Vidana, A.I., Dodds, N.A., Nowlin, R.N., Wallace, T.M., Oldiges, P.J., Xiong, J., Kauppila, J.S., Massengill, L.W., Barnaby, H.J., & Barnaby, H.J. (2024). The Effects of Threshold Voltage and Number of Fins per Transistor on the TID Response of GF 12LP Technology. IEEE Transactions on Nuclear Science, 71(4), pp. 477-484. 10.1109/tns.2024.3359113
Publications
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Jump to search filtersPieper, N., Xiong, Y., Feeley, A., Pasternak, J., Dodds, N.A., Ball, D., Bharat, B., & Bharat, B. (2022). SRAM Multi-Cell Upset Vulnerability at the 5-nm FinFET Node [Conference Paper]. https://www.osti.gov/biblio/2004056
Teng, J.W., Nergui, D., Parameswaran, H., Sepulveda-Ramos, N.E., Tzintzarov, G.N., Mensah, Y., Cheon, C.D., Rao, S.G., Ringel, B., Gorchichko, M., Li, K., Ying, H., Ildefonso, A., Dodds, N.A., Nowlin, R.N., Zhang, E.X., Fleetwood, D.M., Cressler, J.D., & Cressler, J.D. (2022). Response of Integrated Silicon Microwave pin Diodes to X-Ray and Fast-Neutron Irradiation [Conference Presentation]. IEEE Transactions on Nuclear Science. 10.2172/1888707
Xiong, Y., Feeley, A., Pieper, N.J., Ball, D.R., Narasimham, B., Brockman, J., Dodds, N.A., Wender, S.A., Wen, S.J., Fung, R., Bhuva, B.L., & Bhuva, B.L. (2022). Soft Error Characterization of D-FFs at the 5-nm Bulk FinFET Technology for the Terrestrial Environment [Conference Paper]. IEEE International Reliability Physics Symposium Proceedings. 10.1109/IRPS48227.2022.9764523
Teng, J.W., Nergui, D., Sepulveda-Ramos, N.E., Tzintzarov, G.N., Mensah, Y., Cheon, C.D., Rao, S.G., Ringel, B., Gorchichko, M., Li, K., Ying, H., Ildefonso, A., Dodds, N.A., Nowlin, R.N., Zhang, E.X., Fleetwood, D.M., Cressler, J.D., & Cressler, J.D. (2021). Response of Integrated Silicon Microwave pin Diodes to X-ray and Fast-Neutron Irradiation. IEEE Transactions on Nuclear Science, 69(3). 10.1109/tns.2021.3119536
Lee, D.S., Allen, G., Cannon, M.J., Earnest, H.J., Thelen, P.M., Dodds, N.A., McCasland, J., Chen, C., & Chen, C. (2021). Preliminary Results from Heavy-Ion Irradiation of the Xilinx Versal ACAP [Conference Presentation]. 10.2172/1884175
Leonhardt, D., Cannon, M.J., Dodds, N.A., Fellows, M., Grzybowski, T., Haase, G.S., Lee, D.S., Leboeuf, T., Rice, W., & Rice, W. (2021). Impacts of Substrate Thinning on FPGA Performance and Reliability [Conference Presentation]. Conference Proceedings from the International Symposium for Testing and Failure Analysis. 10.2172/1897694
Dodds, N.A. (2020). Annual LDRD Report (FY2019). 10.2172/1593228
Goley, P.S., Dodds, N.A., Frounchi, M., Tzintzarov, G.N., Nowlin, R.N., Cressler, J.D., & Cressler, J.D. (2020). Response of Waveguide-Integrated Germanium-on-Silicon p-i-n Photodiodes to Neutron Displacement Damage. IEEE Transactions on Nuclear Science, 67(1), pp. 296-304. 10.1109/TNS.2019.2949584
Wang, P., Sternberg, A.L., Sierawski, B.D., Zhang, E.X., Tonigan, A.M., Brewer, R.M., Dodds, N.A., Vizkelethy, G., Jordan, S.L., Fleetwood, D.M., Reed, R.A., Schrimpf, R.D., & Schrimpf, R.D. (2019). Single Event Latchup Sensitive Volume Model for a 180-nm SRAM Test Structure [Conference Poster]. https://www.osti.gov/biblio/1641132
