Publications

Luo, X., Montes, J., Koukourinkova, S.D., Vaandrager, B.L., Bielejec, E.S., Vizkelethy, G., Schrimpf, R.D., Fleetwood, D.M., Zhang, E.X., & Zhang, E.X. (2024). Low-Frequency Noise and Deep Level Transient Spectroscopy in n-p-n Si Bipolar Junction Transistors Irradiated with Si Ions. IEEE Transactions on Nuclear Science, 71(4), pp. 591-598. 10.1109/tns.2023.3346834

Sapkota, K.R., Vizkelethy, G., Burns, G.R., Wang, G.T., & Wang, G.T. (2024). Effects of Proton Irradiation on GaN Vacuum Electron Nanodiodes. IEEE Transactions on Electron Devices, 71(1), pp. 827-832. 10.1109/ted.2023.3330458

Wang, G.T., Sapkota, K.R., Talin, A.A., Leonard, F., Vizkelethy, G., & Vizkelethy, G. (2023). GaN Vacuum Nanoelectronics [Conference Presentation]. 10.2172/2430496

Koukourinkova, S.D., Colon, A., Doyle, B.L., Vizkelethy, G., Pickrell, G.W., Gunning, B.P., Kropka, K.E., Bielejec, E.S., Wampler, W.R., & Wampler, W.R. (2023). Transient Photocurrent From High-Voltage Vertical GaN Diodes Irradiated With Electrons: Experiments and Simulations. IEEE Transactions on Nuclear Science, 70(4), pp. 469-477. 10.1109/tns.2023.3257768

Sapkota, K.R., Vizkelethy, G., Wang, G.T., & Wang, G.T. (2023). Achieving very-high current density with GaN nanoscale field emitters array [Conference Presentation]. 10.2172/2431780

Wang, G.T., Sapkota, K.R., Talin, A.A., Leonard, F., Gunning, B., Vizkelethy, G., & Vizkelethy, G. (2022). On-chip, Ultra-Low Voltage GaN Vacuum Nanoelectronics [Conference Presentation]. 10.2172/2432124

Young, J.M., Vizkelethy, G., Bielejec, E.S., & Bielejec, E.S. (2022). Exploration of the combined effects of displacement damage and total ionizing dose degradation in the LM741 operational amplifier using Si ion and electron irradiation [Conference Presentation]. 10.2172/2006072

Wampler, W.R., Armstrong, A., Vizkelethy, G., & Vizkelethy, G. (2022). Carrier capture and emission by substitutional carbon impurities in GaN vertical diodes. Journal of Applied Physics, 132(9). 10.1063/5.0106905

Wang, G.T., Sapkota, K.R., Talin, A.A., Leonard, F., Gunning, B., Vizkelethy, G., & Vizkelethy, G. (2022). Fabrication and Performance of Lateral GaN Vacuum Nanoelectronic Devices [Conference Presentation]. 10.2172/2004536

Wang, G.T., Sapkota, K.R., Talin, A.A., Leonard, F., Gunning, B., Vizkelethy, G., & Vizkelethy, G. (2022). On-chip GaN Vacuum Nanoelectronics [Conference Poster]. 10.2172/2004758

Wang, G.T., Sapkota, K.R., Talin, A.A., Leonard, F., Kazanowska, B., Jones, K.S., Gunning, B., Vizkelethy, G., & Vizkelethy, G. (2022). GaN Vacuum Nanoelectronic Devices (invited) [Conference Presentation]. 10.2172/2004315

Vizkelethy, G., Wampler, W.R., Armstrong, A., Pickrell, G.W., Gunning, B.P., Kropka, K.E., & Kropka, K.E. (2022). Ionization and displacement damage effects in high voltage vertical GaN diodes [Conference Presentation]. 10.2172/2004391

Koukourinkova, S.D., Wampler, W.R., Colon, A., Doyle, B.L., Vizkelethy, G., Pickrell, G.W., Gunning, B.P., Kropka, K.E., Bielejec, E.S., & Bielejec, E.S. (2022). Transient Photocurrent from High-Voltage Vertical GaN Diodes Irradiated with Electrons:Experiments and Simulations [Conference Poster]. 10.2172/2003948

Spear, M., Wallace, T., Wilson, D.E., Solano, J., Irumva, G., Esqueda, I.S., Barnaby, H.J., Clark, L., Brunhaver, J., Turowski, M., Mikkola, E., Hughart, D.R., Young, J.M., Manuel, J., Agarwal, S., Vaandrager, B.L., Vizkelethy, G., King, M.P., Marinella, M., & Marinella, M. (2022). Single Event Upset and Total Ionizing Dose Response of 12LP FinFET Digital Circuits [Conference Proceeding]. https://www.osti.gov/biblio/2004036

