Publications

Black, J.D., Dame, J.A., Black, D.A., Dodd, P., Shaneyfelt, M.R., Teifel, J., Salas, J.G., Steinbach, R., Davis, M., Reed, R.A., Weller, R.A., Trippe, J., Warren, K.M., Tonigan, A.M., Schrimpf, R.D., Marquez, R.S., & Marquez, R.S. (2019). Using MRED to Screen Multiple-Node Charge-Collection Mitigated SOI Layouts [Conference Poster]. IEEE Transactions on Nuclear Science. https://doi.org/10.1109/TNS.2018.2882944

Black, J.D., Dame, J.A., Black, D.A., Dodd, P., Shaneyfelt, M.R., Teifel, J., Salas, J.G., Steinbach, R., Davis, M., Reed, R.A., Weller, R.A., Trippe, J., Warren, K.M., Tonigan, A.M., Schrimpf, R.D., Marquez, R.S., & Marquez, R.S. (2019). Using MRED to Screen Multiple-Node Charge-Collection Mitigated SOI Layouts [Conference Poster]. IEEE Transactions on Nuclear Science. https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=85057364495&origin=inward

King, M.P., Massey, G., Silva, A., Cannon, E., Shaneyfelt, M.R., Loveless, T., Ballast, J., Cabanas-Holmen, M., Digregorio, S., Rice, W.C., Draper, B.L., Oldgies, P., Rodbell, K., & Rodbell, K. (2018). TID-Induced Leakage and Drive Characteristics of Planar 22-nm PDSOI and 14-nm Bulk and Quasi-SOI FinFET Devices [Conference Poster]. https://www.osti.gov/biblio/1570155

McLain, M., McDonald, J.K., Hembree, C., Sheridan, T.J., Weingartner, T.A., Dodd, P., Shaneyfelt, M.R., Hartman, F., Black, D.A., & Black, D.A. (2018). Understanding the Implications of a LINAC's Microstructure on Devices and Photocurrent Models [Conference Poster]. IEEE Transactions on Nuclear Science. https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=85032706914&origin=inward

McLain, M., McDonald, J.K., Hartman, F., Sheridan, T.J., Dodd, P., Shaneyfelt, M.R., Hembree, C., Black, D.A., Weingartner, T.A., & Weingartner, T.A. (2017). Understanding the Implications of a LINAC’s Microstructure on Devices and Photocurrent Models. IEEE Transactions on Nuclear Science, 65(1), pp. 184-191. https://doi.org/10.1109/TNS.2017.2764799

Shaneyfelt, M.R., Dodds, N.A., & Dodds, N.A. (2017). Upsets in Erased Floating Gate Cells with High-Energy Protons. IEEE Transactions on Nuclear Science, 64(1), pp. 421-426. https://doi.org/10.1109/tns.2016.2636830

King, M.P., Wu, X., Eller, M., Samavedam, S., Shaneyfelt, M.R., Silva, A.I., Draper, B.L., Rice, W.C., Meisenheimer, T.L., Zhang, E.X., Haeffner, T.D., Ball, D.R., Shetler, K.J., Alles, M.L., Kauppila, J.S., Massengill, L.W., & Massengill, L.W. (2017). Analysis of TID Process, Geometry, and Bias Condition Dependence in 14-nm FinFETs and Implications for RF and SRAM Performance [Conference Poster]. IEEE Transactions on Nuclear Science. https://doi.org/10.1109/TNS.2016.2634538

King, M.P., Wu, X., Eller, M., Samavedam, S., Shaneyfelt, M.R., Silva, A.I., Draper, B.L., Rice, W.C., Meisenheimer, T.L., Zhang, E.X., Haeffner, T.D., Ball, D.R., Shetler, K.J., Alles, M.L., Kauppila, J.S., Massengill, L.W., & Massengill, L.W. (2016). Analysis of TID process, geometry, and bias condition dependence in 14-nm FinFETs and implications for RF and SRAM performance. IEEE Transactions on Nuclear Science. https://doi.org/10.1109/tns.2016.2634538

