Publications

Teifel, J., Flores, R.S., Pearson, S., Nowlin, R.N., & Black, J.D. (2013). Six Generations of ViArray Rad-Hard Structured ASICs [Conference]. https://www.osti.gov/biblio/1122965

Teifel, J., Flores, R.S., Jarecki, R., Bauer, T.M., & Shinde, S.L. (2013). A quick-turn 3D structured ASIC platform for cost-sensitive applications [Conference]. Proceedings - Electronic Components and Technology Conference. https://doi.org/10.1109/ECTC.2013.6575634

Teifel, J., Flores, R.S., Jarecki, R., Bauer, T.M., & Shinde, S.L. (2013). A Quick-Turn3D Structured ASIC PlatformforCost-Sensitive Applications [Conference]. https://www.osti.gov/biblio/1115696

Teifel, J., Flores, R.S., Pearson, S., Begay, C., & Palmer, J. (2012). ViArray Standard Platforms: Rad-Hard Structured ASICs for Digital and Mixed-Signal Applications [Conference]. https://www.osti.gov/biblio/1118198

Teifel, J., Flores, R.S., Pearson, S., Begay, C., Ma, K., & Palmer, J. (2011). Copy of ViArray Standard Platforms: Rad-hard structured ASICs for Digital and Mixed-signal Applications [Conference]. https://www.osti.gov/biblio/1141212

Teifel, J., Flores, R.S., Pearson, S., Begay, C., Ma, K., & Palmer, J. (2011). ViArray Standard Platforms: Rad-hard structured ASICs for Digital and Mixed-signal Applications [Conference]. https://www.osti.gov/biblio/1118540

Ma, K., Teifel, J., & Flores, R.S. (2011). Sandia rad-hard, fast turn structured ASIC : [Conference]. https://www.osti.gov/biblio/1289806

Dodd, P., Shaneyfelt, M.R., Flores, R.S., Schwank, J.R., Hill, T.A., & Swanson, S.E. (2011). Single-Event Upsets and Distributions in Radiation-Hardened CMOS Flip-Flop Logic Chains. IEEE Transactions on Nuclear Science, 58(6). https://doi.org/10.1109/TNS.2011.2169683

Ma, K., Teifel, J., & Flores, R.S. (2011). Sandia Rad-Hard Fast-Turn Structured ASIC - The ViArray [Conference]. https://www.osti.gov/biblio/1140508

Teifel, J., Flores, R.S., Pearson, S., Begay, C., & Ma, K. (2011). ViArray Standard Platforms: Rad-Hard Structured ASICs for Digital and Mixed-Signal Applications [Conference]. https://www.osti.gov/biblio/1120285

Dodd, P., Shaneyfelt, M.R., Flores, R.S., Schwank, J.R., Hill, T.A., & Swanson, S.E. (2011). Single-Event Upsets and Distributions in Radiation-Hardened CMOS Flip-Flop Logic Chains [Conference]. https://www.osti.gov/biblio/1109308

Schwank, J.R., Shaneyfelt, M.R., Dodd, P., Flores, R.S., Stevens, J., & Swanson, S.E. (2010). Direct Comparison of Charge Collection from Single-Photon and Two-Photon Laser Testing Techniques. IEEE Transactions on Nuclear Science. https://www.osti.gov/biblio/1141813

Schwank, J.R., Shaneyfelt, M.R., Dodd, P., Flores, R.S., Stevens, J., & Swanson, S.E. (2010). Direct comparison of charge collection from single-photon and two-photon laser testing techniques [Conference]. https://www.osti.gov/biblio/991855

Schwank, J.R., Shaneyfelt, M.R., Dodd, P., Flores, R.S., Stevens, J., & Swanson, S.E. (2010). Direct comparison of charge collection from single-photon and two-photon laser testing techniques [Conference]. https://www.osti.gov/biblio/991010

Schwank, J.R., Flores, R.S., Dodd, P., & Shaneyfelt, M.R. (2008). Investigation of the Propagation Induced Pulse Broadening (PIPB) Effect on Single Event Transients in SOI and Bulk Inverter Chains. IEEE Transactions on Nuclear Science. https://www.osti.gov/biblio/1143129

Schwank, J.R., Shaneyfelt, M.R., Felix, J.A., Dodd, P., Baggio, J., Ferlet-Cavrois, V., Paillet, P., Hash, G.L., Flores, R.S., Massengill, L.W., & Blackmore, E. (2006). Effects of total dose irradiation on single-event upset hardness [Conference]. IEEE Transactions on Nuclear Science. https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=33748345155&origin=inward

Flores, R.S. (2006). A Radiation-Hardened Fast-Turn Low-NRE-Cost Structured ASIC [Conference]. https://www.osti.gov/biblio/1494239

Teifel, J., Flores, R.S., & Ma, K. (2006). Asynchronous logic design for rad-hard structure ASICs [Conference]. https://www.osti.gov/biblio/915591

Flores, R.S. (2006). A radiation-hardened structured ASIC. Electronic Device Failure Analysis, 8(2), pp. 28-34. https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=33845763019&origin=inward

Teifel, J., Flores, R.S., & Ma, K. (2006). Asynchronous logic design for rad-hard structrued ASICs [Conference]. https://www.osti.gov/biblio/902571

Tangyunyong, P., Headley, T.J., Rye, M.J., Hill, T.A., Nakakura, C.Y., Soden, J., Colr, E.I., Flores, R.S., Shaneyfelt, M.R., & Dockerty, R.C. (2003). Novel application of transmission electron microscopy and scanning capacitance microscopy for defect root cause identification and yield enhancement [Conference]. https://www.osti.gov/biblio/1004355

Shaneyfelt, M.R., Tangyunyong, P., Hill, T.A., Soden, J., Flores, R.S., Schwank, J.R., Dodd, P., & Hash, G.L. (2003). Identification of radiation-induced parasitic leakage paths using light emission microscopy [Conference]. https://www.osti.gov/biblio/920796