Spear, M., Wallace, T., Wilson, D.E., Solano, J., Irumva, G., Esqueda, I.S., Barnaby, H.J., Clark, L., Brunhaver, J., Turowski, M., Mikkola, E., Hughart, D.R., Young, J.M., Manuel, J., Agarwal, S., Vaandrager, B.L., Vizkelethy, G., Gutierrez, A., Trippe, J., … Marinella, M. (2022). Single Event Upset and Total Ionizing Dose Response of 12LP FinFET Digital Circuits [Conference Poster]. 10.2172/2004078

Neuendank, J.X., Wilson, D.X., Barnaby, H.J.X., Clark, L.X., Brunhaver, J.X., Manuel, J., Young, J.M., Vizkelethy, G., Bielejec, E.S., & Bielejec, E.S. (2022). Single Event Upset Response of 12L FinFET Digital Circuits [Conference Presentation]. 10.2172/2003206

Sapkota, K.R., Vizkelethy, G., Wang, G.T., & Wang, G.T. (2022). Proton Irradiation Effects on GaN Nanoscale Vacuum Electron Diodes [Conference Presentation]. 10.2172/2001911

Wilson, D.E., Spear, M., Wallace, T., Irumva, G., Neuendank, J., Sanchez, I., Barnaby, H., Privat, A., Turowski, M., Mikkola, E., Hughart, D.R., Manuel, J., Vizkelethy, G., King, M.P., Marinella, M., & Marinella, M. (2022). Total ionizing dose and single event effects on 12-nm bulk FinFETs [Conference Presentation]. 10.2172/2001871

Wang, G.T., Sapkota, K.R., Talin, A.A., Leonard, F., Gunning, B.P., Vizkelethy, G., & Vizkelethy, G. (2022). Ultra-low Voltage GaN Vacuum Nanoelectronics [Conference Presentation]. 2022 Compound Semiconductor Week, CSW 2022. 10.2172/2003291

Lozovoi, A., Jayakumar, H., Vizkelethy, G., Bielejec, E.S., Doherty, M.W., Flick, J., Meriles, C.A., & Meriles, C.A. (2021). Optical activation and detection of charge transport between individual colour centres in diamond. Nature Electronics, 4(10), pp. 717-724. 10.1038/s41928-021-00656-z

Young, J.M., Manuel, J., Vizkelethy, G., Bielejec, E.S., & Bielejec, E.S. (2021). Exploration of synergistic behavior of operational amplifiers in combined ion and electron environments [Conference Poster]. 10.2172/1882325

Young, J.M., Manuel, J., Bielejec, E.S., Vizkelethy, G., Belianinov, A.A., & Belianinov, A.A. (2021). Exploration of synergistic behavior of operational amplifiers in combined ion and electron environment [Conference Poster]. 10.2172/1872306

Bennett, C., Xiao, T.P., Leonard, T., Alamdar, M., Manuel, J., Jacobs-Gedrim, R.B., Xue, L., Vizkelethy, G., Bielejec, E.S., Incorvia, J.A., Marinella, M., & Marinella, M. (2021). Investigation of Total Ionizing Dose on Domain-wall Magnetic Tunnel Junction Logic Devices (Presentation) [Conference Presentation]. 10.2172/1874876

Ashby, D.S., Garland, D., Vizkelethy, G., Marinella, M., McLain, M., Llinas, J.P., Talin, A.A., & Talin, A.A. (2021). Identification of localized radiation damage in power MOSFETs using EBIC imaging. Applied Physics Letters, 118(20). 10.1063/5.0053892

Xiao, T.P., Bennett, C., Mancoff, F.B., Manuel, J., Hughart, D.R., Jacobs-Gedrim, R.B., Bielejec, E.S., Vizkelethy, G., Sun, J., Aggarwal, S., Arghavani, R., Marinella, M., & Marinella, M. (2021). Heavy-Ion-Induced Displacement Damage Effects in Magnetic Tunnel Junctions with Perpendicular Anisotropy. IEEE Transactions on Nuclear Science, 68(5), pp. 581-587. 10.1109/tns.2021.3057348

Tonigan, A.M., Ball, D., Vizkelethy, G., Black, J.D., Black, D.A., Trippe, J., Bielejec, E.S., Alles, M.L., Reed, R.S., Schrimpf, R.D., & Schrimpf, R.D. (2021). Impact of Surface Recombination on Single-Event Charge Collection in an SOI Technology. IEEE Transactions on Nuclear Science, 68(3), pp. 305-311. 10.1109/tns.2021.3056898