Dodds, N.A., Dodd, P., Shaneyfelt, M.R., Sexton, F.W., Martinez, M., Black, J.D., Marshall, P.W., Reed, R.A., McCurdy, M.W., Weller, R.A., Pellish, J.A., Rodbell, K.P., Gordon, M.S., & Gordon, M.S. (2015). New Insights Gained on Mechanisms of Low-Energy Proton-Induced SEUs by Minimizing Energy Straggle. IEEE Transactions on Nuclear Science, 62(6), pp. 2822-2829. https://doi.org/10.1109/TNS.2015.2488588

Dodds, N.A., Martinez, M., Dodd, P., Shaneyfelt, M.R., Sexton, F.W., Black, J.D., Lee, D.S., Swanson, S.E., Bhuva, B.L., Warren, K.M., Reed, R.A., Trippe, J., Sierawski, B.D., Weller, R.A., Mahatme, N., Gaspard, N.J., Assis, T., Austin, R., Massengill, L.W., … Puchner, H. (2015). The Contribution of Low-Energy Protons to the Total On-Orbit SEU Rate [Conference Poster]. IEEE Transactions on Nuclear Science. https://doi.org/10.1109/TNS.2015.2486763

Dodds, N.A., Martinez, M., Dodd, P., Shaneyfelt, M.R., Sexton, F.W., Black, J.D., Lee, D.S., Swanson, S.E., Bhuva, B.L., Warren, K.M., Reed, R.A., Trippe, J., Sierawski, B.D., Weller, R.A., Mahatme, N., Gaspard, N.J., Assis, T., Austin, R., Massengill, L.W., … Puchner, H. (2015). The Contribution of Low-Energy Protons to the Total On-Orbit SEU Rate [Conference Poster]. IEEE Transactions on Nuclear Science. https://doi.org/10.1109/TNS.2015.2486763

Dodds, N.A., Martinez, M., Dodd, P., Shaneyfelt, M.R., Sexton, F.W., Black, J.D., Lee, D.S., Swanson, S.E., Bhuva, B.L., Warren, K.M., Reed, R.A., Trippe, J., Sierawski, B.D., Weller, R.A., Mahatme, N., Gaspard, N.J., Assis, T.R., Austin, R., Weeden-Wright, S.L., … Puchner, H. (2015). Outstanding Conference Paper Award: 2015 IEEE Nuclear and Space Radiation Effects Conference. IEEE Transactions on Nuclear Science, 62(6), pp. 2383-2388. https://doi.org/10.1109/TNS.2015.2502501

Dodds, N.A., Martinez, M., Dodd, P., Shaneyfelt, M.R., Sexton, F.W., Black, J.D., Lee, D.S., Swanson, S.E., Bhuva, B.L., Warren, K.M., Reed, R.A., Trippe, J., Sierawski, B.D., Weller, R.A., Mahatme, N., Gaspard, N., Assis, T., Austin, R., Massengill, L.M., … Puchner, H. (2015). The contribution of low-energy protons to the total on-orbit SEU rate. IEEE Transactions on Nuclear Science, 62(6), pp. 2440-2451. https://doi.org/10.1109/TNS.2015.2486763

Dodds, N.A., Dodd, P., Shaneyfelt, M.R., Sexton, F.W., Martinez, M., Black, J.D., Marshall, P., Reed, R., McCurdy, M., Weller, R., Pellish, J., Rodbell, K., Gordon, M., & Gordon, M. (2015). New insights gained on mechanisms of low-energy proton-induced SEUs by minimizing energy straggle [Conference Poster]. https://doi.org/10.1109/TNS.2015.2488588

Dodds, N.A., Dodd, P., Shaneyfelt, M.R., Sexton, F.W., Martinez, M., Black, J.D., Marshall, P., Reed, R., McCurdy, M., Weller, R., Pellish, J., Rodbell, K., Gordon, M., & Gordon, M. (2015). New insights gained on mechanisms of low-energy proton-induced SEUs by minimizing energy straggle [Conference Poster]. https://doi.org/10.1109/TNS.2015.2488588

Hughart, D.R., Lohn, A., Mickel, P.R., Bielejec, E.S., Vizkelethy, G., Doyle, B.L., Wolfley, S., Dodd, P., Shaneyfelt, M.R., McLain, M., Marinella, M., & Marinella, M. (2015). Resistive Memory for Space Applications [Conference Poster]. https://www.osti.gov/biblio/1255769

