Publications

Boynton, N., Gehl, M., Dallo, C.M., Pomerene, A., Starbuck, A.L., Hood, D., Dodd, P., Swanson, S., Trotter, D., Derose, C., Lentine, A.L., & Lentine, A.L. (2020). Gamma radiation effects on passive silicon photonic waveguides using phase sensitive methods. Optics Express, 28(23), pp. 35192-35201. https://doi.org/10.1364/oe.401299

Black, J.D., Black, D.A., Domme, N.A., Dodd, P., Griffin, P.J., Nowlin, R.N., Trippe, J., Salas, J.G., Reed, R.A., Weller, R.A., Tonigan, A.M., Schrimpf, R.D., & Schrimpf, R.D. (2020). DFF Layout Variations in CMOS SOI -Analysis of Hardening by Design Options. IEEE Transactions on Nuclear Science, 67(6), pp. 1125-1132. 10.1109/TNS.2020.2973569

Black, J.D., Black, D.A., Domme, N.A., Dodd, P., Griffin, P.J., Nowlin, R.N., Trippe, J., Salas, J.G., Reed, R., Weller, R., Tonigan, D., Schrimpf, R., & Schrimpf, R. (2019). DFF Layout Variations in CMOS SOI ? Analysis of Hardening by Design Options [Conference Poster]. 10.1109/TNS.2020.2973569

Boynton, N., Gehl, M., Dallo, C.M., Pomerene, A., Starbuck, A.L., Hood, D., Dodd, P., Swanson, S.E., Trotter, D.C., Lentine, A.L., Derose, C., & Derose, C. (2019). Propagation Loss in Crystalline Silicon Photonic Waveguides Due to Gamma Radiation [Conference Poster]. https://www.osti.gov/biblio/1639552

Black, J.D., Dame, J.A., Black, D.A., Dodd, P., Shaneyfelt, M.R., Teifel, J., Salas, J.G., Steinbach, R., Davis, M., Reed, R.A., Weller, R.A., Trippe, J., Warren, K.M., Tonigan, A.M., Schrimpf, R.D., Marquez, R.S., & Marquez, R.S. (2019). Using MRED to Screen Multiple-Node Charge-Collection Mitigated SOI Layouts [Conference Poster]. IEEE Transactions on Nuclear Science. 10.1109/TNS.2018.2882944

Black, J.D., Dame, J.A., Black, D.A., Dodd, P., Shaneyfelt, M.R., Teifel, J., Salas, J.G., Steinbach, R., Davis, M., Reed, R.A., Weller, R.A., Trippe, J., Warren, K.M., Tonigan, A.M., Schrimpf, R.D., Marquez, R.S., & Marquez, R.S. (2019). Using MRED to Screen Multiple-Node Charge-Collection Mitigated SOI Layouts [Conference Poster]. IEEE Transactions on Nuclear Science. https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=85057364495&origin=inward

Boynton, N., Gehl, M., Dallo, C.M., Pomerene, A., Starbuck, A.L., Hood, D., Dodd, P., Swanson, S.E., Trotter, D.C., Lentine, A.L., Derose, C., & Derose, C. (2018). Prpagation Loss in Crystalline Silicon Photonic Waveguides Due to Gamma Radiation [Conference Poster]. https://www.osti.gov/biblio/1592286

Hoffman, G., Gehl, M., Martinez, N.J., Trotter, D.C., Starbuck, A.L., Pomerene, A., Dallo, C.M., Hood, D., Dodd, P., Swanson, S.E., Long, C.J., Derose, C., Lentine, A.L., & Lentine, A.L. (2018). Active Silicon Photonic Device Performance after 60Co Gamma Radiation [Conference Poster]. https://www.osti.gov/biblio/1592287

McLain, M., McDonald, J.K., Hartman, F., Sheridan, T.J., Dodd, P., Shaneyfelt, M.R., Hembree, C., Black, D.A., Weingartner, T.A., & Weingartner, T.A. (2017). Understanding the Implications of a LINAC’s Microstructure on Devices and Photocurrent Models. IEEE Transactions on Nuclear Science, 65(1). 10.1109/TNS.2017.2764799

McLain, M., McDonald, J.K., Hembree, C., Sheridan, T.J., Weingartner, T.A., Dodd, P., Shaneyfelt, M.R., Hartman, F., Black, D.A., & Black, D.A. (2017). Understanding the Implications of a LINAC?s Microstructure on Photocurrent Modeling [Conference Poster]. https://www.osti.gov/biblio/1509653

Dondero, R., Draper, B.L., Dodd, P., & Dodd, P. (2016). Securing Radiation-Hardened Microelectronics for the Future [Conference Poster]. https://www.osti.gov/biblio/1344704

Dodds, N.A., Martinez, M., Dodd, P., Shaneyfelt, M.R., Sexton, F.W., Black, J.D., Lee, D.S., Swanson, S.E., Bhuva, B.L., Warren, K.M., Reed, R.A., Trippe, J., Sierawski, B.D., Weller, R.A., Mahatme, N., Gaspard, N.J., Assis, T., Austin, R., Massengill, L.W., … Puchner, H. (2015). The Contribution of Low-Energy Protons to the Total On-Orbit SEU Rate [Conference Poster]. IEEE Transactions on Nuclear Science. https://doi.org/10.1109/TNS.2015.2486763

