Stirk, W., Black, D.A., Black, J.D., Breeding, M., Foulk, J.W., Wirthlin, M., Goeders, J., & Goeders, J. (2023). The Effects of Gamma Ray Integrated Dose on a Commercial 65-nm SRAM Device. IEEE Transactions on Nuclear Science, 70(8), pp. 2008-2017. 10.1109/tns.2023.3283310
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Jump to search filtersBlack, J.D., Black, D.A., Foulk, J.W., Stirk, W., Goeders, J., Wirthlin, M., & Wirthlin, M. (2022). The Effects of Gamma Ray Integrated Dose on a Commercial 65nm SRAM Device [Conference Presentation]. 10.2172/2005230
Agarwal, S., Clark, L., Youngsciortino, C., Ng, G., Black, D.A., Cannon, M.J., Black, J.D., Quinn, H.M., Barnaby, H., Brunhaver, J.S., Marinella, M., & Marinella, M. (2021). Measurement and Modeling of Single Event Transients in 12nm Inverters [Conference Presentation]. 10.2172/1872878
Tonigan, A.M., Ball, D., Vizkelethy, G., Black, J.D., Black, D.A., Trippe, J., Bielejec, E.S., Alles, M.L., Reed, R.S., Schrimpf, R.D., & Schrimpf, R.D. (2021). Impact of Surface Recombination on Single-Event Charge Collection in an SOI Technology. IEEE Transactions on Nuclear Science, 68(3), pp. 305-311. 10.1109/tns.2021.3056898
Cannon, M.J., Rodrigues, A., Black, D.A., Black, J.D., Bustamante, L., Feinberg, B., Quinn, H., Lawrence, C., Brunhaver, J., Hugh, B., McLain, M., Agarwal, S., Marinella, M., & Marinella, M. (2020). Multiscale System Modeling of Single Event Induced Faults in Advanced Node Processors [Conference Presentation]. 10.2172/1831591
Black, J.D., Black, D.A., Ball, D.R., McLain, M., Marinella, M., Esposito, M.G., Hughart, D.R., Bennett, C., Salas, J.G., Reed, R.A., Weller, R.A., Breeding, M., Tonigan, A.M., Schrimpf, R.D., & Schrimpf, R.D. (2020). DFF Architecture Impact on SEU Response in Different Semiconductor Technologies [Conference Presentation]. 10.2172/1824738
Cannon, M.J., Rodrigues, A., Black, D.A., Black, J.D., Bustamante, L., Feinberg, B., Quinn, H., Clark, L., Brunhaver, J.S., Barnaby, H., McLain, M., Agarwal, S., Marinella, M., & Marinella, M. (2020). Fault Tracking and Modeling in Advanced Node Processors of Single Event Effects [Conference Poster]. https://www.osti.gov/biblio/1822293
Cannon, M.J., Rodrigues, A., Black, D.A., Black, J.D., Bustamante, L., Feinberg, B., Clark, L., Brunhaver, J., Barnaby, H., Agarwal, S., Marinella, M., & Marinella, M. (2020). Multiscale Modeling of Single Event-Induced Faults in FinFET-based Processors [Conference Poster]. https://www.osti.gov/biblio/1810050
Black, J.D., Black, D.A., Domme, N.A., Dodd, P., Griffin, P.J., Nowlin, R.N., Trippe, J., Salas, J.G., Reed, R.A., Weller, R.A., Tonigan, A.M., Schrimpf, R.D., & Schrimpf, R.D. (2020). DFF Layout Variations in CMOS SOI -Analysis of Hardening by Design Options. IEEE Transactions on Nuclear Science, 67(6), pp. 1125-1132. 10.1109/TNS.2020.2973569
Black, J.D. (2020). Modeling and Simulation Approaches to Single-Event Effects in Microelectronics [Presentation]. https://www.osti.gov/biblio/1766747
Auden, E.C., Quinn, H.M., Wender, S.A., Donnell, P.W.'., Lisowski, J., George, J.S., Xu, N., Black, D.A., Black, J.D., & Black, J.D. (2019). Thermal neutron-induced single-event upsets in microcontrollers containing boron-10. IEEE Transactions on Nuclear Science, 67(1). 10.1109/TNS.2019.2951996
Black, J.D., Black, D.A., Domme, N.A., Dodd, P., Griffin, P.J., Nowlin, R.N., Trippe, J., Salas, J.G., Reed, R., Weller, R., Tonigan, D., Schrimpf, R., & Schrimpf, R. (2019). DFF Layout Variations in CMOS SOI ? Analysis of Hardening by Design Options [Conference Poster]. 10.1109/TNS.2020.2973569
Tonigan, D., Ball, D., Vizkelethy, G., Black, J.D., Black, D.A., Trippe, J., Bielejec, E.S., Alles, M., Reed, R., Schrimpf, R., & Schrimpf, R. (2019). Impact of interface quality on single-event charge collection in SOI technologies [Conference Poster]. https://www.osti.gov/biblio/1641056
Black, J.D., Dame, J.A., Black, D.A., Dodd, P., Shaneyfelt, M.R., Teifel, J., Salas, J.G., Steinbach, R., Davis, M., Reed, R.A., Weller, R.A., Trippe, J., Warren, K.M., Tonigan, A.M., Schrimpf, R.D., Marquez, R.S., & Marquez, R.S. (2019). Using MRED to Screen Multiple-Node Charge-Collection Mitigated SOI Layouts [Conference Poster]. IEEE Transactions on Nuclear Science. https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=85057364495&origin=inward
