Publications

Dejong, S.A., Multari, R., Foulk, J.W., Tangyunyong, P., & Tangyunyong, P. (2022). Evaluation of COTS Electronics by Power Spectrum Analysis and Multivariate Data Analysis. 10.2172/1890397

Tangyunyong, P. (2022). CTAP REPORT. Commercialization of Power Spectrum Analysis (PSA) Technology. 10.2172/1874426

Missert, N., Jenkins, M.W., Tangyunyong, P., Mook, W., Vernik, I.V., Kirichenko, A.F., Mukhanov, O.A., Wynn, A., Day, A.L., Bolkhovsky, V., Johnson, L.M., & Johnson, L.M. (2019). Diagnosis of Factors Impacting Yield in Multilayer Devices for Superconducting Electronics. IEEE Transactions on Applied Superconductivity, 29(5). 10.1109/TASC.2019.2908052

Tangyunyong, P., Schmidt, C., & Schmidt, C. (2019). Localizing Defects with Thermal Detection Techniques. 10.31399/asm.tb.mfadr7.t91110209

Tangyunyong, P., Schmidt, C., & Schmidt, C. (2019). Thermal Defect Detection Techniques. https://www.osti.gov/biblio/1524283

Missert, N., Jenkins, M.W., Tangyunyong, P., Mook, W.M., Vernik, I., Kirichenko, A., Mukhanov, O., Wynn, A., Day, A.L., Bolkhovsky, V., Johnson, L., & Johnson, L. (2018). Diagnosis of factors impacting yield in multilayer devices for superconducting electronics [Conference Poster]. 10.1109/TASC.2019.2908052

Tangyunyong, P. (2018). Power Spectrum Analysis (PSA) [Presentation]. https://www.osti.gov/biblio/1592650

Tangyunyong, P., Foulk, J.W., Udoni, D., Jenkins, M.W., Walraven, J., & Walraven, J. (2018). TIVA Measurements with Visible and 1064 nm Lasers [Presentation]. https://www.osti.gov/biblio/1513358

Tangyunyong, P., Loubriel, G.M., & Loubriel, G.M. (2018). Power Spectrum Analysis (PSA) for Counterfeit and Aging Detection [Presentation]. https://www.osti.gov/biblio/1806510

Jenkins, M.W., Tangyunyong, P., Missert, N., Vernik, I., Kirichhenko, A., Mukhanov, O., Wynn, A., Bolkhovsky, V., Johnson, L., & Johnson, L. (2018). Ambient Temperature Thermally Induced Voltage Alteration (TIVA) for Identification of Defects in Superconducting Electronics [Conference Poster]. Conference Proceedings from the International Symposium for Testing and Failure Analysis. https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=85065448777&origin=inward

Tangyunyong, P., Foulk, J.W., Loubriel, G.M., Beutler, J., Udoni, D., Paskaleva, B.S., Buchheit, T.E., & Buchheit, T.E. (2017). Power Spectrum Analysis (PSA) [Conference Poster]. https://www.osti.gov/biblio/1462644

Loubriel, G.M., Tangyunyong, P., & Tangyunyong, P. (2017). Power Spectrum Analysis (PSA) for Detecting Counterfeit Electronics [Conference Poster]. https://www.osti.gov/biblio/1476785

Tangyunyong, P., Udoni, D., Loubriel, G.M., & Loubriel, G.M. (2017). Various Applications of Power Spectrum Analysis (PSA) [Conference Poster]. https://www.osti.gov/biblio/1426393

Tangyunyong, P., Foulk, J.W., Loubriel, G.M., Beutler, J., Udoni, D., Paskaleva, B.S., Buchheit, T.E., & Buchheit, T.E. (2017). Power spectrum analysis (PSA) [Conference Poster]. Conference Proceedings from the International Symposium for Testing and Failure Analysis. https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=85048865857&origin=inward

Tangyunyong, P., Udoni, D., Loubriel, G.M., & Loubriel, G.M. (2016). Various Applications of Power Spectrum Analysis (PSA) [Conference Poster]. https://www.osti.gov/biblio/1412079

Tangyunyong, P., Loubriel, G.M., & Loubriel, G.M. (2016). Power Spectrum Analysis [Presentation]. https://www.osti.gov/biblio/1372181

Miller, M.A., Tangyunyong, P., Foulk, J.W., & Foulk, J.W. (2016). Characterization of electrically-active defects in ultraviolet light-emitting diodes with laser-based failure analysis techniques. Journal of Applied Physics, 119(2). 10.1063/1.4939305

Missert, N., Jenkins, M.W., Tangyunyong, P., Kotula, P.G., Michael, J.R., & Michael, J.R. (2015). Failure Analysis and Process Improvement for Superconducting Electronics [Presentation]. https://www.osti.gov/biblio/1291972

