A Defect-Aware Device Model Realized: A case study in GaAs Bays, Nathan R.; Hjalmarson, Harold P.; Lutz, Jesse J.; Vizkelethy, Gyorgy; Cain, John M.; Bielejec, Edward S.; Schultz, Peter A. Abstract not provided. More Details TYPE Conference Poster YEAR 2024 DOIOSTI
Probing Radiation Effects in Gate-All-Around MOSFETs using Focused Particle Beams Titze, Michael; Mamaluy, Denis; Modine, Normand; Belianinov, Alex A.; Su, Shei S.; Vizkelethy, Gyorgy; Wampler, William R.; Hehr, Brian D.; Wang, Miaomiao; Zhou, Huimei; Narayanan, Vijay; Bielejec, Edward S.; Arghavani, Reza Abstract not provided. More Details TYPE Conference Presentation YEAR 2024 DOIOSTI