Publications

Aguirre, B.A., Vaandrager, B.L., Grossetete, G., Vizkelethy, G., Bielejec, E.S., Patrizi, G., King, D.B., & King, D.B. (2015). Effects of Metallization Variation on III-V HBTs under Ion Irradiation [Conference Poster]. https://www.osti.gov/biblio/1332059

Vizkelethy, G., Bielejec, E.S., King, D.B., Patrizi, G., & Patrizi, G. (2015). Single Ion Displacement Effects in Heterojunction Bipolar Transistors [Conference Poster]. https://www.osti.gov/biblio/1333251

Auden, E.C., Bielejec, E.S., Wampler, W.R., King, D.B., Aguirre, B.A., Vizkelethy, G., Doyle, B.L., & Doyle, B.L. (2015). Automated detection of single particle-induced gain degradation in irradiated heterojunction bipolar transistors [Conference Poster]. https://www.osti.gov/biblio/1336357

Vizkelethy, G., Bielejec, E.S., Auden, E.C., Aguirre, B.A., King, D.B., Patrizi, G., & Patrizi, G. (2015). Single Ion Displacement Effects in Heterojunction Bipolar Transistors [Conference Poster]. https://www.osti.gov/biblio/1304923

Bielejec, E.S., Vizkelethy, G., Aguirre, B.A., Auden, E.C., King, D.B., Patrizi, G., & Patrizi, G. (2015). Single Ion Displacement Effects in III-V Heterojunction Bipolar Transistors [Conference Poster]. https://www.osti.gov/biblio/1262629

Fleming, R.M., Wampler, W.R., Myers, S.M., King, D.B., & King, D.B. (2015). Generation-Recombination in Radiation Damaged III-V Heterojunction Bipolar Transistors [Conference Poster]. https://www.osti.gov/biblio/1248664

King, D.B., Fleming, R.M., Bielejec, E.S., McDonald, J.K., Vizkelethy, G., & Vizkelethy, G. (2014). Test simulation of neutron damage to electronic components using accelerator facilities [Conference Poster]. 10.1016/j.nimb.2015.08.026

King, D.B., Fleming, R.M., Bielejec, E.S., McDonald, J.K., Vizkelethy, G., & Vizkelethy, G. (2014). Test simulation of neutron damage to electronic components using accelerator facilities [Presentation]. https://doi.org/10.1016/j.nimb.2015.08.026

Bielejec, E.S., King, D.B., Patrizi, G., Serkland, D.K., Fleming, R.M., Vizkelethy, G., & Vizkelethy, G. (2014). Reverse Annealing Comparisons of PnP and Npn III-V HBTs under Ion Irradiation - Probing the Effects of Thermal and Current Injection Annealing [Presentation]. https://www.osti.gov/biblio/1496696

Bielejec, E.S., King, D.B., Vizkelethy, G., Doyle, B.L., Serkland, D.K., Fleming, R.M., Pacheco, J.L., Hughart, D.R., Marinella, M., Carroll, M.S., & Carroll, M.S. (2014). Radiation Testing Capability for Electronic Devices and Circuits at Sandia's Ion Beam Laboratory [Conference]. https://www.osti.gov/biblio/1145627

Bielejec, E.S., Vizkelethy, G., Doyle, B.L., Patrizi, G., King, D.B., & King, D.B. (2013). Potential Evidence for Post-Irradiation Defect Evolution Resulting in Enhanced Gain Degradation [Conference]. https://www.osti.gov/biblio/1113140

Fleming, R.M., Vizkelethy, G., Bielejec, E.S., King, D.B., McDonald, J.K., & McDonald, J.K. (2013). Revisiting Recombination Current in Electron Ion and Neutron Damaged GaAs Diodes [Presentation]. https://www.osti.gov/biblio/1649687

Vizkelethy, G., Bielejec, E.S., Fleming, R.M., King, D.B., Wampler, W.R., & Wampler, W.R. (2012). Radiation damage in bipolar junction transistors (BJTs) [Presentation]. https://www.osti.gov/biblio/1686331

Vizkelethy, G., Fleming, R.M., Kolb, N., King, D.B., Patrizi, G., & Patrizi, G. (2011). Effects of current injection annealing on III-V heterojunction bipolar transistors [Presentation]. https://www.osti.gov/biblio/1288650

McDonald, J.K., Sheridan, T.J., King, D.B., Hembree, C., & Hembree, C. (2009). Effects of Neutron and Electron Beam Pre-irradiation on Photocurrent [Conference]. https://www.osti.gov/biblio/1142470