Dodds, N.A., Martinez, M., Dodd, P., Shaneyfelt, M.R., Sexton, F.W., Black, J.D., Lee, D.S., Swanson, S.E., Bhuva, B.L., Warren, K.M., Reed, R.A., Trippe, J., Sierawski, B.D., Weller, R.A., Mahatme, N., Gaspard, N.J., Assis, T., Austin, R., Massengill, L.W., … Puchner, H. (2015). The Contribution of Low-Energy Protons to the Total On-Orbit SEU Rate [Conference Poster]. IEEE Transactions on Nuclear Science. 10.1109/TNS.2015.2486763

Dodds, N.A., Martinez, M., Dodd, P., Shaneyfelt, M.R., Sexton, F.W., Black, J.D., Lee, D.S., Swanson, S.E., Bhuva, B.L., Warren, K.M., Reed, R.A., Trippe, J., Sierawski, B.D., Weller, R.A., Mahatme, N., Gaspard, N.J., Assis, T.R., Austin, R., Weeden-Wright, S.L., … Puchner, H. (2015). Outstanding Conference Paper Award: 2015 IEEE Nuclear and Space Radiation Effects Conference. IEEE Transactions on Nuclear Science, 62(6). 10.1109/TNS.2015.2502501

Dodds, N.A., Dodd, P., Shaneyfelt, M.R., Sexton, F.W., Martinez, M., Black, J.D., Marshall, P.W., Reed, R.A., McCurdy, M.W., Weller, R.A., Pellish, J.A., Rodbell, K.P., Gordon, M.S., & Gordon, M.S. (2015). New insights gained on mechanisms of low-energy proton-induced SEUs by minimizing energy straggle. IEEE Transactions on Nuclear Science, 62(6). 10.1109/TNS.2015.2488588

Dodds, N.A., Martinez, M., Dodd, P., Shaneyfelt, M.R., Sexton, F.W., Black, J.D., Lee, D.S., Swanson, S.E., Bhuva, B.L., Warren, K.M., Reed, R.A., Trippe, J., Sierawski, B.D., Weller, R.A., Mahatme, N., Gaspard, N., Assis, T., Austin, R., Massengill, L.M., … Puchner, H. (2015). The contribution of low-energy protons to the total on-orbit SEU rate. IEEE Transactions on Nuclear Science, 62(6). 10.1109/TNS.2015.2486763

Dondero, R., Draper, B.L., Dodd, P., & Dodd, P. (2015). Securing Trusted Rad-Hard Electronics for the Future [Conference Poster]. https://www.osti.gov/biblio/1334574

Dodds, N.A., Dodd, P., Shaneyfelt, M.R., Sexton, F.W., Martinez, M., Black, J.D., Marshall, P., Reed, R., McCurdy, M., Weller, R., Pellish, J., Rodbell, K., Gordon, M., & Gordon, M. (2015). New insights gained on mechanisms of low-energy proton-induced SEUs by minimizing energy straggle [Conference Poster]. https://doi.org/10.1109/TNS.2015.2488588

Dodds, N.A., Dodd, P., Shaneyfelt, M.R., Sexton, F.W., Martinez, M., Black, J.D., Marshall, P., Reed, R., McCurdy, M., Weller, R., Pellish, J., Rodbell, K., Gordon, M., & Gordon, M. (2015). New insights gained on mechanisms of low-energy proton-induced SEUs by minimizing energy straggle [Conference Poster]. 10.1109/TNS.2015.2488588

Black, J.D., Dodds, N.A., Dodd, P., Shaneyfelt, M.R., Martinez, M., Teifel, J., Pearson, S., Ma, K., & Ma, K. (2015). Single Event Effects Testing Results in Sandia National Laboratories Via Programmable ASIC Platforms [Conference Poster]. https://www.osti.gov/biblio/1258175

Hughart, D.R., Lohn, A., Mickel, P.R., Bielejec, E.S., Vizkelethy, G., Doyle, B.L., Wolfley, S., Dodd, P., Shaneyfelt, M.R., McLain, M., Marinella, M., & Marinella, M. (2015). Resistive Memory for Space Applications [Conference Poster]. https://www.osti.gov/biblio/1255769

Hughart, D.R., Pacheco, J.L., Lohn, A.J., Mickel, P.R., Bielejec, E.S., Vizkelethy, G., Doyle, B.L., Wolfley, S., Dodd, P., Shaneyfelt, M.R., McLain, M., Marinella, M., & Marinella, M. (2014). Mapping of radiation-induced resistance changes and multiple conduction channels in TaOx memristors [Presentation]. IEEE Transactions on Nuclear Science. https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=84919791298&origin=inward

Hughart, D.R., Pacheco, J.L., Lohn, A.J., Mickel, P.R., Bielejec, E.S., Vizkelethy, G., Doyle, B.L., Wolfley, S., Dodd, P., Shaneyfelt, M.R., McLain, M., Marinella, M., & Marinella, M. (2014). Mapping of radiation-induced resistance changes and multiple conduction channels in TaOx memristors [Conference Poster]. IEEE Transactions on Nuclear Science. https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=84919791298&origin=inward