Talin, A.A., Ashby, D.S., Marinella, M., Garland, D., Vizkelethy, G., Celio, K., Cumings, J., Warecki, Z., Jillanas, J.P., Armstrong, A., Allerman, A., & Allerman, A. (2021). Using EBIC to Understand Radiation Damage in Electronics [Conference Presentation]. 10.2172/1861021

Talin, A.A., Ashby, D.S., Garland, D., Esposito, M., Warecki, Z., Vizkelethy, G., Llinas, J.P., Armstrong, A., Cumings, J., Marinella, M., & Marinella, M. (2020). Using EBIC to Understand Radiation Damage in Electronics [Conference Presentation]. 10.2172/1842659

Wampler, W.R., Doyle, B.L., Cooper-Snow, W.S., Vizkelethy, G., Jasica, M.J., & Jasica, M.J. (2020). Optimization of target lifetime for production of 14 MeV neutrons. Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, 485, pp. 26-31. 10.1016/j.nimb.2020.10.014

Esposito, M.G., Manuel, J., Vizkelethy, G., Garland, D., Bielejec, E.S., Xiao, T.P., Dickerson, J., McLain, M., King, M.P., Marinella, M., Ashby, D.S., Talin, A.A., Brunhaver, J.S., Privat, A., Barnaby, H., & Barnaby, H. (2020). Investigating Heavy Ion Effects on 14nm-Process FinFETs: Displacement Damage Versus Total Ionizing Dose [Conference Paper]. https://www.osti.gov/biblio/1824924

Xiao, T.P., Bennett, C., Mancoff, F., Manuel, J., Hughart, D.R., Jacobs-Gedrim, R.B., Bielejec, E.S., Vizkelethy, G., Sun, J., Aggarwal, S., Arghavani, R., Marinella, M., & Marinella, M. (2020). Heavy-ion-induced displacement damage effects in magnetic tunnel junctions with perpendicular anisotropy [Conference Presentation]. 10.2172/1831024

Aguirre, B.A., King, J., Manuel, J., Vizkelethy, G., Bielejec, E.S., Griffin, P.J., & Griffin, P.J. (2020). Response of GaN-Based Semiconductor Devices to Ion and Gamma Irradiation. 10.2172/1668935

Jasica, M.J., Wampler, W.R., Doyle, B.L., Vizkelethy, G., Pickrell, G.W., Cowan, W.D., Colon, A., Bielejec, E.S., & Bielejec, E.S. (2020). Exploratory Modeling of Radiation-Induced Photocurrent Response in Vertical GaN Diodes [Conference Poster]. https://www.osti.gov/biblio/1808948

Jasica, M.J., Wampler, W.R., Doyle, B.L., Vizkelethy, G., Pickrell, G.W., Cowan, W.D., Colon, A., Bielejec, E.S., & Bielejec, E.S. (2020). Exploratory Modeling of Radiation-Induced Photocurrent Response in Vertical GaN Diodes [Conference Poster]. https://www.osti.gov/biblio/1771055

Ruiz, I., Foulk, J.W., Vizkelethy, G., Howell, S., Goodman, K., McDonald, A., Thelen, P.M., Goldflam, M., & Goldflam, M. (2020). Depleted Graphene-Insulator-Silicon Junctions for High Energy Detection of Ions and Gamma Rays [Conference Poster]. https://www.osti.gov/biblio/1771267

Jasica, M.J., Wampler, W.R., Vizkelethy, G., Hehr, B.D., Bielejec, E.S., & Bielejec, E.S. (2020). Photocurrent from single collision 14-MeV neutrons in GaN and GaAs. IEEE Transactions on Nuclear Science, 67(1), pp. 221-227. 10.1109/TNS.2019.2949720

Ruiz, I., Foulk, J.W., Goldflam, M., Vizkelethy, G., Thelen, P.M., Howell, S.W., Goodman, K., & Goodman, K. (2019). Depleted Graphene-Insulator-Silicon Junctions for High Energy Detection of Ions and Gamma Rays [Conference Poster]. https://www.osti.gov/biblio/1761022

Jasica, M.J., Wampler, W.R., Doyle, B.L., Vizkelethy, G., Pickrell, G.W., Cowan, W.D., Colon, A., van Heukelom, M., Glaser, C.E., & Glaser, C.E. (2019). Simulations of Vertical GaN Diode Performance Under Electron Beam Radiation Exposures [Conference Poster]. https://www.osti.gov/biblio/1643490

