Publications

Cook, E.A., Hodges, W., Jarzembski, A., Delmas, W., Bahr, M.N., Piontkowski, Z.T., Treweek, B., Deitz, J.I., McDonald, A., Antiporda, L., Lu, P., Yates, L., & Yates, L. (2024). Modeling Heat Flow Across a Compression Bonded GaN-Diamond Interface for Vertical Power Devices [Conference Presentation]. 10.2172/2563921

Hodges, W., Deitz, J.I., Jauregui, L., Perry, D.L., Boro, J.R., Duree, J.M., & Duree, J.M. (2024). Temperature Dependent Electron Emission in Focused Ion Beam Microscopes [Conference Poster]. 10.2172/2563907

Jarzembski, A., Hodges, W., McDonald, A., Bahr, M.N., Delmas, W., Lu, P., Deitz, J.I., Piontkowski, Z.T., Yates, L., & Yates, L. (2024). Optical Interrogation of Subsurface Nanogap Thermal Transport [Conference Presentation]. 10.2172/2563897

Polonsky, A.T., Deitz, J.I., Lim, H., Noell, P., Melia, M.A., Johnson, K.L., Renner, P., Escarcega-Herrera, K., Jauregui, L., Cummings, D.P., & Cummings, D.P. (2024). Applications of 3D EBSD for understanding complex microstructures [Conference Presentation]. 10.2172/2585001

Deitz, J.I., Jauregui, L., Ruggles, T., Polonsky, A.T., Trotter, D., & Trotter, D. (2024). Cross-sectional Electron Channeling Contrast Imaging [Conference Presentation]. 10.2172/2540349

Delmas, W., Jarzembski, A., Bahr, M.N., McDonald, A., Hodges, W., Lu, P., Deitz, J.I., Ziade, E., Piontkowski, Z.T., Yates, L., & Yates, L. (2024). Thermal Transport and Mechanical Stress Mapping of a Compression Bonded GaN/Diamond Interface for Vertical Power Devices [Conference Poster]. ACS Applied Materials and Interfaces. 10.2172/2563890

Polonsky, A.T., Kotula, P.G., Deitz, J.I., Perry, D.L., Cummings, D.P., Boro, J.R., Ellis, D., & Ellis, D. (2023). Automated Workflow Development for 3D Chemical Mapping via TriBeam Tomography [Conference Paper]. 10.1093/micmic/ozad067.1021

Deitz, J.I., Hodges, W., Ruggles, T., Jauregui, L., Perry, D.L., Williard, J.N., Lam, M.N., Rosenberg, S., Boro, J., & Boro, J. (2023). Focused Ion Beam Nano-thermometry [Conference Presentation]. 10.2172/2430568

Polonsky, A.T., Kotula, P.G., Deitz, J.I., Perry, D.L., Cummings, D.P., Boro, J.R., Ellis, D., & Ellis, D. (2023). Automated Workflow Development for 3D Characterization via TriBeam Tomography [Conference Presentation]. 10.2172/2430553

Deitz, J.I., Polonsky, A.T., Ruggles, T., Harrison, K.L., McBrayer, J.D., Jungjohann, K., Michael, J., Boettcher, S., & Boettcher, S. (2023). Prospects of Full-scale Device Characterization via Ultra Short Pulsed Lasers with Dual Focused Ion Beams [Conference Presentation]. 10.2172/2430976

Polonsky, A.T., Noell, P., Deitz, J.I., Lim, H., Emery, J.M., Johnson, K.L., & Johnson, K.L. (2023). Understanding Deformation Behavior in an Al Alloy via Multimodal 3D Characterization [Conference Presentation]. 10.2172/2431669

Hodges, W., Deitz, J.I., Ruggles, T., Rosenberg, S.G., Boro, J.R., Fowler, J.E., Perry, D.L., Lam, M.N., Williard, J.N., Jauregui, L., Wixom, R.R., & Wixom, R.R. (2023). Plasma Focused Ion Beam Nanothermometry. 10.2172/2432030

Deitz, J.I., Dewers, T., Heath, J.E., Polonsky, A.T., Perry, D.L., & Perry, D.L. (2022). Capturing Carbonation: Understanding Kinetic Complexities through a New Era of Electron Microscopy. 10.2172/1893239

Deitz, J.I., Ruggles, T., Lee, S.R., Allerman, A., Barry Carter, C., Michael, J.R., & Michael, J.R. (2022). Electron Channeling Contrast Imaging (ECCI) for Rapid Characterization of Compound Semiconductors [Conference Presentation]. 10.2172/2005415

Deitz, J.I., Perry, D.L., Polonsky, A.T., Ruggles, T., Jungjohann, K., McBrayer, J.D., Harrison, K.L., Michael, J.R., & Michael, J.R. (2022). Opportunities andChallenges of Ultra Short Pulsed Lasers with Dual Focused Ion Beams for Characterization of Full-Scale Electronic Devices [Conference Presentation]. 10.2172/2004228

Deitz, J.I., Sugar, J.D., Allerman, A., Kiefer, B., Baldonado, N., Crawford, M., & Crawford, M. (2022). Correlative Electron Energy-Loss Spectroscopy Bandgap Mapping and DFT Modeling in AlGaN Diodes [Conference Presentation]. 10.2172/2004224