Dodds, N.A., Schwank, J.R., Shaneyfelt, M.R., Dodd, P., Doyle, B.L., Trinczek, M., Blackmore, E.W., Rodbell, K.P., Reed, R.A., Pellish, J.A., Label, K.A., Marshall, P.W., Swanson, S.E., Vizkelethy, G., van Deusen, S.B., Sexton, F.W., Martinez, M., & Martinez, M. (2014). Outstanding conference paper award 2014 IEEE nuclear and space radiation effects conference. IEEE Transactions on Nuclear Science, 61(6). 10.1109/TNS.2014.2372833

Dodds, N.A., Schwank, J.R., Shaneyfelt, M.R., Dodd, P., Doyle, B.L., Trinczek, M., Blackmore, E.W., Rodbell, K.P., Reed, R.A., Pellish, J.A., Label, K.A., Marshall, P.W., Swanson, S.E., Vizkelethy, G., van Deusen, S.B., Sexton, F.W., Martinez, M., & Martinez, M. (2014). Hardness assurance for proton direct ionization-induced SEEs using a high-energy proton beam. IEEE Transactions on Nuclear Science, 61(6). 10.1109/TNS.2014.2364953

Dodds, N.A., Schwank, J.R., Shaneyfelt, M.R., Dodd, P., Doyle, B.L., Trinczek, M.C., Blackmore, E.W., Rodbell, K.P., Reed, R.A., Pellish, J.A., Label, K.A., Marshall, P.W., Swanson, S.E., Vizkelethy, G., van Deusen, S.B., & van Deusen, S.B. (2014). Hardness assurance for proton direct ionization-induced SEEs using a high-energy proton beam [Presentation]. 10.1109/TNS.2014.2364953

Dodds, N.A., Schwank, J.R., Shaneyfelt, M.R., Dodd, P., Doyle, B.L., Trinczek, M., Blackmore, E.W., Rodbell, K.P., Reed, R.A., Pellish, J.A., Label, K.A., Marshall, P.W., Swanson, S.E., Vizkelethy, G., van Deusen, S.B., & van Deusen, S.B. (2014). Hardness assurance for proton direct ionization-induced SEEs using a high-energy proton beam [Conference Poster]. https://doi.org/10.1109/TNS.2014.2364953

Schwank, J.R., Shaneyfelt, M.R., Dodd, P., Doyle, B.L., Swanson, S.E., van Deusen, S.B., & van Deusen, S.B. (2014). Hardness assurance for proton direct ionization-induced SEEs using a high-energy proton beam [Conference]. https://doi.org/10.1109/TNS.2014.2364953

Hughart, D.R., Marshall, M., McLain, M., Marinella, M., Lohn, A.J., Mickel, P.R., Dodd, P., Shaneyfelt, M.R., Silva, A.I., Bielejec, E.S., & Bielejec, E.S. (2013). Displacement Damage and Ionization Effects in TaOx and TiO2 Memristors [Presentation]. https://www.osti.gov/biblio/1682565

Hughart, D.R., Lohn, A.J., Mickel, P.R., Dodd, P., Shaneyfelt, M.R., Bielejec, E.S., Vizkelethy, G., McLain, M., Marinella, M., & Marinella, M. (2013). Radiation-Induced Resistance Changes in TaOx and TiO2 Memristors [Presentation]. https://www.osti.gov/biblio/1114629

Lohn, A.J., McLain, M., Marinella, M., Mickel, P.R., Dodd, P., Shaneyfelt, M.R., Bielejec, E.S., Marshall, M., & Marshall, M. (2013). A Comparison of the Radiation Response of TaOx and TiO2 Memristors [Conference]. https://www.osti.gov/biblio/1115281

Lohn, A.J., McLain, M., Marinella, M., Mickel, P.R., Dodd, P., Shaneyfelt, M.R., Bielejec, E.S., Marshall, M., & Marshall, M. (2013). A Comparison of the Radiation Response of TaOx and TiO2 Memristors [Conference]. https://www.osti.gov/biblio/1106767

Schwank, J.R., Shaneyfelt, M.R., Dodd, P., & Dodd, P. (2013). Radiation hardness assurance testing of microelectronic devices and integrated circuits: Test guideline for proton and heavy ion single-event effects [Presentation]. IEEE Transactions on Nuclear Science. 10.1109/TNS.2013.2261317

Schwank, J.R., Shaneyfelt, M.R., Dodd, P., & Dodd, P. (2013). Radiation hardness assurance testing of microelectronic devices and integrated circuits: Radiation environments, physical mechanisms, and foundations for hardness assurance [Presentation]. IEEE Transactions on Nuclear Science. 10.1109/TNS.2013.2254722

Mickel, P.R., Dodd, P., Shaneyfelt, M.R., Bielejec, E.S., Vizkelethy, G., Marinella, M., & Marinella, M. (2013). Radiation Effects on TaOx ReRAM: A Candidate for Rad-Hard Memory [Conference]. https://www.osti.gov/biblio/1081440

Hughart, D.R., Mickel, P.R., Dodd, P., Shaneyfelt, M.R., Bielejec, E.S., Vizkelethy, G., Marinella, M., & Marinella, M. (2013). Total Ionizing Dose and Displacement Damage Effects on TaOx Memristive Memories [Conference]. https://www.osti.gov/biblio/1314470