Vizkelethy, G., Doyle, B.L., Bielejec, E.S., & Bielejec, E.S. (2019). Ion irradiation and analysis of SiC Schottky diodes [Presentation]. https://www.osti.gov/biblio/1646111

Vizkelethy, G., Bielejec, E.S., Aguirre, B.A., Manuel, J., Seidel, P.A., Persaud, A., Ji, Q., Geulig, L.D., Schenkel, T., & Schenkel, T. (2019). Effect of high/low flux He ion irradiation on defects in silicon photodiodes [Conference Poster]. https://www.osti.gov/biblio/1643005

Manuel, J., Vizkelethy, G., Doyle, B.L., Bielejec, E.S., & Bielejec, E.S. (2019). Ion irradiation and analysis of SiC Schottky diodes [Conference Poster]. https://www.osti.gov/biblio/1643638

Wampler, W.R., Doyle, B.L., Vizkelethy, G., Bielejec, E.S., Snow, C.S., Styron, J.D., Jasica, M.J., & Jasica, M.J. (2019). 14 MeV DT Neutron Test Facility at the Sandia Ion Beam Laboratory. 10.2172/1569148

Vizkelethy, G., Bielejec, E.S., Aguirre, B.A., Manuel, J., Seidel, P.A., Persaud, A., Ji, Q., Geulig, L.D., Schenkel, T., & Schenkel, T. (2019). Effect of high intensity ns length ion irradiation on defect creation in silicon photodiodes [Conference Poster]. https://www.osti.gov/biblio/1642718

Ruiz, I., Foulk, J.W., McDonald, A., Howell, S.W., Draper, B.L., Thelen, P.M., Vizkelethy, G., Goldflam, M., & Goldflam, M. (2019). Depleted Graphene-Oxide-Semiconductor Junctions for High Energy Radiation Detection [Conference Poster]. 10.1109/DRC46940.2019.9046424

Goldflam, M., Foulk, J.W., Vizkelethy, G., Thelen, P.M., Shank, J., Sarma, R., Davids, P., Harrison, R.K., Smith, S., Foulk, J.W., Foulk, J.W., Friedrich, L., Draper, B.L., Howell, S., Ruiz, I., & Ruiz, I. (2019). Graphene-Based PhotoFET for Optical and Radiation Detection [Conference Poster]. https://www.osti.gov/biblio/1641687

Tonigan, D., Ball, D., Vizkelethy, G., Black, J.D., Black, D.A., Trippe, J., Bielejec, E.S., Alles, M., Reed, R., Schrimpf, R., & Schrimpf, R. (2019). Impact of interface quality on single-event charge collection in SOI technologies [Conference Poster]. https://www.osti.gov/biblio/1641056

Jasica, M.J., Wampler, W.R., Vizkelethy, G., Hehr, B.D., Bielejec, E.S., & Bielejec, E.S. (2019). Modeling Single Event Effects in GaAs and GaN Devices from 14 MeV Neutron-Induced Photocurrent Pulses [Conference Poster]. https://www.osti.gov/biblio/1641068

Wang, P., Sternberg, A.L., Sierawski, B.D., Zhang, E.X., Tonigan, A.M., Brewer, R.M., Dodds, N.A., Vizkelethy, G., Jordan, S.L., Fleetwood, D.M., Reed, R.A., Schrimpf, R.D., & Schrimpf, R.D. (2019). Single Event Latchup Sensitive Volume Model for a 180-nm SRAM Test Structure [Conference Poster]. https://www.osti.gov/biblio/1641132

Marinella, M., Bennett, C., Jacobs-Gedrim, R.B., Hsia, A.W., Hughart, D.R., James, C.D., Vizkelethy, G., Bielejec, E.S., Agarwal, S., Fuller, E.J., Talin, A.A., Taggart, J., Barnaby, H., & Barnaby, H. (2019). Energy Efficient Neuromorphic Algorithm Training with Analog Memory Arrays [Conference Poster]. https://www.osti.gov/biblio/1641235

Klem, J.F., Kim, J.K., Pickrell, G.W., Tauke-Pedretti, A., Wood, M.G., Looker, Q.M., Padilla, E.A., Vizkelethy, G., Bielejec, E.S., Webster, P., & Webster, P. (2019). Epitaxial AlAsSb for spectroscopic gamma detectors [Conference Poster]. https://www.osti.gov/biblio/1641000

