Publications

Stork, C.L., Keenan, M.R., & Keenan, M.R. (2010). Advantages of clustering in the phase classification of hyperspectral materials images [Conference]. Microscopy and Microanalysis. https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=79451468967&origin=inward

Keenan, M.R. (2009). Exploiting spatial-domain simplicity in spectral image analysis. Surface and Interface Analysis, 41(2), pp. 79-87. https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=60349130423&origin=inward

Ohlhausen, J.A., Keenan, M.R., & Keenan, M.R. (2008). Methods for Reducing topographical Influences in 3D ToF-SIMS Spectral Images [Conference]. https://www.osti.gov/biblio/1142623

Keenan, M.R., van Benthem, M.H., & van Benthem, M.H. (2008). Haar Wavelet Compression and Empirical Variance Scaling of Large Hyperspectral Images [Conference]. https://www.osti.gov/biblio/1142408

Keenan, M.R. (2008). SVD + factor rotation : a powerful alternative to PCA in spectral image analysis [Conference]. https://www.osti.gov/biblio/970263

Powell, A.J., Davis, R.W., Lane, T., Lane, P., Keenan, M.R., van Benthem, M.H., & van Benthem, M.H. (2008). Hyperspectral imaging of oil producing microalgae under thermal and nutritional stress. https://doi.org/10.2172/946556

Keenan, M.R., Davis, R.W., Sinclair, M.B., & Sinclair, M.B. (2008). Multivariate analysis of large images obtained with a hyperspectral imaging confocal microscope [Conference]. https://www.osti.gov/biblio/947267

Keenan, M.R. (2008). Multivariate Analysis of Hyperspectral Images: A Tutorial [Conference]. https://www.osti.gov/biblio/1143087

Van Benthem, M.H., Keenan, M.R., Davis, R.W., Liu, P., Jones, H.D.T., Haaland, D.M., Sinclair, M.B., Brasier, A.R., & Brasier, A.R. (2008). Trilinear analysis of images obtained with a hyperspectral imaging confocal microscope. Journal of Chemometrics, 22(9), pp. 491-499. https://doi.org/10.1002/cem.1165

Windig, W., Keenan, M.R., Wise, B.M., & Wise, B.M. (2008). The effects of pre-processing of image data on self-modeling image analysis. Journal of Chemometrics, 22(9), pp. 500-509. https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=55449133777&origin=inward

van Benthem, M.H., Keenan, M.R., & Keenan, M.R. (2008). Tucker1 model algorithms for fast solutions to large PARAFAC problems. Journal of Chemometrics, 22(5), pp. 345-354. https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=53649088497&origin=inward

Rodriguez, M.A., Nagasubramanian, G., Keenan, M.R., & Keenan, M.R. (2007). In situ X-ray diffraction analysis of (CF_x)_n batteries: signal extraction by multivariate analysis. Journal of Applied Crystallography, 40(6), pp. 1097-1104. https://doi.org/10.1107/S0021889807042045

Keenan, M.R. (2007). A Fast Method for Computing Principal Components Analysis on Large Data Sets [Conference]. https://www.osti.gov/biblio/1147173

Keenan, M.R., Ohlhausen, J.A., & Ohlhausen, J.A. (2007). Detector Dead-time Effects in the Multivariate Analysis of ToF-SIMS Spectral Images [Conference]. https://www.osti.gov/biblio/1146655

Ohlhausen, J.A., Celina, M.C., Keenan, M.R., & Keenan, M.R. (2007). The Analysis of Oxidation Profiles in Elastomers Using ToF-SIMS [Conference]. https://www.osti.gov/biblio/1146710

Keenan, M.R., Ohlhausen, J.A., Kotula, P.G., & Kotula, P.G. (2007). Retrospective and Multivariate Statistical Analysis of Three-Spatial-Dimension ToF-SIMS Data Sets [Conference]. https://www.osti.gov/biblio/1146693

Keenan, M.R. (2007). The effects of pre-processing of image data on self-modeling image analysis [Conference]. https://www.osti.gov/biblio/1141497

