction of bulk mechanics, and the lack of an explicit boundary representation presents challenges when applying traction loads. In this paper, we develop a reformulation of the linear peridynamic solid (LPS) model to address these shortcomings, using improved meshfree quadrature, a reformulation of the nonlocal dilatation, and a consistent handling of the nonlocal traction condition to construct a model with rigorous accuracy guarantees. In particular, these improvements are designed to enforce discrete consistency in the presence of evolving fractures, whose a priori unknown location render consistent treatment difficult. In the absence of fracture, when a corresponding classical continuum mechanics model exists, our improvements provide asymptotically compatible convergence to corresponding local solutions, eliminating surface effects and issues with traction loading which have historically plagued peridynamic discretizations. When fracture occurs, our formulation automatically provides a sharp representation of the fracture surface by breaking bonds, avoiding the loss of mass. We provide rigorous error analysis and demonstrate convergence for a number of benchmarks, including manufactured solutions, free-surface, nonhomogeneous traction loading, and composite material problems. Finally, we validate simulations of brittle fracture against a recent experiment of dynamic crack branching in soda-lime glass, providing evidence that the scheme yields accurate predictions for practical engineering problems.

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AI-Enhanced Co-Design for Next-Generation Microelectronics: Innovating Innovation (Workshop Report)

Descour, Michael; Tsao, Jeffrey Y.; Stracuzzi, David J.; Wakeland, Anna; Schultz, David; Smith, William; Weeks, Jacquilyn

On April 6-8, 2021, Sandia National Laboratories hosted a virtual workshop to explore the potential for developing AI-Enhanced Co-Design for Next-Generation Microelectronics (AICoM). The workshop brought together two themes. The first theme was articulated in the 2018 Department of Energy Office of Science (DOE SC) “Basic Research Needs for Microelectronics” (BRN) report, which called for a “fundamental rethinking” of the traditional design approach to microelectronics, in which subject matter experts (SMEs) in each microelectronics discipline (materials, devices, circuits, algorithms, etc.) work near-independently. Instead, the BRN called for a non-hierarchical, egalitarian vision of co-design, wherein “each scientific discipline informs and engages the others” in “parallel but intimately networked efforts to create radically new capabilities.” The second theme was the recognition of the continuing breakthroughs in artificial intelligence (AI) that are currently enhancing and accelerating the solution of traditional design problems in materials science, circuit design, and electronic design automation (EDA).

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Consistency testing for robust phase estimation

Physical Review A

Russo, Antonio E.; Kirby, William M.; Rudinger, Kenneth M.; Baczewski, Andrew D.; Kimmel, Shelby

We present an extension to the robust phase estimation protocol, which can identify incorrect results that would otherwise lie outside the expected statistical range. Robust phase estimation is increasingly a method of choice for applications such as estimating the effective process parameters of noisy hardware, but its robustness is dependent on the noise satisfying certain threshold assumptions. We provide consistency checks that can indicate when those thresholds have been violated, which can be difficult or impossible to test directly. We test these consistency checks for several common noise models, and identify two possible checks with high accuracy in locating the point in a robust phase estimation run at which further estimates should not be trusted. One of these checks may be chosen based on resource availability, or they can be used together in order to provide additional verification.

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Results 651–700 of 9,998
Results 651–700 of 9,998
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