Aguirre, B.A., Bielejec, E.S., Vizkelethy, G., Wampler, W.R., Styron, J.D., Martin, W.J., Yeamans, C., Sorce, C., & Sorce, C. (2019). Effect of 14 MeV neutron flux on defects in Si photodiode devices [Conference Poster]. https://www.osti.gov/biblio/1639664

Vizkelethy, G., Bielejec, E.S., Aguirre, B.A., Seidl, P.A., Persaud, A., Ji, Q., Schenkel, T., & Schenkel, T. (2019). Investigation of the effect of flux on defects created in Su devices [Conference Poster]. https://www.osti.gov/biblio/1639469

Mace, M.E., McClory, J.W., Petrosky, J.C., Vizkelethy, G., & Vizkelethy, G. (2019). Targeted Ion Radiation Response of AlGaN/GaN HEMT [Conference Poster]. https://www.osti.gov/biblio/1639470

Schenkel, T., Seidl, P.A., Persaud, A., Ji, Q., Steinke, S., Bulanov, S.S., Geddes, C., Nakamura, K., Bielejec, E.S., Vaandrager, B.L., Vizkelethy, G., Barnard, J.J., Friedman, A., Grote, D.P., & Grote, D.P. (2019). Short Intense Ion Pulses for Radiation Effects Research Using NDCX-II and BELLA-i [Conference Poster]. https://www.osti.gov/biblio/1639504

Wampler, W.R., Vizkelethy, G., Doyle, B.L., Bielejec, E.S., Styron, J.D., Jasica, M.J., Snow, C.S., & Snow, C.S. (2019). TARGET PERFORMANCE FOR 14 MEV NEUTRON PRODUCTION AT THE SANDIA ION BEAM LABORATORY [Conference Poster]. https://www.osti.gov/biblio/1639519

Jasica, M.J., Wampler, W.R., Doyle, B.L., Vizkelethy, G., Pickrell, G.W., Cowan, W.D., Colon, A., van Heukelom, M., Glaser, C.E., & Glaser, C.E. (2019). Simulations of vertical gan diode performance under electron beam radiation exposures [Conference Poster]. Transactions of the American Nuclear Society. https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=85092150783&origin=inward

Jacobs-Gedrim, R.B., Hughart, D.R., Agarwal, S., Vizkelethy, G., Bielejec, E.S., Vaandrager, B.L., Swanson, S.E., Knisely, K., Taggart, J.L., Barnaby, H.L., Marinella, M., & Marinella, M. (2018). Training a Neural Network on Analog TaO_x ReRAM Devices Irradiated With Heavy Ions: Effects on Classification Accuracy Demonstrated With CrossSim. IEEE Transactions on Nuclear Science, 66(1). 10.1109/TNS.2018.2886229

Colon, A., Austin, F.H., Baca, A.G., Briggs, S.A., Cowan, W.D., Dickerson, J., Douglas, E.A., Doyle, B.L., Glaser, C.E., Gunning, B.P., Hattar, K., Klein, B., Koleske, D., Tauke-Pedretti, A., Pickrell, G.W., Vizkelethy, G., & Vizkelethy, G. (2018). Effects of Electron Beam Induced Current on Breakdown Voltage of GaN P-N Junction Diodes and AlGaN/GaN Schottky Diodes [Conference Poster]. https://www.osti.gov/biblio/1582211

Aguirre, B.A., Vizkelethy, G., Vaandrager, B.L., Martin, W.J., Seidl, P., Persaud, A., Ji, Q., Ludewigt, B.A., Schenkel, T., Bielejec, E.S., & Bielejec, E.S. (2018). Effect of Flux on the Defects and Electrical Behavior in Si Devices irradiated with He Ions [Conference Poster]. https://www.osti.gov/biblio/1582259

Vizkelethy, G., Bielejec, E.S., Aguirre, B.A., & Aguirre, B.A. (2018). Analysis of the IBL and LBNL irradiated PIN and PN diodes. 10.2172/1459608

Jacobs-Gedrim, R.B., Hughart, D.R., Agarwal, S., Vizkelethy, G., Bielejec, E.S., Vaandrager, B.L., Swanson, S.E., Taggart, J.L., Barnaby, H., Marinella, M., & Marinella, M. (2018). Effects of Heavy Ion Radiation on the Classification Accuracy After Training of a TaOx Hardware Based Neural Network [Conference Poster]. https://www.osti.gov/biblio/1570154

Jacobs-Gedrim, R.B., Hughart, D.R., Agarwal, S., Vizkelethy, G., Vaandrager, B.L., Swanson, S.E., Knisely, K., Taggart, J.L., Barnaby, H., Marinella, M., & Marinella, M. (2018). Effects of Heavy Ion Radiation on the Classification Accuracy After Training of a TaOx Hardware Based Neural Network [Conference Poster]. https://www.osti.gov/biblio/1570322