Black, J.D., Dodds, N.A., Dodd, P., Shaneyfelt, M.R., Martinez, M., Teifel, J., Pearson, S., Ma, K., & Ma, K. (2015). Single Event Effects Testing Results in Sandia National Laboratories Via Programmable ASIC Platforms [Conference Poster]. https://www.osti.gov/biblio/1258175

Hughart, D.R., Pacheco, J.L., Lohn, A.J., Mickel, P.R., Bielejec, E.S., Vizkelethy, G., Doyle, B.L., Wolfley, S., Dodd, P., Shaneyfelt, M.R., McLain, M., Marinella, M., & Marinella, M. (2014). Mapping of radiation-induced resistance changes and multiple conduction channels in TaOx memristors [Conference Poster]. IEEE Transactions on Nuclear Science. https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=84919791298&origin=inward

Dodds, N.A., Schwank, J.R., Shaneyfelt, M.R., Dodd, P., Doyle, B.L., Trinczek, M., Blackmore, E.W., Rodbell, K.P., Reed, R.A., Pellish, J.A., Label, K.A., Marshall, P.W., Swanson, S.E., Vizkelethy, G., van Deusen, S.B., Sexton, F.W., Martinez, M., & Martinez, M. (2014). Outstanding conference paper award 2014 IEEE nuclear and space radiation effects conference. IEEE Transactions on Nuclear Science, 61(6), pp. 1-5. https://doi.org/10.1109/TNS.2014.2372833

Dodds, N.A., Schwank, J.R., Shaneyfelt, M.R., Dodd, P., Doyle, B.L., Trinczek, M., Blackmore, E.W., Rodbell, K.P., Reed, R.A., Pellish, J.A., Label, K.A., Marshall, P.W., Swanson, S.E., Vizkelethy, G., van Deusen, S.B., Sexton, F.W., Martinez, M., & Martinez, M. (2014). Hardness assurance for proton direct ionization-induced SEEs using a high-energy proton beam. IEEE Transactions on Nuclear Science, 61(6), pp. 1-2904. https://doi.org/10.1109/TNS.2014.2364953

Dodds, N.A., Schwank, J.R., Shaneyfelt, M.R., Dodd, P., Doyle, B.L., Trinczek, M., Blackmore, E.W., Rodbell, K.P., Reed, R.A., Pellish, J.A., Label, K.A., Marshall, P.W., Swanson, S.E., Vizkelethy, G., van Deusen, S.B., & van Deusen, S.B. (2014). Hardness assurance for proton direct ionization-induced SEEs using a high-energy proton beam [Conference Poster]. https://doi.org/10.1109/TNS.2014.2364953

Hughart, D.R., Pacheco, J.L., Lohn, A.J., Mickel, P.R., Bielejec, E.S., Vizkelethy, G., Doyle, B.L., Wolfley, S., Dodd, P., Shaneyfelt, M.R., McLain, M., Marinella, M., & Marinella, M. (2014). Mapping of Radiation-Induced Resistance Changes and Multiple Conduction Channels in TaOx Memristors [Presentation]. https://www.osti.gov/biblio/1496701

Dodds, N.A., Schwank, J.R., Shaneyfelt, M.R., Dodd, P., Doyle, B.L., Trinczek, M.C., Blackmore, E.W., Rodbell, K.P., Reed, R.A., Pellish, J.A., Label, K.A., Marshall, P.W., Swanson, S.E., Vizkelethy, G., van Deusen, S.B., & van Deusen, S.B. (2014). Hardness assurance for proton direct ionization-induced SEEs using a high-energy proton beam [Presentation]. https://doi.org/10.1109/TNS.2014.2364953

Schwank, J.R., Shaneyfelt, M.R., Dodd, P., Doyle, B.L., Swanson, S.E., van Deusen, S.B., & van Deusen, S.B. (2014). Hardness assurance for proton direct ionization-induced SEEs using a high-energy proton beam [Conference]. https://doi.org/10.1109/TNS.2014.2364953