Keenan, M.R., Ohlhausen, J.A., Kotula, P.G., & Kotula, P.G. (2007). Multivariate Statistical Analysis of Non-Mass Selected ToF-SIMS Data. Analytical Chemistry. https://www.osti.gov/biblio/1146549

Keenan, M.R., Ohlhausen, J.A., Kotula, P.G., & Kotula, P.G. (2007). Mitigating Dead Time Effects during Multivariate Analysis of ToF-SIMS Spectral Images. Surface and Interface Analysis. https://www.osti.gov/biblio/1147556

Keenan, M.R., Ohlhausen, J.A., Kotula, P.G., & Kotula, P.G. (2007). Multivariate Statistical Analysis of Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) Raw Data Files [Conference]. https://www.osti.gov/biblio/1147222

Rodriguez, M.A., Keenan, M.R., Nagasubramanian, G., & Nagasubramanian, G. (2007). In-situ XRD Analysis of (CFx)n Batteries: Signal Extraction by Multivariate Analysis [Conference]. https://doi.org/10.1154/1.2754524

Ohlhausen, J.A., Keenan, M.R., & Keenan, M.R. (2007). ToF-SIMS Analysis of Oxidation Profiles in Elastomers [Conference]. https://www.osti.gov/biblio/1148291

Keenan, M.R., Kotula, P.G., & Kotula, P.G. (2006). Recent Developments in Spectral Image Analysis [Conference]. https://www.osti.gov/biblio/1264724

Kotula, P.G., Keenan, M.R., & Keenan, M.R. (2005). Automated multivariate statistical analysis of SEM and STEM x-ray spectral images [Conference]. https://www.osti.gov/biblio/886889

Kotula, P.G., Keenan, M.R., & Keenan, M.R. (2005). Automated analysis of X-ray, ion and electron spectral images [Conference]. https://www.osti.gov/biblio/969576

Keenan, M.R., Kotula, P.G., & Kotula, P.G. (2005). Recent developments in (semi-) automated spectral image analysis [Conference]. https://www.osti.gov/biblio/967822

Keenan, M.R. (2005). Multivariate analysis of Poissonian hyperspectral images [Conference]. https://www.osti.gov/biblio/969094

Keenan, M.R., Ohlhausen, J.A., Kotula, P.G., & Kotula, P.G. (2005). Complete analysis of ToF-SIMS spectral images in a research & development analytical laboratory [Conference]. https://www.osti.gov/biblio/1145141

Smentkowski, V.S., Keenan, M.R., Ohlhausen, J.A., Kotula, P.G., & Kotula, P.G. (2005). Multivariate statistical analysis of concatenated time-of-flight secondary ion mass spectrometry spectral images. Complete description of the sample with one analysis. Analytical Chemistry, 77(5), pp. 1530-1536. https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=14744269437&origin=inward

Stork, C.L., Keenan, M.R., Haaland, D.M., & Haaland, D.M. (2005). Spectral unmixing of remotely sensed thermal infrared hyperspectral images using multivariate curve resolution [Conference]. https://www.osti.gov/biblio/948696

Kotula, P.G., Keenan, M.R., Michael, J.R., & Michael, J.R. (2005). Tomographic spectral imaging: analysis of localized corrosion [Conference]. https://www.osti.gov/biblio/988530

Kotula, P.G., Keenan, M.R., & Keenan, M.R. (2005). Multivariate analysis of X-ray, ion and electron spectral images: from surface to 3D materials characterization [Conference]. https://www.osti.gov/biblio/988536

Keenan, M.R., Kotula, P.G., & Kotula, P.G. (2005). Spatial simplicity as an optimization criterion in multivariate image analysis [Conference]. https://www.osti.gov/biblio/950956

Melgaard, D.K., Haaland, D.M., Keenan, M.R., Kotula, P.G., & Kotula, P.G. (2005). Coerced convergence of multivariate curve resolution [Conference]. https://www.osti.gov/biblio/947258