Aguirre, B.A., Vaandrager, B.L., Vizkelethy, G., Martin, W.J., Seidl, P., Persaud, A., Ji, Q., Ludewigt, B.A., Schenkel, T., Bielejec, E.S., & Bielejec, E.S. (2018). Effect of Flux on the Defects and Gain Degradation in pnp Si BJTs irradiated with He ions [Conference Poster]. https://www.osti.gov/biblio/1570327

Vizkelethy, G., Bielejec, E.S., Aguirre, B.A., Seidel, P.A., & Seidel, P.A. (2018). Investigation of effects of ns high intensity ion pulses on defect creation using a nuclear microprobe and Deep Level Transient Spectroscopy (DLTS) [Conference Poster]. https://www.osti.gov/biblio/1531295

Aguirre, B.A., Vaandrager, B.L., Vizkelethy, G., Martin, W.J., Seidl, P., Persaud, A., Ji, Q., Ludewigt, B.A., Schenkel, T., Bielejec, E.S., & Bielejec, E.S. (2018). Comparison of High and Low Flux He Exposures on the Gain Degradation and Defect Spectra in Si pnp BJTs [Conference Poster]. https://www.osti.gov/biblio/1806975

Jacobs-Gedrim, R.B., Hughart, D.R., Vizkelethy, G., Vaandrager, B.L., Swanson, S.E., Taggart, J.L., Barnaby, H., Marinella, M., & Marinella, M. (2018). Effect of Radiation on the Classification Accuracy of a Neural Network Trained on Analog TaOx Resistive Memory Arrays [Conference Poster]. https://www.osti.gov/biblio/1501993

Vizkelethy, G., Bielejec, E.S., Aguirre, B.A., & Aguirre, B.A. (2018). Stochastic Gain Degradation in III-V Heterojunction Bipolar Transistors Due to Single Particle Displacement Damage [Conference Poster]. IEEE Transactions on Nuclear Science. 10.1109/TNS.2017.2772960

Vizkelethy, G., Bielejec, E.S., Aguirre, B.A., & Aguirre, B.A. (2017). Stochastic Gain Degradation in III-V Heterojunction Bipolar Transistors due to Single Particle Displacement Damage. IEEE Transactions on Nuclear Science, 65(1). 10.1109/tns.2017.2772960

Vizkelethy, G., Bielejec, E.S., Aguirre, B.A., & Aguirre, B.A. (2017). Single Ion Displacement Effects in Heterojunction Bipolar Transistors [Conference Poster]. https://www.osti.gov/biblio/1513582

Vizkelethy, G., Vittone, E., Pastuovic, Z., Siegele, R., Jaksic, M., Grilj, V., Skukan, N., Garcia Lopez, J., Jimenez Ramos, C., & Jimenez Ramos, C. (2017). The Determination of Radiation Hardness of Semiconductor Materials and Devices with Ion Beams. 10.2172/1436059

Vizkelethy, G., King, M.P., Aktas, O., Kizilyalli, I.C., Kaplar, R., & Kaplar, R. (2017). Nuclear microprobe investigation of the effects of ionization and displacement damage in vertical, high voltage GaN diodes. Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, 404, pp. 264-268. 10.1016/j.nimb.2016.11.031

Aguirre, B.A., Bielejec, E.S., Fleming, R.M., Vizkelethy, G., Vaandrager, B.L., Campbell, J., Martin, W.J., & Martin, W.J. (2017). Defects and Gain Degradation in pnp Si BJTs Irradiated with Different Mass Particles [Conference Poster]. https://www.osti.gov/biblio/1506880

Celio, K.C., King, M.P., Dickerson, J., Vizkelethy, G., Armstrong, A., Fischer, A.J., Allerman, A., Kaplar, R., Aktas, O., Kizilyalli, I.C., Talin, A.A., Leonard, F., & Leonard, F. (2017). Imaging the Impact of Proton Irradiation on Edge Terminations in Vertical GaN pin Diodes. IEEE Electron Device Letters, 38(7). 10.1109/led.2017.2708703

Vizkelethy, G., Serkland, D.K., Bossert, D., Doyle, B.L., & Doyle, B.L. (2017). Modeling charge collection efficiency degradation in partially depleted GaAs photodiodes using the 1- and 2-carrier Hecht equations. Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, 399(C), pp. 12-19. 10.1016/j.nimb.2017.03.045