Bielejec, E.S., Fleming, R.M., Vizkelethy, G., King, D.B., & King, D.B. (2008). Comparison Between Electrical and Direct Defect Measurements for Ion and Neutron Irradiations [Conference]. https://www.osti.gov/biblio/1145850

Vehar, D.W., Cooper, P.J., King, D.B., & King, D.B. (2007). Considerations on the relationship between dosimetry metrics and experimental conditions [Conference]. IEEE Transactions on Nuclear Science. https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=37249083520&origin=inward

Vizkelethy, G., Bielejec, E.S., Fleming, R.M., King, D.B., Doyle, B.L., & Doyle, B.L. (2007). Comparison of displacement damage due to ion and neutron beam irradiations in silicon bipolar junction transistors [Conference]. https://www.osti.gov/biblio/1146608

Griffin, P.J., Ramirez, D., King, D.B., Ginn, W., Harper-Slaboszewicz, V., Luker, S.M., McDonald, J.K., & McDonald, J.K. (2007). QASPR Program At Sandia National Laboratories [Conference]. https://www.osti.gov/biblio/1147856

Bielejec, E.S., Vizkelethy, G., Fleming, R.M., King, D.B., & King, D.B. (2007). Metrics for Comparison Between Displacement Damage due to Ion Beam and Neutron Irradiation in Silicon BJTs [Conference]. https://www.osti.gov/biblio/1147353

King, D.B. (2007). Modeling fast-transient defect evolution and carrier recombination in pulse-neutron-irradiated Si devices [Conference]. https://www.osti.gov/biblio/1147467

Bielejec, E.S., Vizkelethy, G., Fleming, R.M., King, D.B., Griffin, P.J., Doyle, B.L., & Doyle, B.L. (2007). Comparison between ion beam and fast neutron irradiation in silicon BJTs [Conference]. https://www.osti.gov/biblio/1266902

Bielejec, E.S., Vizkelethy, G., King, D.B., Fleming, R.M., & Fleming, R.M. (2007). Metrics for comparison between displacement damage due to ion beam and neutron irradiation in silicon BJTs [Conference]. https://www.osti.gov/biblio/1267222

King, D.B. (2007). Application of Spallation Neutron Sources in Support of Radiation Hardness Studies [Conference]. https://doi.org/10.1016/j.nima.2006.02.021

Bielejec, E.S., Vizkelethy, G., King, D.B., Doyle, B.L., & Doyle, B.L. (2006). Damage Equivalence of Heavy Ions in Silicon Bipolar Junction Transistors [Conference]. https://www.osti.gov/biblio/1264112

Griffin, P., King, D.B., Kolb, N., & Kolb, N. (2006). Application of spallation neutron sources in support of radiation hardness studies. Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 562(2), pp. 684-687. https://doi.org/10.1016/j.nima.2006.02.021

Luker, S.M., Griffin, P.J., Depriest, K.R., King, D.B., Naranjo, G.E., Suo-Anttila, A.J., Kellner, N., & Kellner, N. (2006). Development of a silicon calorimeter for dosimetry applications in a water-moderated reactor. ASTM Special Technical Publication, 1490 STP, pp. 389-397. https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=55549109747&origin=inward

King, D.B., Luker, S.M., Naranjo, G.E., Griffin, P.J., Hohlfelder, R.J., & Hohlfelder, R.J. (2005). Development and test program for radiation-hardened diamond PCDs. Proposed for publication in the Journal of ASTM International.. https://www.osti.gov/biblio/970688

King, D.B., Zavadil, K.R., Jennison, D., Battaile, C.C., Marshall, A.C., & Marshall, A.C. (2004). Low work function material development for the microminiature thermionic converter. 10.2172/918773

Jennison, D., Schultz, P.A., King, D.B., Zavadil, K.R., & Zavadil, K.R. (2003). BaO/W(100) thermionic emitters and the effects of Sc, Y, La, and the density functional used in computations. Proposed for publication in Surface Science Letters., 549(2). https://www.osti.gov/biblio/993919

Zavadil, K.R., King, D.B., Ruffner, J.A., & Ruffner, J.A. (2000). A Novel Thin Film Dispenser Cathode for Thermionic Emission [Conference]. https://www.osti.gov/biblio/769077

Zavadil, K.R., King, D.B., Ruffner, J.A., & Ruffner, J.A. (1999). Low work function thermionic emission materials. 10.2172/750167

King, D.B. (1998). Results from the Microminiature Thermionic Converter Demonstration Testing Program [Conference]. https://www.osti.gov/biblio/757