Schwank, J.R., Shaneyfelt, M.R., & Shaneyfelt, M.R. (2014). SEGR in SiO${}_2$ –Si$_3$ N$_4$ Stacks. IEEE Transactions on Nuclear Science, 61(4), pp. 1902-1908. https://doi.org/10.1109/TNS.2014.2303493

Hughart, D.R., Marshall, M., McLain, M., Marinella, M., Lohn, A.J., Mickel, P.R., Dodd, P., Shaneyfelt, M.R., Silva, A.I., Bielejec, E.S., & Bielejec, E.S. (2013). Displacement Damage and Ionization Effects in TaOx and TiO2 Memristors [Presentation]. https://www.osti.gov/biblio/1682565

Hughart, D.R., Marshall, M., McLain, M., Marinella, M., Lohn, A.J., Mickel, P.R., Dodd, P., Shaneyfelt, M.R., Silva, A.I., Bielejec, E.S., & Bielejec, E.S. (2013). Radiation-Induced Resistance Changes in TaOx and TiO2 Memristors [Conference]. https://www.osti.gov/biblio/1114629

Lohn, A.J., McLain, M., Marinella, M., Mickel, P.R., Dodd, P., Shaneyfelt, M.R., Bielejec, E.S., Marshall, M., & Marshall, M. (2013). A Comparison of the Radiation Response of TaOx and TiO2 Memristors [Conference]. https://www.osti.gov/biblio/1106767

Lohn, A.J., McLain, M., Marinella, M., Mickel, P.R., Dodd, P., Shaneyfelt, M.R., Bielejec, E.S., Marshall, M., & Marshall, M. (2013). A Comparison of the Radiation Response of TaOx and TiO2 Memristors [Conference]. https://www.osti.gov/biblio/1115281

Schwank, J.R., Shaneyfelt, M.R., Dodd, P., & Dodd, P. (2013). Radiation hardness assurance testing of microelectronic devices and integrated circuits: Test guideline for proton and heavy ion single-event effects [Presentation]. IEEE Transactions on Nuclear Science. https://doi.org/10.1109/TNS.2013.2261317

Schwank, J.R., Shaneyfelt, M.R., Dodd, P., & Dodd, P. (2013). Radiation hardness assurance testing of microelectronic devices and integrated circuits: Radiation environments, physical mechanisms, and foundations for hardness assurance [Presentation]. IEEE Transactions on Nuclear Science. https://doi.org/10.1109/TNS.2013.2254722

Mickel, P.R., Dodd, P., Shaneyfelt, M.R., Bielejec, E.S., Marinella, M., & Marinella, M. (2013). Radiation Effects on TaOx ReRAM: A Candidate for Rad-Hard Memory [Conference]. https://www.osti.gov/biblio/1081440

Hughart, D.R., Mickel, P.R., Dodd, P., Shaneyfelt, M.R., Bielejec, E.S., Vizkelethy, G., Marinella, M., & Marinella, M. (2013). Total Ionizing Dose and Displacement Damage Effects on TaOx Memristive Memories [Conference]. https://www.osti.gov/biblio/1314470

Hughart, D.R., Marinella, M., Mickel, P.R., Dodd, P., Shaneyfelt, M.R., Bielejec, E.S., Vizkelethy, G., & Vizkelethy, G. (2013). Total Ionizing Dose and Displacement Damage Effects on TaOx Memristive Memories [Conference]. https://www.osti.gov/biblio/1063586

Dodd, P., Shaneyfelt, M.R., Bielejec, E.S., Kotula, P.G., Mickel, P.R., & Mickel, P.R. (2012). Radiation Effects in TaOx Memristors [Conference]. https://www.osti.gov/biblio/1116793

Shaneyfelt, M.R., Schwank, J.R., Dodd, P., Stevens, J., Vizkelethy, G., Swanson, S.E., & Swanson, S.E. (2012). SOI substrate removal for SEE characterization: Techniques and applications [Conference]. IEEE Transactions on Nuclear Science. https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=84865375220&origin=inward

