Publications

Miller, Philip R.; Sammon, Jason P.; Polsky, Ronen P.; Pfeifer, Nathaniel B.; Ackerman, Eric A.

Abstract not provided.

Miller, Philip R.; Polsky, Ronen P.; Pfeifer, Nathaniel B.

Abstract not provided.

Pfeifer, Kent B.; Furrer III, Clint T.; Sandoval, Paul A.; Garrett, Stephen E.; Pfeifer, Nathaniel B.

High-reliability components for high-consequence systems require detailed testing of operation after having undergone highly accelerated stress testing (HAST) under unusual conditions of high-temperature and humidity. This paper describes the design and operation of a system called "Wormwood" that is a highly multiplexed temperature measurement system that is designed to operate under HAST conditions to allow measurement of the temperature as a function of time and position in a HAST chamber. HAST chambers have single-point temperature measurements that can be traceable to NIST standards. The objective of these "Wormwood" measurements is to verify the uniformity and stability of the remaining volume of the HAST chamber with respect to the single traceable standard.

Physics of Plasmas

Sillerud, Colin H.; Schwindt, Peter S.; Moorman, Matthew W.; Yee, B.T.; Anderson, John M.; Pfeifer, Nathaniel B.; Hedberg, E.L.; Manginell, Ronald P.

Portable applications of microdischarges, such as the remediation of gaseous wastes or the destruction of volatile organic compounds, will mandate operation in the presence of contaminant species. This paper examines the temporal evolution of microdischarge optical and ultraviolet emissions during pulsed operation by experimental methods. By varying the pulse length of a microdischarge initiated in a 4-hole silicon microcavity array operating in a 655 Torr ambient primarily composed of Ne, we were able to measure the emission growth rates for different contaminant species native to the discharge environment as a function of pulse length. It was found that emission from hydrogen and oxygen impurities demonstrated similar rates of change, while emissions from molecular and atomic nitrogen, measured at 337.1 and 120 nm, respectively, exhibited the lowest rate of change. We conclude that it is likely that O2 undergoes the same resonant energy transfer process between rare gas excimers that has been shown for H2. Further, efficient resonant processes were found to be favored during ignition and extinction phases of the pulse, while emission at the 337.1 nm line from N2 was favored during the intermediate stage of the plasma. In addition to the experimental results, a zero-dimensional analysis is also presented to further understand the nature of the microdischarge.

Manginell, Ronald P.; Moorman, Matthew W.; Achyuthan, Komandoor A.; Simonson, Robert J.; Mowry, Curtis D.; Pfeifer, Kent B.; Pfeifer, Nathaniel B.; Sillerud, Colin H.; Carson, Bryan C.

Abstract not provided.

Manginell, Ronald P.; Sillerud, Colin H.; Hopkins, Matthew M.; Yee, Benjamin T.; Moorman, Matthew W.; Schwindt, Peter S.; Anderson, John M.; Pfeifer, Nathaniel B.

The temporal evolution of spectral lines from microplasma devices (MD) was studied, including impurity transitions. Long-wavelength emission diminishes more rapidly than deep UV with decreasing pulse width and RF operation. Thus, switching from DC to short pulsed or RF operation, UV emissions can be suppressed, allowing for real-time tuning of the ionization energy of a microplasma photo-ionization source, which is useful for chemical and atomic physics. Scaling allows MD to operate near atmospheric pressure where excimer states are efficiently created and emit down to 65 nm; laser emissions fall off below 200 nm, making MD light sources attractive for deep UV use. A first fully-kinetic three-dimensional model was developed that explicitly calculates electron-energy distribution function. This, and non-continuum effects, were studied with the model and how they are impacted by geometry and transient or DC operation. Finally, a global non-dimensional model was developed to help explain general trends MD physics.

Pfeifer, Nathaniel B.; Manginell, Ronald P.; Moorman, Matthew W.; Read, Douglas R.; Mowry, Curtis D.; Pimentel, Adam S.; Linker, Kevin L.

Abstract not provided.

Pfeifer, Nathaniel B.; Read, Douglas R.

Abstract not provided.