Vizkelethy, G., Sato, S.I., Makino, T., Ohshima, T., Kamiya, T., Kada, W., Hanaizumi, O., Grilj, V., Skukan, N., Sudic, I., Jaksic, M., Pomorski, M., & Pomorski, M. (2017). Transient current induced in thin film diamonds by swift heavy ions. Diamond and Related Materials, 75(C), pp. 161-168. 10.1016/j.diamond.2017.04.005

Kaplar, R., Allerman, A., Armstrong, A., Crawford, M.H., Baca, A.G., Flicker, J.D., Pickrell, G.W., Dickerson, J., Klein, B., Douglas, E.A., Miller, M.A., Leonard, F., Talin, A.A., Celio, K.C., Reza, S., King, M.P., Vizkelethy, G., Coltrin, M.E., & Coltrin, M.E. (2017). Ultra-Wide-Bandgap Power Electronic Devices Based on Aluminum Gallium Nitride [Conference Poster]. https://www.osti.gov/biblio/1456495

Aguirre, B.A., Bielejec, E.S., Fleming, R.M., Vizkelethy, G., Vaandrager, B.L., Campbell, J., Martin, W.J., King, D.B., & King, D.B. (2017). Comparison of Gain Degradation and Deep Level Transient Spectroscopy in pnp Si Bipolar Junction Transistors Irradiated With Different Ion Species [Conference Poster]. IEEE Transactions on Nuclear Science. 10.1109/TNS.2016.2636809

Doyle, B.L., Vizkelethy, G., Auden, E.C., Bielejec, E.S., & Bielejec, E.S. (2016). Imaging Single Collision Cascades with Nanobeam IBIC [Conference Poster]. https://www.osti.gov/biblio/1413643

Bielejec, E.S., Aguirre, B.A., Vaandrager, B.L., Vizkelethy, G., Doyle, B.L., Martin, W.J., & Martin, W.J. (2016). Demonstration of a %3C20 ns High Flux Fast Pulsing Capability at Sandia?s Ion Beam Laboratory for Hostile Relevant Threat Environment Testing [Conference Poster]. https://www.osti.gov/biblio/1414646

Bielejec, E.S., Abraham, J.B.S., Aguirre, B.A., Pacheco, J.L., Vizkelethy, G., Camacho, R., & Camacho, R. (2016). Single Ion Detection for Engineered Quantum Systems in Diamond [Conference Poster]. https://www.osti.gov/biblio/1526835

Aguirre, B.A., Bielejec, E.S., Fleming, R.M., Vizkelethy, G., Vaandrager, B.L., Campbell, J., King, D.B., Martin, W.J., & Martin, W.J. (2016). Exploring the Effect of Defect Clustering using Deep Level Transient Spectroscopy on Silicon Transistors [Conference Poster]. https://www.osti.gov/biblio/1408365

Doyle, B.L., Auden, E.C., Bielejec, E.S., Abraham, J.B.S., Vizkelethy, G., & Vizkelethy, G. (2016). The anatomy of the minority carrier - atomic cluster interaction in semiconductors. 10.2172/1562622

Abraham, J.B.S., Pacheco, J.L., Aguirre, B.A., Vizkelethy, G., Bielejec, E.S., & Bielejec, E.S. (2016). Fabrication and characterization of a co-planar detector in diamond for low energy single ion implantation. Applied Physics Letters, 109. 10.1063/1.4960968

Doyle, B.L., Rossi, P., Vizkelethy, G., Hattar, K., Bufford, D.C., Muntifering, B., Gong, C., Corona, A., Nguyen, A., & Nguyen, A. (2016). Calculating and Mapping Unintentional Ion Channeling in Polycrystalline Materials [Conference Poster]. https://www.osti.gov/biblio/1376795

Vizkelethy, G., Sato, S., Makino, T., Ohshima, T., Kamiya, T., Kada, W., Hanaizumi, O., Gris, V., Skukan, N., Sudic, I., Jaksic, M., Pomorski, M., & Pomorski, M. (2016). Transient Current Induced in Thin Film Diamonds by Swift heavy Ions [Conference Poster]. https://www.osti.gov/biblio/1378072

Vizkelethy, G., Vittone, E., Pastuovic, S., Simon, A., & Simon, A. (2016). Methodology to analyze charge collection efficiency degradation induced by MeV ions in semiconductor detectors [Conference Poster]. https://www.osti.gov/biblio/1378846

