MAGE Horizontal Lifting Fixtures
Abstract not provided.
Publications
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Jump to search filtersMAGE Vertical Lifting Fixtures
Abstract not provided.
Sandia MEMS Technologies Overview
Abstract not provided.
Scalable Storage System Security for MPP Applications
Abstract not provided.
ELECTROKINETIC PUMPING OF LIQUID PROPELLANTS FOR SMALL SATELLITE MICROTHRUSTER APPLICATIONS
Sensors and Actuators-B
Abstract not provided.
Macro- to Nanoscale Wear Prevention via Molecular Adsorption
Nature
Abstract not provided.
Tensor decompositions and their application
Abstract not provided.
SPOT: A Sensor Placement Optimization Toolkit for Drinking Water Contaminant Warning System Design
Abstract not provided.
Morphing of Water Networks
Abstract not provided.
Multithreaded Algorithms for Processing Massive Graphs
Chapter in %22Petascale Computing: Algorithms and Applications%22
Abstract not provided.
Investigation of the Thermal Mechanical and Fracture Properties of Alumina / Epoxy Composites
Polymer
Abstract not provided.
Russian Collaborations--sponsred by the Advanced Simulation and Computing Program
Abstract not provided.
SMP Diode Shots on RITS-6 Low Z and High Z MITL
Abstract not provided.
RITS-6 Low Impedance MITL and Output Pulse Modifications
Abstract not provided.
Origin of 125 MHz Oscillations on RITS-6
Abstract not provided.
Negative Polarity Rod-Pinch Experimental Plan on RITS-6
Abstract not provided.
Posters: Advancing Science Predictice Capability ASC Timeline
Abstract not provided.
Multiscale schemes for the predictive description and virtual engineering of materials
Abstract not provided.
Introduction to CMOS Technology
Abstract not provided.
V&V Example Problem
Abstract not provided.
The Intrinsic Electric Double Layer at the Oxide-Water Interface
Langmuir
Abstract not provided.
LAMMPS Molecular Dynamics Simulations Used to Explain How Shock Waves Cause Structural Phase Transformation in Crystalline Solids
Abstract not provided.
New Cross Section Data for the 10B(dn0)11C Reaction Below 160 keV
Abstract not provided.
Single Event upset (SEU) Testing with the Sandia Ion-photon Emission Microscope (IPEM)
Abstract not provided.
CURRENT TRENDS IN PERFORMANCE PROGNOSTICS USING INTEGRATED SIMULATION AND SENSORS
Abstract not provided.
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