Ohlhausen, J.A., Tallant, D.R., Kent, M.S., Keenan, M.R., Hankins, M.G., & Hankins, M.G. (2005). Combined surface analytical methods to characterize degradative processes in anti-stiction films in MEMS devices [Conference]. https://www.osti.gov/biblio/947830

Kotula, P.G., Keenan, M.R., Goldstein, J., & Goldstein, J. (2005). STEM x-ray and EEL spectral imaging : comprehensive qualitative and quantitative microanalysis [Conference]. https://www.osti.gov/biblio/986609

Kotula, P.G., Keenan, M.R., Michael, J.R., & Michael, J.R. (2005). Tomographic spectral imaging : analysis of corrosion and brazing [Conference]. https://www.osti.gov/biblio/986594

Stork, C.L., Keenan, M.R., Haaland, D.M., & Haaland, D.M. (2004). Multivariate curve resolution for the analysis of remotely sensed thermal infrared hyperspectral images [Conference]. Proceedings of SPIE - The International Society for Optical Engineering. https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=15844368313&origin=inward

Keenan, M.R. (2004). Maximum likelihood principal component analysis of ToF-SIMS spectral images [Conference]. https://www.osti.gov/biblio/1144041

Keenan, M.R. (2004). Maximum likelihood principal component analysis of a ToF-SIMS spectral image. Proposed for publication in Journal of Vacuum Science and Technology.. https://www.osti.gov/biblio/964160

Ohlhausen, J.A., Kotula, P.G., Keenan, M.R., & Keenan, M.R. (2004). Cluster primary ion bombardment facilitates ToF-SIMS analysis of biological/tissue samples [Conference]. https://www.osti.gov/biblio/957301

Keenan, M.R. (2004). Fast algorithm for the solution of large-scale non-negativity constrained least squares problems. Proposed for publication in Journal of Chemometrics.. https://doi.org/10.1002/cem.889

Ohlhausen, J.A., Keenan, M.R., Kotula, P.G., & Kotula, P.G. (2004). Use of multivariate statistics in TOF-SIMS : AXSIA (Automated eXpert Spectrum Image Analysis) [Conference]. https://www.osti.gov/biblio/957234

Davidson, G.S., Sinclair, M.B., Thomas, E.V., Werner-Washburne, M., Martin, S., Boyack, K.W., Wylie, B.N., Haaland, D.M., Timlin, J.A., Keenan, M.R., & Keenan, M.R. (2003). High throughput instruments, methods, and informatics for systems biology. https://doi.org/10.2172/918232

Ohlhausen, J.A., Kotula, P.G., Keenan, M.R., & Keenan, M.R. (2003). Multivariate statistical analysis of time-of-flight secondary ion mass spectrometry images : looking beyond the obvious [Conference]. https://www.osti.gov/biblio/1005074

Ohlhausen, J.A., Keenan, M.R., Kotula, P.G., Peebles, D., & Peebles, D. (2003). Multivariate statistical analysis of time-of-flight secondary ion mass spectrometry images using AXSIA [Conference]. https://www.osti.gov/biblio/1004385

Keenan, M.R., Kotula, P.G., & Kotula, P.G. (2003). Optimal scaling of TOF-SIMS spectrum-images prior to multivariate statistical analysis [Conference]. https://www.osti.gov/biblio/1002027

Keenan, M.R., Kotula, P.G., & Kotula, P.G. (2003). Accounting for Poisson noise in the multivariate analysis of spectrum-images. Proposed for publication in Surface and Interface Analysis.. https://www.osti.gov/biblio/926789

Haaland, D.M., Martin, L.E., van Benthem, M.H., Keenan, M.R., Melgaard, D.K., Thomas, E.V., & Thomas, E.V. (2002). Improved Materials Aging Diagnostics and Mechanisms through 2D Hyperspectral Imaging Methods and Algorithms. https://doi.org/10.2172/800773

Kotula, P.G., Keenan, M.R., & Keenan, M.R. (2000). SEM/EDX spectrum imaging and statistical analysis of a metal/ceramic braze [Conference]. Materials Research Society Symposium - Proceedings. https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=0035214319&origin=inward