Hughart, D.R., Gao, X., Mamaluy, D., Marinella, M., Mickel, P.R., & Mickel, P.R. (2016). Power signatures of electric field and thermal switching regimes in memristive SET transitions. Journal of Physics D: Applied Physics, 49(24). 10.1088/0022-3727/49/24/245103
Publications
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Jump to search filtersGao, X., Mamaluy, D., Mickel, P.R., Marinella, M., & Marinella, M. (2015). Three-dimensional fully-coupled electrical and thermal transport model of dynamic switching in oxide memristors. ECS Transactions (Online), 69(5). 10.1149/06905.0183ecst
Marinella, M., Hughart, D.R., Stevens, J.E., Mickel, P.R., Haase, G.S., Decker, S., Apodaca, R., Bielejec, E.S., Vizkelethy, G., McLain, M., & McLain, M. (2015). Progress and Challenges in Developing a Reliable Embedded ReRAM Memory for Hostile Environments [Conference Poster]. https://www.osti.gov/biblio/1262938
Hughart, D.R., Mickel, P.R., Apodaca, R., Haase, G.S., el Gabaly, F., Talin, A.A., James, C.D., Marinella, M., & Marinella, M. (2015). Characterizing Switching Variability in TaOx Resistive Memories [Conference Poster]. https://www.osti.gov/biblio/1331607
Hughart, D.R., Lohn, A., Mickel, P.R., Bielejec, E.S., Vizkelethy, G., Doyle, B.L., Wolfley, S., Dodd, P., Shaneyfelt, M.R., McLain, M., Marinella, M., & Marinella, M. (2015). Resistive Memory for Space Applications [Conference Poster]. https://www.osti.gov/biblio/1255769
Hughart, D.R., Mickel, P.R., Apodaca, R., Haase, G.S., Marinella, M., & Marinella, M. (2015). Characterizing Switching Variability in TaOx Memristors [Conference Poster]. https://www.osti.gov/biblio/1248653
Marinella, M., Agarwal, S., Hughart, D.R., Mickel, P.R., Hsia, A.W., Plimpton, S.J., Decker, S., Apodaca, R., Aimone, J.B., James, C.D., Draelos, T.J., & Draelos, T.J. (2015). Resistive Memory for Neuromorphic Algorithm Acceleration [Conference Poster]. https://www.osti.gov/biblio/1240257
Gao, X., Mamaluy, D., Mickel, P.R., Marinella, M., & Marinella, M. (2015). Three-Dimensional Fully-Coupled Electrical and Thermal Transport Model of Oxide Memristors [Conference Poster]. https://www.osti.gov/biblio/1240110
Hughart, D.R., Pacheco, J.L., Lohn, A.J., Mickel, P.R., Bielejec, E.S., Vizkelethy, G., Doyle, B.L., Wolfley, S., Dodd, P., Shaneyfelt, M.R., McLain, M., Marinella, M., & Marinella, M. (2014). Mapping of radiation-induced resistance changes and multiple conduction channels in TaOx memristors [Presentation]. IEEE Transactions on Nuclear Science. https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=84919791298&origin=inward
Hughart, D.R., Pacheco, J.L., Lohn, A.J., Mickel, P.R., Bielejec, E.S., Vizkelethy, G., Doyle, B.L., Wolfley, S., Dodd, P., Shaneyfelt, M.R., McLain, M., Marinella, M., & Marinella, M. (2014). Mapping of radiation-induced resistance changes and multiple conduction channels in TaOx memristors [Conference Poster]. IEEE Transactions on Nuclear Science. https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=84919791298&origin=inward
McLain, M., Sheridan, T.J., Hjalmarson, H.P., Mickel, P.R., Hanson, D.J., McDonald, J.K., Hughart, D.R., Marinella, M., & Marinella, M. (2014). The susceptibility of TaOx-based memristors to high dose rate ionizing radiation and total ionizing dose. IEEE Transactions on Nuclear Science, 61(6). 10.1109/TNS.2014.2364521
Marinella, M., Howell, S.W., Decker, S., Hughart, D.R., Lohn, A.J., Mickel, P.R., Apodaca, R., Bielejec, E.S., Foulk, J.W., Wolfley, S., Stevens, J.E., Brennecka, G., & Brennecka, G. (2014). Characterization of Switching Filament Formation in TaOx Memristive Memory Films [Presentation]. https://www.osti.gov/biblio/1242129