Hughart, D.R., Marinella, M., Mickel, P.R., Dodd, P., Shaneyfelt, M.R., Bielejec, E.S., Vizkelethy, G., & Vizkelethy, G. (2013). Total Ionizing Dose and Displacement Damage Effects on TaOx Memristive Memories [Conference]. https://www.osti.gov/biblio/1063586

Dodd, P., Shaneyfelt, M.R., Bielejec, E.S., Vizkelethy, G., Kotula, P.G., Mickel, P.R., & Mickel, P.R. (2012). Radiation Effects in TaOx Memristors [Conference]. https://www.osti.gov/biblio/1116793

Shaneyfelt, M.R., Schwank, J.R., Dodd, P., Stevens, J., Vizkelethy, G., Swanson, S.E., & Swanson, S.E. (2012). SOI substrate removal for SEE characterization: Techniques and applications [Conference]. IEEE Transactions on Nuclear Science. https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=84865375220&origin=inward

Schwank, J.R., Shaneyfelt, M.R., Ferlet-Cavrois, V., Dodd, P., Blackmore, E.W., Pellish, J.A., Rodbell, K.P., Heidel, D.F., Marshall, P.W., LaBel, K.A., Gouker, P.M., Tam, N., Wong, R., Wen, S.-J., Reed, R.A., Dalton, S.M., Swanson, S.E., & Swanson, S.E. (2011). Hardness assurance testing for proton direct ionization effects [Conference]. Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS. https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=84860210709&origin=inward

Shaneyfelt, M.R., Schwank, J.R., Dodd, P., Stevens, J., Swanson, S.E., & Swanson, S.E. (2011). SOI Substrate Removal for SEE Characterization and Recent Results [Presentation]. https://www.osti.gov/biblio/1106398

Schwank, J.R., Shaneyfelt, M.R., Dodd, P., Swanson, S.E., & Swanson, S.E. (2011). Hardness assurance testing for proton direct ionization effects. European Space Agency, [Special Publication] ESA SP. https://doi.org/10.1109/RADECS.2011.6131454

Dodd, P., Shaneyfelt, M.R., Flores, R.S., Schwank, J.R., Hill, T.A., Swanson, S.E., & Swanson, S.E. (2011). Single-Event Upsets and Distributions in Radiation-Hardened CMOS Flip-Flop Logic Chains. IEEE Transactions on Nuclear Science, 58(6). https://doi.org/10.1109/TNS.2011.2169683

Dodd, P., Shaneyfelt, M.R., Schwank, J.R., & Schwank, J.R. (2011). Characterization of the Two-Photon Absorption Carrier Generation Region in Bulk Silicon Diodes. IEEE Transactions on Nuclear Science (Dec. 2011). https://www.osti.gov/biblio/1106707

Schwank, J.R., Shaneyfelt, M.R., Dodd, P., & Dodd, P. (2011). Proton Irradiation Effects in Semiconductor Devices--S1328 [Presentation]. https://www.osti.gov/biblio/1661823

Schwank, J.R., Shaneyfelt, M.R., Dodd, P., Swanson, S.E., & Swanson, S.E. (2011). Comparison of Single and Two-Photon Absorption for Laser Characterization of Single-Event Upsets in SOI SRAMs. IEEE Transactions on Nuclear Science, Dec. 2011, 58(6). https://doi.org/10.1109/TNS.2011.2171006

Dodd, P., Schwank, J.R., Shaneyfelt, M.R., & Shaneyfelt, M.R. (2011). Characterization of the Two-Photon Absorption Carrier Generation Region in Bulk Silicon Diodes [Conference]. https://www.osti.gov/biblio/1109289

Dodd, P., Schwank, J.R., Shaneyfelt, M.R., & Shaneyfelt, M.R. (2011). The Effect of Neutron Energy on Single Event Upsets and Multiple Bit Upsets [Conference]. https://www.osti.gov/biblio/1109332

Schwank, J.R., Shaneyfelt, M.R., Dodd, P., Swanson, S.E., & Swanson, S.E. (2011). Comparison of Single and Two-Photon Absorption for Laser Characterization of Single-Event Upsets in SOI SRAMs [Conference]. https://www.osti.gov/biblio/1109305

Dodd, P., Shaneyfelt, M.R., Flores, R.S., Schwank, J.R., Hill, T.A., Swanson, S.E., & Swanson, S.E. (2011). Single-Event Upsets and Distributions in Radiation-Hardened CMOS Flip-Flop Logic Chains [Conference]. https://www.osti.gov/biblio/1109308

Phillips, S.D., Moen, K.A., Najafizadeh, L., Diestelhorst, R.M., Sutton, A.K., Cressler, J.D., Vizkelethy, G., Dodd, P., Marshall, P.W., & Marshall, P.W. (2010). A comprehensive understanding of the efficacy of N-ring SEE hardening methodologies in SiGe HBTs [Conference]. IEEE Transactions on Nuclear Science. https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=78650353594&origin=inward

