Overview and status of EMI Measurement and Characterization on the Z-Machine Ritter, Brian J.; Fein, Jeffrey R.; Dunham, Gregory S.; Jones, Michael J.; Macphee, Andrew; Frick, Shannon; Miller, Toby; Palmer, Nathan Abstract not provided. More Details TYPE Conference Presenation YEAR 2022 DOIOSTI
Overview and status of X-Ray Streak Camera design and implementation on the Z-Machine Miller, Toby; Baker, J.L.; Ball, Chris; Carpenter, Arthur; Dunham, Gregory S.; Frick, Shannon; Fein, Jeffrey; Gard, Paul D.; Grim, Gary; Hansen, Aaron; Jones, Michael J.; Lechien, Keith; Larkin, Glen; Macphee, Andrew; Palmer, Nathan; Ritter, Brian J.; Spencer, Decker C.; Wu, Ming W. Abstract not provided. More Details TYPE Conference Poster YEAR 2022 DOIOSTI
Overview and status of EMI Measurement and Characterization on the Z-Machine Ritter, Brian J.; Fein, Jeffrey R.; Dunham, Gregory S.; Jones, Michael J.; Mcphee, Andrew; Frick, Shannon; Miller, Toby; Palmer, Nathan Abstract not provided. More Details TYPE Conference Poster YEAR 2022 OSTI
Overview and status of EMI Measurement and Characterization on the Z-Machine Ritter, Brian J.; Fein, Jeffrey R.; Dunham, Gregory S.; Jones, Michael J.; Macphee, Andrew; Miller, Toby; Palmer, Nathan Abstract not provided. More Details TYPE Conference Presenation YEAR 2022 OSTI
High-resolution imaging of warm x-ray sources with a Wolter optic on the Z Machine Fein, Jeffrey R.; Ampleford, David A.; Vogel, J.K.; Kozioziemski, B.; Walton, C.C.; Wu, Ming W.; Ayers, J.; Ball, Christopher R.; Romaine, S.; Bell, Perry; Bourdon, Christopher B.; Bradley, Dalton A.; Bruni, R.; Gard, Paul D.; Highstrete, Clark H.; Kilaru, K.; Lake, Patrick W.; Maurer, A.; Pickworth, L.A.; Pivovaroff, M.; Ramsey, B.; Ritter, Brian J.; Seals, Kathryn L.; Sethares, L. Abstract not provided. More Details TYPE Conference Presenation YEAR 2020 DOIOSTI