Marinella, M., Mickel, P.R., Lohn, A.J., Hughart, D.R., Bondi, R.J., Mamaluy, D., Hjalmarson, H.P., Stevens, J.E., Decker, S., Apodaca, R., Evans, B.R., Aimone, J.B., Rothganger, F., James, C.D., Debenedictis, E., & Debenedictis, E. (2014). Development characterization and modeling of a TaOx ReRAM for a neuromorphic accelerator [Conference Poster]. 10.2172/1241888
Lohn, A.J., Doyle, B.L., Mickel, P.R., Stevens, J.E., Marinella, M., & Marinella, M. (2014). Rutherford forward scattering and elastic recoil detection (RFSERD) as a method for characterizing ultra-thin films [Conference]. Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms. https://doi.org/10.1016/j.nimb.2014.02.038
Lohn, A.J., Doyle, B.L., Stein, G.J., Mickel, P.R., Stevens, J.E., Marinella, M., & Marinella, M. (2014). Rutherford forward scattering and elastic recoil detection (RFSERD) as a method for characterizing ultra-thin films. Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, 332, pp. 99-102. https://doi.org/10.1016/j.nimb.2014.02.038
McLain, M., Sheridan, T.J., Hjalmarson, H.P., Mickel, P.R., Hanson, D.J., McDonald, J.K., Hughart, D.R., Marinella, M., & Marinella, M. (2014). The Susceptibility of TaOx-based Memristive Devices to Continuous and Pulsed Ionizing Radiation [Presentation]. https://www.osti.gov/biblio/1496553
Mickel, P.R., Marinella, M., & Marinella, M. (2014). Analytical estimations for thermal crosstalk, retention, and scaling limits in filamentary resistive memory. Journal of Applied Physics, 115(23). 10.1063/1.4885045
Lohn, A.J., Mickel, P.R., Marinella, M., & Marinella, M. (2014). Shell-Based Simulation of Filamentary Resistive Memory. Nanotechnology. https://www.osti.gov/biblio/1183002
Brumbach, M.T., Kalan, M., Mirabal, A.J., Mickel, P.R., Lohn, A.J., Marinella, M., Stevens, J.E., & Stevens, J.E. (2014). Evaluating Tantalum Oxide Stoichiometry and Oxidation States for Optimal Memristor Performance. Journal of Applied Physics. 10.1116/1.4893929
Brumbach, M.T., Kalan, M., Mirabal, A.J., Mickel, P.R., Lohn, A.J., Marinella, M., Stevens, J.E., & Stevens, J.E. (2014). Supplemental Information for Evaluating Tantalum Oxide Stoichiometry and Oxidation States for Optimal Memristor Performance. Journal of Applied Physics. https://www.osti.gov/biblio/1146911
Lohn, A.J., Decker, S., Doyle, B.L., Mickel, P.R., Marinella, M., & Marinella, M. (2014). Reactive sputtering of substoichiometric Ta2Ox for resistive memory applications. Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films, 32(2). https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=85043625094&origin=inward
McDonald, J.K., Sheridan, T.J., Chantler, G., Mickel, P.R., Hanson, D.J., Hughart, D.R., Marinella, M., & Marinella, M. (2014). The Susceptibility of TaOx-based Memristive Devices to Continuous and Pulsed Ionizing Radiation [Conference]. https://www.osti.gov/biblio/1140677
Mickel, P.R., James, C.D., Marinella, M., & Marinella, M. (2014). Physical Description and Experimental Characterization of the Resistive Switching Filament [Conference]. https://www.osti.gov/biblio/1141260
Marinella, M., Mickel, P.R., Lohn, A.J., Hughart, D.R., Bondi, R.J., Mamaluy, D., Hjalmarson, H.P., Stevens, J.E., Decker, S., Apodaca, R., Evans, B.R., Aimone, J.B., Rothganger, F., James, C.D., Debenedictis, E., & Debenedictis, E. (2014). Development, characterization, and modeling of a TaOx ReRAM for a neuromorphic accelerator [Conference Poster]. ECS Transactions. 10.1149/06414.0037ecst
Hughart, D.R., Marshall, M., McLain, M., Marinella, M., Lohn, A.J., Mickel, P.R., Dodd, P., Shaneyfelt, M.R., Silva, A.I., Bielejec, E.S., & Bielejec, E.S. (2013). Displacement Damage and Ionization Effects in TaOx and TiO2 Memristors [Presentation]. https://www.osti.gov/biblio/1682565
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