Thrivikraman, T.K., Wilcox, E., Phillips, S.D., Cressler, J.D., Marshall, C., Vizkelethy, G., Dodd, P., Marshall, P., & Marshall, P. (2010). Design of digital circuits using inverse-mode cascode SiGe HBTs for single event upset mitigation [Conference]. IEEE Transactions on Nuclear Science. https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=78650326984&origin=inward

Dodd, P., Shaneyfelt, M.R., Schwank, J.R., & Schwank, J.R. (2010). Challenges in radiation effects on CMOS and power electronics [Conference]. https://www.osti.gov/biblio/1027007

Schwank, J.R., Shaneyfelt, M.R., Dodd, P., Flores, R.S., Stevens, J., Swanson, S.E., & Swanson, S.E. (2010). Direct Comparison of Charge Collection from Single-Photon and Two-Photon Laser Testing Techniques. IEEE Transactions on Nuclear Science. https://www.osti.gov/biblio/1141813

Witcher, J., Savignon, D.J., Dodd, P., Shaneyfelt, M.R., Young, R.W., Draper, B.L., Schwank, J.R., & Schwank, J.R. (2010). Radiation-hardened distributed power systems [Conference]. https://www.osti.gov/biblio/1028959

Schwank, J.R., Shaneyfelt, M.R., Dodd, P., Flores, R.S., Stevens, J., Swanson, S.E., & Swanson, S.E. (2010). Direct comparison of charge collection from single-photon and two-photon laser testing techniques [Conference]. https://www.osti.gov/biblio/991010

Schwank, J.R., Shaneyfelt, M.R., Dodd, P., Flores, R.S., Stevens, J., Swanson, S.E., & Swanson, S.E. (2010). Direct comparison of charge collection from single-photon and two-photon laser testing techniques [Conference]. https://www.osti.gov/biblio/991855

Shaneyfelt, M.R., Schwank, J.R., Dodd, P., Hill, T.A., Swanson, S.E., & Swanson, S.E. (2009). Effects of moisture on radiation-induced degradation in CMOS SOI transistors [Conference]. Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS. https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=80052698336&origin=inward

Schwank, J.R., Shaneyfelt, M.R., Dodd, P., Felix, J.A., Baggio, J., Ferlet-Cavrois, V., Paillet, P., Label, K.A., Pease, R.L., Simons, M., Cohn, L.M., & Cohn, L.M. (2009). Hardness assurance test guideline for qualifying devices for use in proton environments [Conference]. IEEE Transactions on Nuclear Science. https://doi.org/10.1109/TNS.2009.2013239

Schwank, J.R., Dodd, P., Shaneyfelt, M.R., & Shaneyfelt, M.R. (2008). A New Technique for SET Pulse Width Measurement in Chains of Inverters Using Pulsed Laser Irradiation. IEEE Transactions on Nuclear Science (RADECS 09 issue). https://www.osti.gov/biblio/1142375

Schwank, J.R., Shaneyfelt, M.R., Dodd, P., Felix, J.A., & Felix, J.A. (2008). Hardness Assurance Test Guideline for Qualifying Devices for Use in Proton Environments. IEEE Transactions on Nuclear Science (RADECS 09 issue). https://www.osti.gov/biblio/1142348

Herrera, G.V., McCormick, F.B., Nielson, G.N., Nordquist, C.D., Okandan, M., Olsson, R.H., Ortiz, K., Platzbecker, M., Resnick, P., Shul, R.J., Bauer, T.M., Sullivan, C.T., Watts, M.R., Blain, M., Dodd, P., Dondero, R., Garcia, E.J., Galambos, P.C., Hetherington, D.L., Hudgens, J.J., & Hudgens, J.J. (2008). SOI-Enabled MEMS Processes Lead to Novel Mechanical Optical and Atomic Physics Devices Presentation [Conference]. https://www.osti.gov/biblio/1272546

Shaneyfelt, M.R., Schwank, J.R., Dodd, P., Felix, J.A., & Felix, J.A. (2008). Total ionizing dose and single event effects hardness assurance qualification issues for microelectronics. IEEE Transactions on Nuclear Science, 55(4), pp. 1926-1946. https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=53349153342&origin=inward

Schwank, J.R., Flores, R.S., Dodd, P., Shaneyfelt, M.R., & Shaneyfelt, M.R. (2008). Investigation of the Propagation Induced Pulse Broadening (PIPB) Effect on Single Event Transients in SOI and Bulk Inverter Chains. IEEE Transactions on Nuclear Science. https://www.osti.gov/biblio/1143129

Herrera, G.V., McCormick, F.B., Nielson, G.N., Nordquist, C.D., Okandan, M., Olsson, R.H., Ortiz, K., Platzbecker, M., Resnick, P., Shul, R.J., Bauer, T.M., Sullivan, C.T., Watts, M.R., Blain, M., Dodd, P., Dondero, R., Garcia, E.J., Galambos, P.C., Hetherington, D.L., Hudgens, J.J., & Hudgens, J.J. (2008). SOI-Enabled MEMS Processes Lead to Novel Mechanical Optical and Atomic Physics Devices [Conference]. https://www.osti.gov/biblio/1142550

Dodd, P. (2008). Characterizing SRAM Single Event Upset in Terms of Single and Multiple Node Charge Collection. IEEE Transactions on Nuclear Science. https://www.osti.gov/biblio/1143230

