Publications

Rice, W.C., Levy, J.E., Adams, D.P., Nichols, D.R., Harrison, R.K., Jordan, M., Jones, A., Claus, L., Jensen, S.E., Dorsey, D.J., Koudelka, R., & Koudelka, R. (2019). Multi-Layered Solid State Neutron Sensor [Conference Poster]. https://www.osti.gov/biblio/1641435

King, M.P., Massey, G., Silva, A., Cannon, E., Shaneyfelt, M.R., Loveless, T., Ballast, J., Cabanas-Holmen, M., Digregorio, S.J., Rice, W.C., Draper, B.L., Oldgies, P., Rodbell, K., & Rodbell, K. (2018). TID-Induced Leakage and Drive Characteristics of Planar 22-nm PDSOI and 14-nm Bulk and Quasi-SOI FinFET Devices [Conference Poster]. https://www.osti.gov/biblio/1570155

Lee, D.S., King, M.P., Evans, W.L., Cannon, M., Perez-Celis, A., Anderson, J., Wirthlin, M., Rice, W.C., & Rice, W.C. (2018). Single-Event Characterization of 16 nm FinFET Xilinx UltraScale+ Devices with Heavy Ion and Neutron Irradiation [Conference Poster]. https://doi.org/10.1109/NSREC.2018.8584313

Lee, D.S., King, M.P., Evans, W.L., Cannon, M., Perez-Celis, A., Anderson, J., Wirthlin, M., Rice, W.C., & Rice, W.C. (2018). Single-Event Characterization of 16 nm FinFET Xilinx UltraScale+ Devices with Heavy Ion and Neutron Irradiation [Conference Poster]. 10.1109/NSREC.2018.8584313

Lee, D.S., King, M.P., Evans, W.L., Cannon, M., Wirthlin, M., Rice, W.C., & Rice, W.C. (2018). Single-Event Characterization of the 16 nm FinFET Xilinx Kintex UltraScale+ in Heavy Ions [Conference Poster]. https://www.osti.gov/biblio/1523344

Lee, D.S., King, M.P., Evans, W.L., Cannon, M., Perez-Celis, A., Wirthlin, M., Rice, W.C., & Rice, W.C. (2018). Heavy-Ion Irradiation of the Xilinx Kintex UltraScale+ FPGA [Presentation]. https://www.osti.gov/biblio/1508451

Lee, D.S., King, M.P., Evans, W.L., Rice, W.C., Wirthlin, M., Cannon, M., Perez-Celis, A., Anderson, J., & Anderson, J. (2018). Single-Event Characterization of 16 nm FinFET Xilinx UltraScale+ Field-Programmable Gate Array and Multi-Processor System-on-Chip Devices with Heavy Ion and Neutron Irradiation [Conference Poster]. https://www.osti.gov/biblio/1513704

King, M.P., Silva, A.I., Digregorio, S.J., Rice, W.C., Massey, J.G., Cannon, E.H., Ballast, J., Cabanas-Holmen, M., Oldgies, P., Rodbell, K., Draper, B.L., & Draper, B.L. (2018). Leakage and Drive Characteristics of Planar 22-nm Partially-Depleted Silicon-on-Insulator and 14-nm Bulk and Quasi-Silicon-on-Insulator FinFET Devices [Conference Poster]. https://www.osti.gov/biblio/1513706

King, M.P., Wu, X., Eller, M., Samavedam, S., Shaneyfelt, M.R., Silva, A.I., Draper, B.L., Rice, W.C., Meisenheimer, T.L., Zhang, E.X., Haeffner, T.D., Ball, D.R., Shetler, K.J., Alles, M.L., Kauppila, J.S., Massengill, L.W., & Massengill, L.W. (2017). Analysis of TID Process, Geometry, and Bias Condition Dependence in 14-nm FinFETs and Implications for RF and SRAM Performance [Conference Poster]. IEEE Transactions on Nuclear Science. 10.1109/TNS.2016.2634538

King, M.P., Wu, X., Eller, M., Samavedam, S., Shaneyfelt, M.R., Silva, A.I., Draper, B.L., Rice, W.C., Meisenheimer, T.L., Zhang, E.X., Haeffner, T.D., Ball, D.R., Shetler, K.J., Alles, M.L., Kauppila, J.S., Massengill, L.W., & Massengill, L.W. (2016). Analysis of TID process, geometry, and bias condition dependence in 14-nm FinFETs and implications for RF and SRAM performance. IEEE Transactions on Nuclear Science. 10.1109/tns.2016.2634538

Adams, D.P., Childs, K.D., Rodriguez, M.A., Brumbach, M.T., Gurrieri, T., Rice, W.C., & Rice, W.C. (2016). Different approaches for enhancing the thermal stability of Ge2Sb2Te5 films [Conference Poster]. https://www.osti.gov/biblio/1408293