Publications

Reaz, M., Tonigan, A.M., Li, K., Smith, M.B., Rony, M.W., Gorchichko, M., O'Hara, A., Linten, D., Mitard, J., Fang, J., Zhang, E.X., Alles, M.L., Weller, R.A., Fleetwood, D.M., Reed, R.A., Pantelides, S.T., Weeden-Wright, S.L., Schrimpf, R.D., & Schrimpf, R.D. (2021). 3-D Full-Band Monte Carlo Simulation of Hot-Electron Energy Distributions in Gate-All-Around Si Nanowire MOSFETs. IEEE Transactions on Electron Devices, 68(5), pp. 2556-2563. https://doi.org/10.1109/ted.2021.3068328

Tonigan, A.M., Ball, D., Vizkelethy, G., Black, J.D., Black, D.A., Trippe, J., Bielejec, E.S., Alles, M.L., Reed, R.A., Schrimpf, R.D., & Schrimpf, R.D. (2021). Impact of Surface Recombination on Single-Event Charge Collection in an SOI Technology. IEEE Transactions on Nuclear Science, 68(3), pp. 305-311. https://doi.org/10.1109/tns.2021.3056898