Aguirre, B.A., Bielejec, E.S., Fleming, R.M., Vizkelethy, G., Vaandrager, B.L., Campbell, J., Martin, W.J., King, D.B., & King, D.B. (2016). Comparison of Gain Degradation and Deep Level Transient Spectroscopy in pnp Si Bipolar Junction Transistors Irradiated with Different Ion Species [Conference Poster]. 10.1109/TNS.2016.2636809

Vizkelethy, G., King, M.P., Atkas, O., Kizilyalli, I.C., Kaplar, R., & Kaplar, R. (2016). Nuclear microprobe investigation of the effects of ionization and displacement damage in vertical high voltage GaN diodes [Conference Poster]. 10.1016/j.nimb.2016.11.031

Vizkelethy, G., Doyle, B.L., & Doyle, B.L. (2016). Ion Beam Induced Charge Collection (IBIC) in channeling direction with keV heavy ions [Conference Poster]. https://www.osti.gov/biblio/1373151

Pacheco, J.L., Hughart, D.R., Vizkelethy, G., Bielejec, E.S., Marinella, M., & Marinella, M. (2016). Application of Focused Ion Beam Irradiations to Create Electroforming-Free TaOx Memristors [Conference Poster]. https://www.osti.gov/biblio/1366820

Abraham, J.B.S., Aguirre, B.A., Pacheco, J.L., Vizkelethy, G., Bielejec, E.S., & Bielejec, E.S. (2016). Fabrication and characterization of a co-planar detector in diamond for low energy single ion implantation [Presentation]. 10.1063/1.4960968

Vizkelethy, G., Foiles, S.M., & Foiles, S.M. (2016). Determination of recombination radius in Si for binary collision approximation codes [Conference Poster]. Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms. https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=84960306739&origin=inward

Kaplar, R., Kizilyalli, I., Aktas, O., Armstrong, A., King, M.P., Vizkelethy, G., Wampler, W.R., Fleming, R.M., Dickerson, J., Leonard, F., Talin, A.A., Celio, K.C., Neely, J.C., Zutavern, F.J., Mauch, D.L., & Mauch, D.L. (2016). Vertical GaN Devices for Power Electronics in Extreme Environments [Conference Poster]. https://www.osti.gov/biblio/1366654

Vizkelethy, G. (2016). Final report of Sandia National Laboratories (SNL) contribution to IAEA CRP F11016 on ''Utilization of ion accelerators for studying and modeling of radiation induced defects in semiconductors and insulator''. 10.2172/1618249

Vittone, E., Pastuovic, Z., Breese, M.B.H., Lopez, J.G., Jaksic, M., Raisanen, J., Siegele, R., Simon, A., Vizkelethy, G., & Vizkelethy, G. (2016). Charge collection efficiency degradation induced by MeV ions in semiconductor devices: Model and experiment. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 119(50). 10.1016/j.nimb.2016.01.030

King, M.P., Armstrong, A., Dickerson, J., Vizkelethy, G., Fleming, R.M., Campbell, J., Wampler, W.R., Kizilyalli, I.C., Bour, D.P., Aktas, O., Nie, H., Disney, D., Wierer, J., Allerman, A., Moseley, M.W., Kaplar, R., & Kaplar, R. (2015). Performance and Breakdown Characteristics of Irradiated Vertical Power GaN P-i-N Diodes. IEEE Transactions on Nuclear Science, 62(6), pp. 2912-2918. 10.1109/tns.2015.2480071

Auden, E.C., Pacheco, J.L., Bielejec, E.S., Vizkelethy, G., Abraham, J.B.S., Doyle, B.L., & Doyle, B.L. (2015). Sub-Micron Resolution of Localized Ion Beam Induced Charge Reduction in Silicon Detectors Damaged by Heavy Ions. IEEE Transactions on Nuclear Science, 62(6), pp. 2919-2925. 10.1109/tns.2015.2495160

Vizkelethy, G., Bielejec, E.S., King, D.B., Patrizi, G., & Patrizi, G. (2015). Single Ion Displacement Effects in Heterojunction Bipolar Transistors [Conference Poster]. https://www.osti.gov/biblio/1333251

Pacheco, J.L., Hughart, D.R., Vizkelethy, G., Bielejec, E.S., Marinella, M., & Marinella, M. (2015). Controlled irradiation of TaOx memristive devices using a focused ion beam for modification of device properties [Conference Poster]. https://www.osti.gov/biblio/1331864

Aguirre, B.A., Vaandrager, B.L., Grossetete, G., Vizkelethy, G., Bielejec, E.S., Patrizi, G., King, D.B., & King, D.B. (2015). Effects of Metallization Variation on III-V HBTs under Ion Irradiation [Conference Poster]. https://www.osti.gov/biblio/1332059