Goley, P., Dodds, N.A., Frounchi, M., Nowlin, R.N., Cressler, J., & Cressler, J. (2019). Response of Waveguide-Integrated Germanium-on-Silicon p-i-n Photodiodes to Neutron Displacement Damage [Conference Poster]. 10.1109/TNS.2019.2949584
Wang, P., Sternberg, A.L., Kozub, J.A., Zhang, E.X., Dodds, N.A., Jordan, S.L., Fleetwood, D.M., Reed, R.A., Schrimpf, R.D., & Schrimpf, R.D. (2018). Analysis of TPA Pulsed-Laser-Induced Single-Event Latchup Sensitive-Area. IEEE Transactions on Nuclear Science, 65(1), pp. 502-509. 10.1109/TNS.2017.2781199
Shaneyfelt, M.R., Dodds, N.A., & Dodds, N.A. (2017). Upsets in Erased Floating Gate Cells with High-Energy Protons. IEEE Transactions on Nuclear Science, 64(1), pp. 421-426. 10.1109/tns.2016.2636830
Dodds, N.A. (2015). External Review of LDRD Project 173134: Hardness Assurance for Low-Energy Proton-Induced Single Event Upsets [Presentation]. https://www.osti.gov/biblio/1340102
Khachatrian, A., Roche, N.J.H., Dodds, N.A., McMorrow, D., Warner, J.H., Buchner, S.P., Reed, R.A., & Reed, R.A. (2015). The Impact of Metal Line Reflections on Through-Wafer TPA SEE Testing [Conference Poster]. IEEE Transactions on Nuclear Science. 10.1109/TNS.2015.2500731
Dodds, N.A., Martinez, M., Dodd, P., Shaneyfelt, M.R., Sexton, F.W., Black, J.D., Lee, D.S., Swanson, S.E., Bhuva, B.L., Warren, K.M., Reed, R.A., Trippe, J., Sierawski, B.D., Weller, R.A., Mahatme, N., Gaspard, N.J., Assis, T., Austin, R., Massengill, L.W., … Puchner, H. (2015). The Contribution of Low-Energy Protons to the Total On-Orbit SEU Rate [Conference Poster]. IEEE Transactions on Nuclear Science. 10.1109/TNS.2015.2486763
Dodds, N.A., Martinez, M., Dodd, P., Shaneyfelt, M.R., Sexton, F.W., Black, J.D., Lee, D.S., Swanson, S.E., Bhuva, B.L., Warren, K.M., Reed, R.A., Trippe, J., Sierawski, B.D., Weller, R.A., Mahatme, N., Gaspard, N.J., Assis, T., Austin, R., Massengill, L.W., … Puchner, H. (2015). The Contribution of Low-Energy Protons to the Total On-Orbit SEU Rate [Conference Poster]. IEEE Transactions on Nuclear Science. https://doi.org/10.1109/TNS.2015.2486763
Dodds, N.A., Dodd, P., Shaneyfelt, M.R., Sexton, F.W., Martinez, M., Black, J.D., Marshall, P.W., Reed, R.A., McCurdy, M.W., Weller, R.A., Pellish, J.A., Rodbell, K.P., Gordon, M.S., & Gordon, M.S. (2015). New insights gained on mechanisms of low-energy proton-induced SEUs by minimizing energy straggle. IEEE Transactions on Nuclear Science, 62(6). 10.1109/TNS.2015.2488588
Dodds, N.A., Martinez, M., Dodd, P., Shaneyfelt, M.R., Sexton, F.W., Black, J.D., Lee, D.S., Swanson, S.E., Bhuva, B.L., Warren, K.M., Reed, R.A., Trippe, J., Sierawski, B.D., Weller, R.A., Mahatme, N., Gaspard, N.J., Assis, T.R., Austin, R., Weeden-Wright, S.L., … Puchner, H. (2015). Outstanding Conference Paper Award: 2015 IEEE Nuclear and Space Radiation Effects Conference. IEEE Transactions on Nuclear Science, 62(6). 10.1109/TNS.2015.2502501