Kotula, P.G., Watt, J., Mook, W.M., Vitale, S., Perry, D.L., Cummings, D.P., Deitz, J.I., Walraven, J., Michael, J.R., & Michael, J.R. (2022). Focused ion beam preparation of low melting point metals: Lessons learned from Pb-Sn and Indium [Conference Presentation]. 10.2172/2004141

Addamane, S.J., Hendrickson, A.T., Rotter, T., Padmanabha Iyer, P., Kotula, P.G., Deitz, J.I., Klem, J.F., Brener, I., Balakrishnan, G., & Balakrishnan, G. (2022). GaAs(Sb) nanostructures formed by arsenic-induced in-situ etching of III-Sb surfaces [Conference Presentation]. 10.2172/2003892

Deitz, J.I., Kiefer, B., Baldonado, N., & Baldonado, N. (2022). Defect Mediated and Diode Degradation in Wide Band-Gap AlGaN Electronics [Conference Presentation]. 10.2172/2003234

Rice, A., Tait, C., Lee, S.R., Deitz, J.I., Rodriguez, M.A., Pan, W., Ohta, T., Alliman, D., Peake, G., Sandoval, A., Valdez, N.R., Sharps, P., & Sharps, P. (2021). Heteroepitaxy of Dirac semimetal Cd3As2 by MOCVD [Conference Presentation]. 10.2172/1906634

Deitz, J.I., Baldonado, N., Kiefer, B., & Kiefer, B. (2021). Material Properties of Widegap AlGaNAlGaNfor use in Power Electronicsfor use in Power Electronics [Conference Presentation]. 10.2172/1891072

Deitz, J.I., Kamin, J., Kiefer, B., & Kiefer, B. (2021). Engineering Defects in AlGaN for Advanced Information Processing [Conference Presentation]. 10.2172/1891075

Deitz, J.I., Baldonado, N., Kiefer, B., & Kiefer, B. (2021). Widegap AlGaN for use as Transistors in Power Electronics [Conference Presentation]. 10.2172/1891962

Deitz, J.I., Kamin, J., Kiefer, B., & Kiefer, B. (2021). Vacancy and Doping Defects in AlGaN for Spin Qubit Design [Conference Presentation]. 10.2172/1891961

Klein, B., Song, Y., Ranga, P., Zhang, Y., Feng, Z., Huang, H., Santia, M.D., Badescu, S.C., Gonzalez-Valle, C.U., Perez, C., Ferri, K., Lavelle, R.M., Snyder, D.W., Deitz, J.I., Baca, A.G., Maria, J., Ramos-Alvarado, B., Hwang, J., Zhao, H., … Choi, S. (2021). Thermal Conductivity of β-Phase Ga₂O₃ and (Al_xGa_1–x)₂O₃ Heteroepitaxial Thin Films. ACS Applied Materials and Interfaces, 13(32). 10.1021/acsami.1c08506

Klem, J.F., Olesberg, J.T., Hawkins, S.D., Weiner, P.H., Deitz, J.I., Kadlec, C.N., Shaner, E.A., Coon, W., & Coon, W. (2021). Extended-Short-Wavelength Infrared Detectors using Novel Quaternary III-V Alloys on InAs [Conference Proceeding]. https://www.osti.gov/biblio/1883478

Klem, J.F., Olesberg, J.T., Hawkins, S.D., Weiner, ., Deitz, J.I., Kadlec, ., Shaner, E.A., Coon, W., & Coon, W. (2021). Extended-Short-Wavelength Infrared Detectors using Novel Quaternary III-V Alloys on InAs [Conference Presentation]. 10.2172/1884202

Deitz, J.I., Ruggles, T., Noell, P., Susan, D.F., Michael, J.R., & Michael, J.R. (2021). Failure Analysis in FeCo Magnetic Alloys through Electron Channeling Contrast Imaging Defect Characterization [Conference Presentation]. 10.2172/1888124

Wheeler-Tait, C., Lee, S.R., Deitz, J.I., Rodriguez, M.A., Alliman, D., Gunning, B.P., Peake, G., Sandoval, A., Valdez, N.R., Sharps, P., & Sharps, P. (2021). Heteroepitaxy of Dirac semimetal Cd₃As₂ by metal-organic chemical-vapor deposition. Journal of Crystal Growth, 572. https://doi.org/10.1016/j.jcrysgro.2021.126230

Ruggles, T., Deitz, J.I., Allerman, A., Michael, J.R., Carter, C.B., & Carter, C.B. (2021). Defect analysis of star defects in GaN thin films grown on HVPE GaN substrates [Conference Presentation]. 10.2172/1882091

Klem, J.F., Olesberg, J.T., Hawkins, S.D., Weiner, P., Deitz, J.I., Kadlec, C., Shaner, E.A., Coon, W., & Coon, W. (2021). Extended-short-wavelength infrared AlInAsSb and InPAsSb detectors on InAs [Conference Paper]. 10.1117/12.2585213

McClary, S.A., Long, D.M., Hahn, N.T., Ruggles, T., Deitz, J.I., Jungjohann, K.L., Zavadil, K.R., & Zavadil, K.R. (2020). Stabilization of Electrodeposited Calcium: The Impact of Morphology Interphases and Impurities [Conference Poster]. https://www.osti.gov/biblio/1821283