Shaneyfelt, M.R., Felix, J.A., Dodd, P., Schwank, J.R., & Schwank, J.R. (2008). Enhanced Proton and Neutron Induced Degradation and Its Impact on Hardness Assurance Testing. IEEE Transactions on Nuclear Science, 55(6). https://doi.org/10.1109/TNS.2008.2007124

Schwank, J.R., Shaneyfelt, M.R., Felix, J.A., Dodd, P., Swanson, S.E., Thornberg, S.M., Hochrein, J.M., & Hochrein, J.M. (2008). Effects of Moisture and Hydrogen Exposure on Radiation-Induced MOS Device Degradation and Its Implications for Long-Term Aging. IEEE Transactions on Nuclear Science, 55(6). https://doi.org/10.1109/TNS.2008.2005676

Schwank, J.R., Shaneyfelt, M.R., Dodd, P., & Dodd, P. (2008). Proton and Alpha Particle SEU Test Results on a 65nm SRAM Fabricated in IBM's SOI Process [Conference]. https://www.osti.gov/biblio/1145641

Schwank, J.R., Shaneyfelt, M.R., Dodd, P., Felix, J.A., & Felix, J.A. (2008). Hardness Assurance Test Guideline for Qualifying Devices for Use in Proton Environments [Conference]. https://doi.org/10.1109/TNS.2009.2013239

Schwank, J.R., Shaneyfelt, M.R., Felix, J.A., Dodd, P., & Dodd, P. (2008). Effects of moisture exposure on radiation-induced MOS device degradation and its implications for long-term aging [Conference]. https://www.osti.gov/biblio/942197

Shaneyfelt, M.R., Felix, J.A., Schwank, J.R., Dodd, P., & Dodd, P. (2008). Enhanced Proton and Neutron Induced Degradation and Its Impact on Hardness Assurance Testing [Conference]. https://www.osti.gov/biblio/1146194

Dodd, P. (2008). Characterizing SRAM Single Event Upset in Terms of Single and Double Node Charge Collection [Conference]. https://www.osti.gov/biblio/1146377

Dodd, P., Schwank, J.R., Shaneyfelt, M.R., Felix, J.A., & Felix, J.A. (2007). Impact of Heavy Ion Energy and Nuclear Interactions on Single-Event Upset and Latchup in Integrated Circuits. IEEE Transactions on Nuclear Science, Dec. 2007. https://doi.org/10.1109/TNS.2007.909844

Dodd, P. (2007). Impact of Ion Energy and Species on Single Event Effects Analysis. IEEE Transactions on Nuclear Science, Dec. 2007. https://www.osti.gov/biblio/1147463

Felix, J.A., Shaneyfelt, M.R., Schwank, J.R., Dodd, P., Witcher, J., & Witcher, J. (2007). Power MOSFET Degradation in Space Radiation Environments. IEEE Transactions on Nuclear Science, Dec. 2007. https://www.osti.gov/biblio/1147237

Dodd, P. (2007). Monte-Carlo Based On-Orbit Single Event Upset Rate Prediction for a Radiation Hardened by Design Latch. IEEE Transactions on Nuclear Science, Dec. 2007. https://www.osti.gov/biblio/1147193

Felix, J.A., Shaneyfelt, M.R., Schwank, J.R., Dodd, P., Witcher, J., & Witcher, J. (2007). Degradation of Power MOSFET Devices in Space Radiation Environments [Presentation]. https://www.osti.gov/biblio/1722833

Felix, J.A., Shaneyfelt, M.R., Schwank, J.R., Dodd, P., Witcher, J., & Witcher, J. (2007). Power MOSFET Degradation in Space Radiation Environments [Conference]. https://www.osti.gov/biblio/1137318

Felix, J.A., Schwank, J.R., Shaneyfelt, M.R., Dodd, P., & Dodd, P. (2007). Test Procedures for Proton-Induced Single Event Effects in Space Environments [Conference]. https://www.osti.gov/biblio/1148445

Dodd, P., Schwank, J.R., Shaneyfelt, M.R., Felix, J.A., & Felix, J.A. (2007). Impact of Heavy Ion Energy and Nuclear Interactions on Single-Event Upset and Latchup in Integrated Circuits [Conference]. https://www.osti.gov/biblio/1137277

Schroeder, J.L., Dodd, P., Schwank, J.R., Shaneyfelt, M.R., Felix, J.A., & Felix, J.A. (2007). Tungsten-Filled Silicone Composites for Moderating Proton Radiation Effects in Electronics. IEEE Trans. Nucl. Sci.. https://www.osti.gov/biblio/1148416

Schwank, J.R., Shaneyfelt, M.R., Dodd, P., Felix, J.A., & Felix, J.A. (2006). Hardness Assurance Issues for Proton Testing for Space Environments [Conference]. https://www.osti.gov/biblio/1142196

Schwank, J.R., Shaneyfelt, M.R., Felix, J.A., Dodd, P., Baggio, J., Ferlet-Cavrois, V., Paillet, P., Hash, G.L., Flores, R.S., Massengill, L.W., Blackmore, E., & Blackmore, E. (2006). Effects of total dose irradiation on single-event upset hardness [Conference]. IEEE Transactions on Nuclear Science. https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=33748345155&origin=inward