Dodds, N.A., Martinez, M., Dodd, P., Shaneyfelt, M.R., Sexton, F.W., Black, J.D., Lee, D.S., Swanson, S.E., Bhuva, B.L., Warren, K.M., Reed, R.A., Trippe, J., Sierawski, B.D., Weller, R.A., Mahatme, N., Gaspard, N., Assis, T., Austin, R., Massengill, L.M., … Puchner, H. (2015). The contribution of low-energy protons to the total on-orbit SEU rate. IEEE Transactions on Nuclear Science, 62(6). 10.1109/TNS.2015.2486763
Dodds, N.A. (2015). Hardness Assurance for Low-Energy Proton-Induced Single-Event Effects: Final report for LDRD Project 173134. 10.2172/1221947
Dodds, N.A., Dodd, P., Shaneyfelt, M.R., Sexton, F.W., Martinez, M., Black, J.D., Marshall, P., Reed, R., McCurdy, M., Weller, R., Pellish, J., Rodbell, K., Gordon, M., & Gordon, M. (2015). New insights gained on mechanisms of low-energy proton-induced SEUs by minimizing energy straggle [Conference Poster]. 10.1109/TNS.2015.2488588
Dodds, N.A., Dodd, P., Shaneyfelt, M.R., Sexton, F.W., Martinez, M., Black, J.D., Marshall, P., Reed, R., McCurdy, M., Weller, R., Pellish, J., Rodbell, K., Gordon, M., & Gordon, M. (2015). New insights gained on mechanisms of low-energy proton-induced SEUs by minimizing energy straggle [Conference Poster]. https://doi.org/10.1109/TNS.2015.2488588
Black, J.D., Dodds, N.A., Dodd, P., Shaneyfelt, M.R., Martinez, M., Teifel, J., Pearson, S., Ma, K., & Ma, K. (2015). Single Event Effects Testing Results in Sandia National Laboratories Via Programmable ASIC Platforms [Conference Poster]. https://www.osti.gov/biblio/1258175
Dodds, N.A., Schwank, J.R., Shaneyfelt, M.R., Dodd, P., Doyle, B.L., Trinczek, M., Blackmore, E.W., Rodbell, K.P., Reed, R.A., Pellish, J.A., Label, K.A., Marshall, P.W., Swanson, S.E., Vizkelethy, G., van Deusen, S.B., Sexton, F.W., Martinez, M., & Martinez, M. (2014). Outstanding conference paper award 2014 IEEE nuclear and space radiation effects conference. IEEE Transactions on Nuclear Science, 61(6). 10.1109/TNS.2014.2372833
Dodds, N.A., Schwank, J.R., Shaneyfelt, M.R., Dodd, P., Doyle, B.L., Trinczek, M., Blackmore, E.W., Rodbell, K.P., Reed, R.A., Pellish, J.A., Label, K.A., Marshall, P.W., Swanson, S.E., Vizkelethy, G., van Deusen, S.B., Sexton, F.W., Martinez, M., & Martinez, M. (2014). Hardness assurance for proton direct ionization-induced SEEs using a high-energy proton beam. IEEE Transactions on Nuclear Science, 61(6). 10.1109/TNS.2014.2364953
Dodds, N.A., Schwank, J.R., Shaneyfelt, M.R., Dodd, P., Doyle, B.L., Trinczek, M.C., Blackmore, E.W., Rodbell, K.P., Reed, R.A., Pellish, J.A., Label, K.A., Marshall, P.W., Swanson, S.E., Vizkelethy, G., van Deusen, S.B., & van Deusen, S.B. (2014). Hardness assurance for proton direct ionization-induced SEEs using a high-energy proton beam [Presentation]. 10.1109/TNS.2014.2364953
Dodds, N.A., Schwank, J.R., Shaneyfelt, M.R., Dodd, P., Doyle, B.L., Trinczek, M., Blackmore, E.W., Rodbell, K.P., Reed, R.A., Pellish, J.A., Label, K.A., Marshall, P.W., Swanson, S.E., Vizkelethy, G., van Deusen, S.B., & van Deusen, S.B. (2014). Hardness assurance for proton direct ionization-induced SEEs using a high-energy proton beam [Conference Poster]. https://doi.org/10.1109/TNS.2014.2364953
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