Black, J.D., Dame, J.A., Black, D.A., Dodd, P., Shaneyfelt, M.R., Teifel, J., Salas, J.G., Steinbach, R., Davis, M., Reed, R.A., Weller, R.A., Trippe, J., Warren, K.M., Tonigan, A.M., Schrimpf, R.D., Marquez, R.S., & Marquez, R.S. (2019). Using MRED to Screen Multiple-Node Charge-Collection Mitigated SOI Layouts [Conference Poster]. IEEE Transactions on Nuclear Science. 10.1109/TNS.2018.2882944
Teifel, J., Black, J.D., Cavanaugh, W.S., Clark, K., McCasland, J., Owen, R.E., Sharif, M., & Sharif, M. (2018). A Rad-Hard eFPGA Core for Reconfigurable System-On-Chips [Conference Poster]. https://www.osti.gov/biblio/1498198
Teifel, J., Black, J.D., Cavanaugh, W.S., Clark, K.D., McCasland, J., Owen, R.E., Sharif, M., & Sharif, M. (2017). A Rad-Hard eFPGA Core for Reconfigurable System-On-Chips [Conference Poster]. https://www.osti.gov/biblio/1513170
Musson, L.C., Black, D.A., Black, J.D., & Black, J.D. (2016). Single Event Effects in Sandia's CMOS7 Devices and Acceptance Testing in Integrated Circuits [Presentation]. https://www.osti.gov/biblio/1373252
Dodds, N.A., Martinez, M., Dodd, P., Shaneyfelt, M.R., Sexton, F.W., Black, J.D., Lee, D.S., Swanson, S.E., Bhuva, B.L., Warren, K.M., Reed, R.A., Trippe, J., Sierawski, B.D., Weller, R.A., Mahatme, N., Gaspard, N.J., Assis, T., Austin, R., Massengill, L.W., … Puchner, H. (2015). The Contribution of Low-Energy Protons to the Total On-Orbit SEU Rate [Conference Poster]. IEEE Transactions on Nuclear Science. 10.1109/TNS.2015.2486763
Dodds, N.A., Martinez, M., Dodd, P., Shaneyfelt, M.R., Sexton, F.W., Black, J.D., Lee, D.S., Swanson, S.E., Bhuva, B.L., Warren, K.M., Reed, R.A., Trippe, J., Sierawski, B.D., Weller, R.A., Mahatme, N., Gaspard, N.J., Assis, T., Austin, R., Massengill, L.W., … Puchner, H. (2015). The Contribution of Low-Energy Protons to the Total On-Orbit SEU Rate [Conference Poster]. IEEE Transactions on Nuclear Science. https://doi.org/10.1109/TNS.2015.2486763
Dodds, N.A., Dodd, P., Shaneyfelt, M.R., Sexton, F.W., Martinez, M., Black, J.D., Marshall, P.W., Reed, R.A., McCurdy, M.W., Weller, R.A., Pellish, J.A., Rodbell, K.P., Gordon, M.S., & Gordon, M.S. (2015). New insights gained on mechanisms of low-energy proton-induced SEUs by minimizing energy straggle. IEEE Transactions on Nuclear Science, 62(6). 10.1109/TNS.2015.2488588
Dodds, N.A., Martinez, M., Dodd, P., Shaneyfelt, M.R., Sexton, F.W., Black, J.D., Lee, D.S., Swanson, S.E., Bhuva, B.L., Warren, K.M., Reed, R.A., Trippe, J., Sierawski, B.D., Weller, R.A., Mahatme, N., Gaspard, N.J., Assis, T.R., Austin, R., Weeden-Wright, S.L., … Puchner, H. (2015). Outstanding Conference Paper Award: 2015 IEEE Nuclear and Space Radiation Effects Conference. IEEE Transactions on Nuclear Science, 62(6). 10.1109/TNS.2015.2502501
Dodds, N.A., Martinez, M., Dodd, P., Shaneyfelt, M.R., Sexton, F.W., Black, J.D., Lee, D.S., Swanson, S.E., Bhuva, B.L., Warren, K.M., Reed, R.A., Trippe, J., Sierawski, B.D., Weller, R.A., Mahatme, N., Gaspard, N., Assis, T., Austin, R., Massengill, L.M., … Puchner, H. (2015). The contribution of low-energy protons to the total on-orbit SEU rate. IEEE Transactions on Nuclear Science, 62(6). 10.1109/TNS.2015.2486763
Dodds, N.A., Dodd, P., Shaneyfelt, M.R., Sexton, F.W., Martinez, M., Black, J.D., Marshall, P., Reed, R., McCurdy, M., Weller, R., Pellish, J., Rodbell, K., Gordon, M., & Gordon, M. (2015). New insights gained on mechanisms of low-energy proton-induced SEUs by minimizing energy straggle [Conference Poster]. 10.1109/TNS.2015.2488588
Dodds, N.A., Dodd, P., Shaneyfelt, M.R., Sexton, F.W., Martinez, M., Black, J.D., Marshall, P., Reed, R., McCurdy, M., Weller, R., Pellish, J., Rodbell, K., Gordon, M., & Gordon, M. (2015). New insights gained on mechanisms of low-energy proton-induced SEUs by minimizing energy straggle [Conference Poster]. https://doi.org/10.1109/TNS.2015.2488588
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