Okandan, M., Nielson, G.N., Yang, B.B., Cruz-Campa, J.L., Haase, G.S., Tangyunyong, P., & Tangyunyong, P. (2014). Stress Factor Assessment for Microsystems-Enabled Photovoltaics [Conference]. https://doi.org/10.1109/PVSC.2014.6925156

Cruz-Campa, J.L., Haase, G.S., Tangyunyong, P., Okandan, M., Nielson, G.N., & Nielson, G.N. (2014). Reliability Model Development for Microsystems-Enabled Photovoltaics [Conference]. https://www.osti.gov/biblio/1147569

Cruz-Campa, J.L., Haase, G.S., Colr, E.I., Tangyunyong, P., Okandan, M., Nielson, G.N., & Nielson, G.N. (2014). Defect localization, characterization and reliability assessment in emerging photovoltaic devices. 10.2172/1177042

Cruz-Campa, J.L., Haase, G.S., Colr, E.I., Tangyunyong, P., Resnick, P., Okandan, M., Nielson, G.N., & Nielson, G.N. (2014). Failure analysis techniques for microsystems-enabled photovoltaics. IEEE Journal of Photovoltaics, 4(1), pp. 470-476. 10.1109/JPHOTOV.2013.2284864

Cruz-Campa, J.L., Haase, G.S., Tangyunyong, P., Colr, E.I., Pimentel, A.A., Resnick, P., Okandan, M., Nielson, G.N., & Nielson, G.N. (2013). Fault localization and failure modes in microsystems-enabled photovoltaic devices [Conference]. IEEE International Reliability Physics Symposium Proceedings. https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=84880971750&origin=inward

Yang, B.B., Cruz-Campa, J.L., Haase, G.S., Tangyunyong, P., Colr, E.I., Pimentel, A.A., Resnick, P., Okandan, M., Nielson, G.N., & Nielson, G.N. (2013). Fault localization and failure modes in microsystems-enabled photovoltaic devices [Conference]. IEEE International Reliability Physics Symposium Proceedings. https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=84880971750&origin=inward

Cruz-Campa, J.L., Haase, G.S., Colr, E.I., Tangyunyong, P., Okandan, M., Nielson, G.N., Yang, B.B., & Yang, B.B. (2013). Defect localization characterization and reliability model development for microsystems-enabled photovoltaics [Presentation]. https://www.osti.gov/biblio/1662107

Yang, B.B., Cruz-Campa, J.L., Haase, G.S., Colr, E.I., Tangyunyong, P., Okandan, M., Nielson, G.N., & Nielson, G.N. (2013). Comparison of Beam-Based Failure Analysis Techniques for Microsystems-Enabled Photovoltaics [Conference]. https://www.osti.gov/biblio/1106830

Colr, E.I., Tangyunyong, P., Pimentel, A.A., Udoni, D., & Udoni, D. (2013). Novel Defect Detection Using Laser-Based Imaging and TIVA with a Visible Laser [Conference]. https://www.osti.gov/biblio/1106055

Cruz-Campa, J.L., Haase, G.S., Colr, E.I., Tangyunyong, P., Resnick, P., Okandan, M., Nielson, G.N., Kilgo, A.C., & Kilgo, A.C. (2013). Copy of Failure Analysis and Reliability Model Development for Microsystems-Enabled Photovoltaics [Conference]. https://www.osti.gov/biblio/1083665

Cruz-Campa, J.L., Haase, G.S., Colr, E.I., Tangyunyong, P., Resnick, P., Okandan, M., Nielson, G.N., & Nielson, G.N. (2013). Failure Analysis and Reliability Model Development for Microsystems- Enabled Photovoltaics [Conference]. https://www.osti.gov/biblio/1083083

Colr, E.I., Tangyunyong, P., Pimentel, A.A., Udoni, D., & Udoni, D. (2013). Novel defect detection using laser-based imaging and TIVA with a visible laser [Conference]. Conference Proceedings from the International Symposium for Testing and Failure Analysis. https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=84903985232&origin=inward

Yang, B.B., Cruz-Campa, J.L., Haase, G.S., Colr, E.I., Tangyunyong, P., Okandan, M., Nielson, G.N., & Nielson, G.N. (2013). Comparison of beam-based failure analysis techniques for microsystems-enabled photovoltaics [Conference]. Conference Proceedings from the International Symposium for Testing and Failure Analysis. https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=84903955366&origin=inward

Cruz-Campa, J.L., Haase, G.S., Colr, E.I., Tangyunyong, P., Resnick, P., Okandan, M., Nielson, G.N., & Nielson, G.N. (2013). Failure Analysis and Reliability Model Development for Microsystems- Enabled Photovoltaics [Conference]. https://www.osti.gov/biblio/1145391

Colr, E.I., Tangyunyong, P., & Tangyunyong, P. (2012). Characterization of Failure Modes in Deep UV and Deep Green LEDs Utilizing Advanced Semiconductor Localization Techniques. 10.2172/1038197