Shaneyfelt, M.R., Maher, M.C., Camilletti, R.C., Schwank, J.R., Pease, R.L., Russell, B.A., Dodd, P., & Dodd, P. (2006). Elimination of enhanced low-dose-rate sensitivity in linear bipolar devices using silicon-carbide passivation [Conference]. IEEE Transactions on Nuclear Science. https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=33748347314&origin=inward

Shaneyfelt, M.R., Schwank, J.R., Dodd, P., Felix, J.A., & Felix, J.A. (2006). Single-Event Effects Testing for Proton Environments [Presentation]. https://www.osti.gov/biblio/1729800

Felix, J.A., Dodd, P., Shaneyfelt, M.R., Schwank, J.R., & Schwank, J.R. (2006). Radiation response and variability of advanced commercial foundry technologies [Conference]. https://www.osti.gov/biblio/901404

Shaneyfelt, M.R., Schwank, J.R., Dodd, P., Felix, J.A., & Felix, J.A. (2006). Implications of characterization temperature on hardness assurance qualification [Conference]. https://www.osti.gov/biblio/900403

Ma, K., Dodd, P., & Dodd, P. (2006). Sandia national Laboratories microelectronics program [Conference]. https://www.osti.gov/biblio/902603

Schwank, J.R., Shaneyfelt, M.R., Felix, J.A., Dodd, P., & Dodd, P. (2006). Effects of angle of incidence on proton-induced single-event latchup [Conference]. https://www.osti.gov/biblio/1264222

Schwank, J.R., Shaneyfelt, M.R., Baggio, J., Dodd, P., Felix, J.A., Ferlet-Cavrois, V., Paillet, P., Lambert, D., Sexton, F.W., Hash, G.L., Blackmore, E., & Blackmore, E. (2005). Effects of particle energy on proton-induced single-event latchup. IEEE Transactions on Nuclear Science, 52(6), pp. 2622-2629. https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=33144473064&origin=inward

Dodd, P. (2005). Mechanisms and mitigation of single-event effects [Presentation]. Advances in the Astronautical Sciences. https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=26944488290&origin=inward

Felix, J.A., Shaneyfelt, M.R., Dodd, P., Draper, B.L., Schwank, J.R., Dalton, S.M., & Dalton, S.M. (2005). Radiation-induced off-state leakage current in commercial power MOSFETs. Proposed for publication in the IEEE Transactions on Nuclear Science.. https://www.osti.gov/biblio/970711

Schwank, J.R., Shaneyfelt, M.R., Dodd, P., Felix, J.A., Hash, G.L., & Hash, G.L. (2005). Effects of particle energy on proton and neutron-induced single-event latchup [Conference]. https://www.osti.gov/biblio/988973

Felix, J.A., Shaneyfelt, M.R., Dodd, P., Draper, B.L., Schwank, J.R., & Schwank, J.R. (2005). Radiation-induced off-state leakage current in commercial power MOSFETs [Conference]. https://www.osti.gov/biblio/988971

Ma, K., Sexton, F.W., Dodd, P., & Dodd, P. (2005). Sandia National Laboratories Microelectronics Program [Conference]. https://www.osti.gov/biblio/943853

Doyle, B.L., Dodd, P., Shaneyfelt, M.R., Schwank, J.R., & Schwank, J.R. (2004). Radiation effects microscopy for failure analysis of microelectronic devices [Conference]. https://www.osti.gov/biblio/964592

Vizkelethy, G., Dodd, P., & Dodd, P. (2003). Heavy-ion broad-beam and microprobe studies of single-event upsets in 0.20 um SiGe heterojunction bipolar transistors and circuits. Proposed for publication in the IEEE Transactions on Nuclear Science., 50(6). https://www.osti.gov/biblio/1005428

Vizkelethy, G., Dodd, P., & Dodd, P. (2003). 3D simulation of heavy-ion induced charge collection in SiGe HBTs. Proposed for publication in IEEE Transactions on Nuclear Science., 50(6). https://www.osti.gov/biblio/1005070

Felix, J.A., Shaneyfelt, M.R., Meisenheimer, T.L., Schwank, J.R., Dodd, P., & Dodd, P. (2003). Radiation-induced charge trapping in thin Al2O3/SiOxNy/Si(100) gate dielectric stacks. Proposed for publication in IEEE Transactions on Nuclear Science., 50(6). https://www.osti.gov/biblio/1003986

Shaneyfelt, M.R., Schwank, J.R., Dodd, P., Riewe, L.C., & Riewe, L.C. (2003). Passivation layers for reduced total dose effects and ELDRS in linear bipolar devices. Proposed for publication in IEEE Transactions on Nuclear Science., 50(6). https://www.osti.gov/biblio/1003932

Shaneyfelt, M.R., Meisenheimer, T.L., Schwank, J.R., Dodd, P., & Dodd, P. (2003). Radiation-induced charge trapping in thin Al[2]O[3]/SiO[x]N[y]/Si(100) gate dielectric stacks [Conference]. https://www.osti.gov/biblio/923862

