Publications

Cannon, M.J., Lee, D.S., Evans, W.L., Troxel, I., Gruber, M., Sabogal, D., & Sabogal, D. (2023). Proton and Heavy Ion SEE Data on NVIDIA and AMD GPUs [Conference Proceeding]. https://doi.org/10.1109/REDW61050.2023.10265847

Cannon, M.J., Lee, D.S., Evans, W.L., Troxel, I., Gruber, M., Sabogal, D., & Sabogal, D. (2023). Proton and Heavy Ion SEE Data on NVIDIA and AMD GPUs [Conference Poster]. IEEE Radiation Effects Data Workshop. https://doi.org/10.2172/2430644

Lee, D.S., King, M.P., Evans, W.L., Cannon, M., Perez-Celis, A., Anderson, J., Wirthlin, M., Rice, W.C., & Rice, W.C. (2018). Single-Event Characterization of 16 nm FinFET Xilinx UltraScale+ Devices with Heavy Ion and Neutron Irradiation [Conference Poster]. https://doi.org/10.1109/NSREC.2018.8584313

Lee, D.S., King, M.P., Evans, W.L., Cannon, M., Perez-Celis, A., Anderson, J., Wirthlin, M., Rice, W.C., & Rice, W.C. (2018). Single-Event Characterization of 16 nm FinFET Xilinx UltraScale+ Devices with Heavy Ion and Neutron Irradiation [Conference Poster]. https://doi.org/10.1109/NSREC.2018.8584313

Lee, D.S., King, M.P., Evans, W.L., Cannon, M., Wirthlin, M., Rice, W.C., & Rice, W.C. (2018). Single-Event Characterization of the 16 nm FinFET Xilinx Kintex UltraScale+ in Heavy Ions [Conference Poster]. https://www.osti.gov/biblio/1523344

Lee, D.S., King, M.P., Evans, W.L., Cannon, M., Perez-Celis, A., Wirthlin, M., Rice, W.C., & Rice, W.C. (2018). Heavy-Ion Irradiation of the Xilinx Kintex UltraScale+ FPGA [Presentation]. https://www.osti.gov/biblio/1508451

Lee, D.S., King, M.P., Evans, W.L., Rice, W.C., Wirthlin, M., Cannon, M., Perez-Celis, A., Anderson, J., & Anderson, J. (2018). Single-Event Characterization of 16 nm FinFET Xilinx UltraScale+ Field-Programmable Gate Array and Multi-Processor System-on-Chip Devices with Heavy Ion and Neutron Irradiation [Conference Poster]. https://www.osti.gov/biblio/1513704