Colr, E.I., Tangyunyong, P., & Tangyunyong, P. (2011). Characterization of Failure Modes in Deep UV and Deep Green LEDs Utilizing Advanced Semiconductor Localization Techniques [Presentation]. https://www.osti.gov/biblio/1666313

Colr, E.I., Tangyunyong, P., & Tangyunyong, P. (2011). Characterization of Ultraviolet LEDs by Electrical Analysis and Laser-based Failure Analysis Techniques [Conference]. https://www.osti.gov/biblio/1107560

Tangyunyong, P., Colr, E.I., & Colr, E.I. (2011). Infrared Laser Interaction with SOI Transistors [Conference]. https://www.osti.gov/biblio/1108348

Colr, E.I., Tangyunyong, P., & Tangyunyong, P. (2010). Characterization of failure modes in deep UV and deep green LEDs utilizing advanced semiconductor localization techniques [Conference]. https://www.osti.gov/biblio/1021564

Colr, E.I., Tangyunyong, P., & Tangyunyong, P. (2010). Characterization of green and ultraviolet LEDs by laser-based FA techniques [Conference]. https://www.osti.gov/biblio/1021127

Jenkins, M.W., Tangyunyong, P., Colr, E.I., Soden, J., Walraven, J., Pimentel, A.A., & Pimentel, A.A. (2006). Floating substrate passive voltage contrast (FSPVC) [Conference]. https://www.osti.gov/biblio/893544

Dyck, M.L., Tangyunyong, P., Hill, T.A., Nakakura, C.Y., Headley, T.J., Rye, M.J., & Rye, M.J. (2005). Transmission electron microscopy and scanning capacitance microscopy analysis of dislocation-induced leakages in n-channel I/O transistors [Conference]. https://www.osti.gov/biblio/884701

Dyck, M.L., Tangyunyong, P., Hill, T.A., Nakakura, C.Y., Headley, T.J., Rye, M.J., & Rye, M.J. (2005). Transmission Electron Microscopy and Scanning Capacitance Microscopy Analysis of Dislocation-Induced Leakages in n-channel I/O Transistors. Proposed for publication in the Conference proceedings from the 31st International Symposium for Testing and Failure Analysis.. https://www.osti.gov/biblio/885112

Tangyunyong, P., Headley, T.J., Rye, M.J., Hill, T.A., Nakakura, C.Y., Soden, J., Colr, E.I., Flores, R.S., Shaneyfelt, M.R., Dockerty, R.C., & Dockerty, R.C. (2003). Novel application of transmission electron microscopy and scanning capacitance microscopy for defect root cause identification and yield enhancement [Conference]. https://www.osti.gov/biblio/1004355

Shaneyfelt, M.R., Tangyunyong, P., Hill, T.A., Soden, J., Flores, R.S., Schwank, J.R., Dodd, P., Hash, G.L., & Hash, G.L. (2003). Identification of radiation-induced parasitic leakage paths using light emission microscopy [Conference]. https://www.osti.gov/biblio/920796

Walraven, J., Soden, J., Tanner, D.M., Tangyunyong, P., Colr, E.I., Anderson, R.E., Irwin, L.W., & Irwin, L.W. (2000). Electrostatic discharge/electrical overstress susceptibility in MEMS: A new failure mode [Conference]. Proceedings of SPIE - The International Society for Optical Engineering. https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=0034546864&origin=inward

Walraven, J., Colr, E.I., Tangyunyong, P., & Tangyunyong, P. (2000). Failure Analysis of MEMS Using Thermally-Induced Voltage Alteration [Conference]. https://www.osti.gov/biblio/762125

Campbell, A.N., Hembree, C., Tangyunyong, P., Jessing, J.R., Soden, J., & Soden, J. (2000). Focused ion beam damage to MOS integrated circuits [Conference]. https://www.osti.gov/biblio/756102

Colr, E.I., Tangyunyong, P., Barton, D.L., & Barton, D.L. (1999). LDRD final report backside localization of open and shorted IC interconnections LDRD Project (FY98 and FY 99). 10.2172/750173

Tangyunyong, P., Benson, D.A., Colr, E.I., & Colr, E.I. (1999). Thermal Modeling of TIVA Profiles of a Polysilcon-Metal Test Structure. Journal of Applied Physics. https://www.osti.gov/biblio/12672

Tangyunyong, P. (1999). What is Scanning Probe Microscopy? And How Can It Be Used In Failure Analysis?. Electronics Device Failure Analysis News. https://www.osti.gov/biblio/5010

Tangyunyong, P. (1996). Localizing Heat-Generating Defects Using Fluorescent Microthermal Imaging [Conference]. Conference Proceedings from the International Symposium for Testing and Failure Analysis. 10.2172/391710

Tangyunyong, P. (1995). Photon statistics, film preparation and characterization in fluorescent microthermal imaging [Conference]. https://www.osti.gov/biblio/100055