Schwank, J.R., Shaneyfelt, M.R., Ferlet-Cavrois, V., Dodd, P., Blackmore, E.W., Pellish, J.A., Rodbell, K.P., Heidel, D.F., Marshall, P.W., LaBel, K.A., Gouker, P.M., Tam, N., Wong, R., Wen, S.-J., Reed, R.A., Dalton, S.M., Swanson, S.E., & Swanson, S.E. (2011). Hardness assurance testing for proton direct ionization effects [Conference]. Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS. https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=84860210709&origin=inward

Schwank, J.R., Shaneyfelt, M.R., Dodd, P., Swanson, S.E., & Swanson, S.E. (2011). Hardness assurance testing for proton direct ionization effects. European Space Agency, [Special Publication] ESA SP. https://doi.org/10.1109/RADECS.2011.6131454

Shaneyfelt, M.R., Schwank, J.R., Dodd, P., Stevens, J., Swanson, S.E., & Swanson, S.E. (2011). SOI Substrate Removal for SEE Characterization and Recent Results [Conference]. https://www.osti.gov/biblio/1106398

Dodd, P., Shaneyfelt, M.R., Schwank, J.R., & Schwank, J.R. (2011). Characterization of the Two-Photon Absorption Carrier Generation Region in Bulk Silicon Diodes. IEEE Transactions on Nuclear Science (Dec. 2011). https://www.osti.gov/biblio/1106707

Dodd, P., Shaneyfelt, M.R., Flores, R.S., Schwank, J.R., Hill, T.A., Swanson, S.E., & Swanson, S.E. (2011). Single-Event Upsets and Distributions in Radiation-Hardened CMOS Flip-Flop Logic Chains. IEEE Transactions on Nuclear Science, 58(6). https://doi.org/10.1109/TNS.2011.2169683

Schwank, J.R., Shaneyfelt, M.R., & Shaneyfelt, M.R. (2011). Radiation Effects in 3D Integrated SOI SRAM Circuits. IEEE Transactions on Nuclear Science, Dec. 2011. https://www.osti.gov/biblio/1106916

Schwank, J.R., Shaneyfelt, M.R., Dodd, P., & Dodd, P. (2011). Proton Irradiation Effects in Semiconductor Devices--S1328 [Presentation]. https://www.osti.gov/biblio/1661823

Schwank, J.R., Shaneyfelt, M.R., Dodd, P., Swanson, S.E., & Swanson, S.E. (2011). Comparison of Single and Two-Photon Absorption for Laser Characterization of Single-Event Upsets in SOI SRAMs. IEEE Transactions on Nuclear Science, Dec. 2011, 58(6). https://doi.org/10.1109/TNS.2011.2171006

Schwank, J.R., Shaneyfelt, M.R., & Shaneyfelt, M.R. (2011). Proton-induced Upsets in 41-nm NAND Floating Gate Cells [Conference]. https://www.osti.gov/biblio/1109275

Schwank, J.R., Shaneyfelt, M.R., & Shaneyfelt, M.R. (2011). Radiation Effects in 3D Integrated SOI SRAM Circuits [Conference]. https://www.osti.gov/biblio/1120835

Dodd, P., Schwank, J.R., Shaneyfelt, M.R., & Shaneyfelt, M.R. (2011). Characterization of the Two-Photon Absorption Carrier Generation Region in Bulk Silicon Diodes [Conference]. https://www.osti.gov/biblio/1109289

Schwank, J.R., Shaneyfelt, M.R., Dodd, P., Swanson, S.E., & Swanson, S.E. (2011). Comparison of Single and Two-Photon Absorption for Laser Characterization of Single-Event Upsets in SOI SRAMs [Conference]. https://www.osti.gov/biblio/1109305

Dodd, P., Schwank, J.R., Shaneyfelt, M.R., & Shaneyfelt, M.R. (2011). The Effect of Neutron Energy on Single Event Upsets and Multiple Bit Upsets [Conference]. https://www.osti.gov/biblio/1109332

Dodd, P., Shaneyfelt, M.R., Flores, R.S., Schwank, J.R., Hill, T.A., Swanson, S.E., & Swanson, S.E. (2011). Single-Event Upsets and Distributions in Radiation-Hardened CMOS Flip-Flop Logic Chains [Conference]. https://www.osti.gov/biblio/1109308