Shaneyfelt, M.R., Tangyunyong, P., Hill, T.A., Soden, J., Flores, R.S., Schwank, J.R., Dodd, P., Hash, G.L., & Hash, G.L. (2003). Identification of radiation-induced parasitic leakage paths using light emission microscopy [Conference]. https://www.osti.gov/biblio/920796

Shaneyfelt, M.R., Schwank, J.R., Dodd, P., Riewe, L.C., & Riewe, L.C. (2003). Developing passivation layers for reducing enhanced low-dose-rate sensitivity in linear bipolar devices [Conference]. https://www.osti.gov/biblio/915201

Dodd, P., Shaneyfelt, M.R., Schwank, J.R., Hash, G.L., & Hash, G.L. (2003). Neutron-induced lathup in SRAMs at ground level [Conference]. https://www.osti.gov/biblio/917123

Shaneyfelt, M.R., Dodd, P., & Dodd, P. (2003). Improved capabilities for proton and neutron irradiations at TRIUMF [Conference]. IEEE Radiation Effects Data Workshop. https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=84952760034&origin=inward

Dodd, P., Vizkelethy, G., Walsh, D.S., Buller, D.L., Doyle, B.L., & Doyle, B.L. (2002). Radiation-Induced Prompt Photocurrents in Microelectronics: Physics. 10.2172/808617

Schwank, J.R., Shaneyfelt, M.R., Dodd, P., & Dodd, P. (2002). Radiation effects in SOI technologies. Proposed for publication in the IEEE Transactions on Nuclear Science, June 2003 issue.. https://www.osti.gov/biblio/917141

Schwank, J.R., Shaneyfelt, M.R., Meisenheimer, T.L., Dodd, P., & Dodd, P. (2002). Long-term reliability degradation of ultrathin dielectric films due to heavy-ion irradiation. IEEE Transactions on Nuclear Science, 49 I(6), pp. 3045-3050. 10.1109/TNS.2002.805389

Horn, K.M., Doyle, B.L., Walsh, D.S., Dodd, P., & Dodd, P. (2000). The Sandia Ion-Electron-Optical ''Radiation Microscope'' [Conference]. https://www.osti.gov/biblio/764047

Walsh, D.S., Dodd, P., Shaneyfelt, M.R., Schwank, J.R., & Schwank, J.R. (2000). Investigation of Body-Tie Effects on Ion Beam Induced Charge Collection in Silicon-On-Insulator FETs Using the Sandia Nuclear Microprobe [Conference]. https://www.osti.gov/biblio/763118

Dodd, P., Shaneyfelt, M.R., Walsh, D.S., Schwank, J.R., Hash, G.L., Jones, R.L., Draper, B.L., Winokur, P.S., & Winokur, P.S. (2000). Single-Event Upset and Snapback in Silicon-on-Insulator Devices and Integrated Circuits. IEEE Transactions on Nuclear Science. 10.1109/23.903749

Schwank, J.R., Witczak, S.C., Riewe, L.C., Shaneyfelt, M.R., Dodd, P., Jones, R.L., Draper, B.L., & Draper, B.L. (2000). Correlation Between Co-60 and X-Ray Radiation-Induced Charge Buildup in Silicon-on-Insulator Buried Oxides. IEEE Transactions on Nuclear Science. 10.1109/23.903750

Sexton, F.W., Walsh, D.S., Doyle, B.L., Dodd, P., & Dodd, P. (2000). Time resolved ion beam induced charge collection. 10.2172/754393

Dodd, P., Shaneyfelt, M.R., Schwank, J.R., Hash, G.L., Draper, B.L., Winokur, P.S., & Winokur, P.S. (2000). Single-event upset and snapback in silicon-on-insulator devices [Conference]. https://www.osti.gov/biblio/751467

Schwank, J.R., Shaneyfelt, M.R., Jones, R.L., Draper, B.L., Dodd, P., Witczak, S.C., Riewe, L.C., & Riewe, L.C. (2000). Correlation between Co-60 and x-ray exposures on radiation-induced charge buildup in silicon-on-insulator buried oxides [Conference]. https://www.osti.gov/biblio/751353

Nakakura, C.Y., Hetherington, D.L., Shaneyfelt, M.R., Dodd, P., & Dodd, P. (1999). Actively Biased p-Channel MOSFET Studied with Scanning Capacitance Microscopy [Conference]. https://www.osti.gov/biblio/14029

Schwank, J.R., Shaneyfelt, M.R., Dodd, P., & Dodd, P. (1999). New Insights into Fully-Depleted SOI Transistor Response During Total-Dose Irradiation [Conference]. https://www.osti.gov/biblio/14030

Dodd, P. (1999). Effectiveness of Body Ties for Imporving the Soft Error Tolerance of SOI Technologies [Conference]. https://www.osti.gov/biblio/8472

Dodd, P. (1998). Mechanisms and modeling of single-event upset [Conference]. https://www.osti.gov/biblio/1264

Dodd, P. (1998). Importance of ion energy on SEU in CMOS SRAMs [Conference]. 10.2172/645600

Dodd, P. (1997). Charge Collection and SEU from Angled Ion Strikes [Conference]. IEEE Transactions on Nuclear Science. https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=0031367159&origin=inward

Dodd, P. (1994). A critical examination of charge funneling and its impact on single-event upset in Si devices [Conference]. https://www.osti.gov/biblio/10131821