Hembree, C., Wilcox, I.Z., Martinez, M., Musson, L.C., Black, D.A., McDonald, J.K., McLain, M., & McLain, M. (2018). Radiation and Self Heating Effects in Hetero-Junction Bipolar Transistors [Conference Poster]. https://www.osti.gov/biblio/1806979
Publications
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Jump to search filtersMcLain, M., McDonald, J.K., Hembree, C., Hartman, F., Harper-Slaboszewicz, V., Sheridan, T.J., & Sheridan, T.J. (2017). Understanding the Implications of a LINAC?s Microstructure on Transient Photocurrent Models [Conference Poster]. https://www.osti.gov/biblio/1492216
McLain, M., McDonald, J.K., Hartman, F., Sheridan, T.J., Dodd, P., Shaneyfelt, M.R., Hembree, C., Black, D.A., Weingartner, T.A., & Weingartner, T.A. (2017). Understanding the Implications of a LINAC’s Microstructure on Devices and Photocurrent Models. IEEE Transactions on Nuclear Science, 65(1). 10.1109/TNS.2017.2764799
McLain, M., McDonald, J.K., Hembree, C., Sheridan, T.J., Weingartner, T.A., Dodd, P., Shaneyfelt, M.R., Hartman, F., Black, D.A., & Black, D.A. (2017). Understanding the Implications of a LINAC?s Microstructure on Photocurrent Modeling [Conference Poster]. https://www.osti.gov/biblio/1509653
McLain, M., McDonald, J.K., Serrano, J.D., Foulk, J.W., Hjalmarson, H.P., & Hjalmarson, H.P. (2017). Temperature Effects on the Total Ionizing Dose Response of TaOx-based Memristive Bit Cells [Conference Poster]. 10.1109/RADECS.2017.8696164
McLain, M., McDonald, J.K., Serrano, J.D., Foulk, J.W., Hughart, D.R., Marinella, M., Hanson, D.J., & Hanson, D.J. (2017). Temperature Effects on the Total Ionizing Dose Response of TaOx-based Memristive Bit Cells [Conference Poster]. https://doi.org/10.1109/RADECS.2017.8696164
Bielejec, E.S., Hembree, C., McDonald, J.K., Wampler, W.R., Sheridan, T.J., Griffin, P.J., & Griffin, P.J. (2016). Test Simulation of Neutron Damage to Electronic Components using Accelerator Facilities [Conference Poster]. https://www.osti.gov/biblio/1413581
McLain, M., Sheridan, T.J., Hjalmarson, H.P., Mickel, P.R., Hanson, D.J., McDonald, J.K., Hughart, D.R., Marinella, M., & Marinella, M. (2014). The susceptibility of TaOx-based memristors to high dose rate ionizing radiation and total ionizing dose. IEEE Transactions on Nuclear Science, 61(6). 10.1109/TNS.2014.2364521
King, D.B., Fleming, R.M., Bielejec, E.S., McDonald, J.K., Vizkelethy, G., & Vizkelethy, G. (2014). Test simulation of neutron damage to electronic components using accelerator facilities [Presentation]. https://doi.org/10.1016/j.nimb.2015.08.026
King, D.B., Fleming, R.M., Bielejec, E.S., McDonald, J.K., Vizkelethy, G., & Vizkelethy, G. (2014). Test simulation of neutron damage to electronic components using accelerator facilities [Conference Poster]. 10.1016/j.nimb.2015.08.026
McLain, M., Sheridan, T.J., Hjalmarson, H.P., Mickel, P.R., Hanson, D.J., McDonald, J.K., Hughart, D.R., Marinella, M., & Marinella, M. (2014). The Susceptibility of TaOx-based Memristive Devices to Continuous and Pulsed Ionizing Radiation [Presentation]. https://www.osti.gov/biblio/1496553
Bielejec, E.S., McDonald, J.K., Vizkelethy, G., Fleming, R.M., & Fleming, R.M. (2014). Test simulation of neutron damage to electronic components using accelerator facilities [Conference]. 10.1016/j.nimb.2015.08.026
McDonald, J.K., Sheridan, T.J., Chantler, G., Mickel, P.R., Hanson, D.J., Hughart, D.R., Marinella, M., & Marinella, M. (2014). The Susceptibility of TaOx-based Memristive Devices to Continuous and Pulsed Ionizing Radiation [Conference]. https://www.osti.gov/biblio/1140677
Fleming, R.M., Vizkelethy, G., Bielejec, E.S., King, D.B., McDonald, J.K., & McDonald, J.K. (2013). Revisiting Recombination Current in Electron Ion and Neutron Damaged GaAs Diodes [Presentation]. https://www.osti.gov/biblio/1649687
Bielejec, E.S., Knapp, J., Vizkelethy, G., McDonald, J.K., Horn, K.M., & Horn, K.M. (2010). Enhanced Photocurrent Annealing in a Combined Ion and Electron Irradiation [Conference]. https://www.osti.gov/biblio/1124394
Griffin, P.J., Bielejec, E.S., Hembree, C., McDonald, J.K., Sheridan, T.J., Vizkelethy, G., Harper-Slaboszewicz, V., & Harper-Slaboszewicz, V. (2009). Test Simulation of Neutron Damage to Electronic Components using Accelerator Facilities [Conference]. https://www.osti.gov/biblio/1142290
Bielejec, E.S., Hembree, C., McDonald, J.K., Wampler, W.R., Fleming, R.M., Vizkelethy, G., Sheridan, T.J., Harper-Slaboszewicz, V., Griffin, P.J., & Griffin, P.J. (2009). Test Simulation of Neutron Damage to Electronic Components and Circuits using Accelerator Facilities [Conference]. https://www.osti.gov/biblio/1141802
McDonald, J.K., Sheridan, T.J., King, D.B., Hembree, C., & Hembree, C. (2009). Effects of Neutron and Electron Beam Pre-irradiation on Photocurrent [Conference]. https://www.osti.gov/biblio/1142470
Bielejec, E.S., Griffin, P.J., McDonald, J.K., Vizkelethy, G., Cooper, P.J., Fleming, R.M., & Fleming, R.M. (2007). Variability in Damage Equivalence Metrics between Heavy Ions and Neutrons [Conference]. https://www.osti.gov/biblio/1147475
Griffin, P.J., Ramirez, D., King, D.B., Ginn, W., Harper-Slaboszewicz, V., Luker, S.M., McDonald, J.K., & McDonald, J.K. (2007). QASPR Program At Sandia National Laboratories [Conference]. https://www.osti.gov/biblio/1147856
McDonald, J.K. (2003). Effect of process variations and ambient temperature on electron mobility at the SiO[2]/4H-SiC interface. Proposed for publication in IEEE Transactions on Electron Devices.. https://www.osti.gov/biblio/923573
21 Results