Publications

Bielejec, E.S., Abraham, J.B.S., Perry, D.L., & Perry, D.L. (2019). Optimization of SiV Defect Yield in Diamond Substrates. 10.2172/1562424

Bielejec, E.S., Pacheco, J.L., Abraham, J.B.S., Aguirre, B.A., Camacho, R., Lilly, M., Luhman, D.R., Carroll, M.S., & Carroll, M.S. (2016). Direct Write Nanofabrication for Quantum Computing in Silicon and Color Centers in Diamond [Conference Poster]. https://www.osti.gov/biblio/1420793

Abraham, J.B.S., Bielejec, E.S., Camacho, R., Aguirre, B.A., Pacheco, J.L., & Pacheco, J.L. (2016). Deterministic Fabrication of Diamond Color Centers for Engineered Quantum Devices [Conference Poster]. https://www.osti.gov/biblio/1399336

Bielejec, E.S., Abraham, J.B.S., Aguirre, B.A., Pacheco, J.L., Vizkelethy, G., Camacho, R., & Camacho, R. (2016). Single Ion Detection for Engineered Quantum Systems in Diamond [Conference Poster]. https://www.osti.gov/biblio/1526835

Doyle, B.L., Auden, E.C., Bielejec, E.S., Abraham, J.B.S., Vizkelethy, G., & Vizkelethy, G. (2016). The anatomy of the minority carrier - atomic cluster interaction in semiconductors. 10.2172/1562622

Bielejec, E.S., Pacheco, J.L., Abraham, J.B.S., Camacho, R., Lilly, M., Luhman, D.R., Carroll, M.S., & Carroll, M.S. (2016). Top-down Direct Write Nanofabrication of Donors in Silicon and Defect Centers in Diamond [Conference Poster]. https://www.osti.gov/biblio/1389910

Abraham, J.B.S., Pacheco, J.L., Aguirre, B.A., Vizkelethy, G., Bielejec, E.S., & Bielejec, E.S. (2016). Fabrication and characterization of a co-planar detector in diamond for low energy single ion implantation. Applied Physics Letters, 109. 10.1063/1.4960968

Bielejec, E.S., Pacheco, J.L., Abraham, J.B.S., Camacho, R., Lilly, M., Luhman, D.R., Carroll, M.S., & Carroll, M.S. (2016). Top-down Direct Write Nanofabrication of Donors in Silicon and Defect Centers in Diamond [Conference Poster]. https://www.osti.gov/biblio/1505023

Bielejec, E.S., Lilly, M., Pacheco, J.L., Abraham, J.B.S., Baczewski, A.D., Jacobson, N.T., Muller, R.P., Luhman, D.R., Carroll, M.S., & Carroll, M.S. (2016). Fabrictaion of Counted Donor Devices using Top-Down Ion Implantation [Conference Poster]. https://www.osti.gov/biblio/1371826

Abraham, J.B.S. (2016). Measurement at the limit: single ion detection for engineered quantum systems and the critical Casimir effect at the Helium-4 superfluid transition [Presentation]. https://www.osti.gov/biblio/1368471

Abraham, J.B.S. (2016). Measurement at the limit: single ion detection for engineered quantum systems and the critical Casimir effect at the He-4 superfluid transition [Presentation]. https://www.osti.gov/biblio/1367780

Abraham, J.B.S., Camacho, R., Bielejec, E.S., & Bielejec, E.S. (2016). SiV yield optimization via counted ion implantation [Conference Poster]. https://www.osti.gov/biblio/1368501

Abraham, J.B.S., Aguirre, B.A., Pacheco, J.L., Vizkelethy, G., Bielejec, E.S., & Bielejec, E.S. (2016). Fabrication and characterization of a co-planar detector in diamond for low energy single ion implantation [Presentation]. 10.1063/1.4960968

Bielejec, E.S., Pacheco, J.L., Abraham, J.B.S., Aguirre, B.A., Singh, M., Camacho, R., Lilly, M., Luhman, D.R., Carroll, M.S., & Carroll, M.S. (2016). Direct Write Nanofabrication for Quantum Computing in Silicon and Color Centers in Diamond [Conference Poster]. https://www.osti.gov/biblio/1368795

Abraham, J.B.S., Pacheco, J.L., Aguirre, B.A., Camacho, R., Bielejec, E.S., & Bielejec, E.S. (2016). Single ion detection in diamond: A path for deterministic color center creation [Conference Poster]. https://www.osti.gov/biblio/1347068

Sharma, P.A., Abraham, J.B.S., Bielejec, E.S., Pacheco, J.L., Singh, M., Pluym, T., Dominguez, J., Carroll, M.S., & Carroll, M.S. (2016). Photon-based Characterization of Single Ion Geiger Mode Avalanche Detectors: Experiments and Simulations [Conference Poster]. https://www.osti.gov/biblio/1346312

Auden, E.C., Pacheco, J.L., Bielejec, E.S., Vizkelethy, G., Abraham, J.B.S., Doyle, B.L., & Doyle, B.L. (2015). Sub-Micron Resolution of Localized Ion Beam Induced Charge Reduction in Silicon Detectors Damaged by Heavy Ions. IEEE Transactions on Nuclear Science, 62(6), pp. 2919-2925. 10.1109/tns.2015.2495160

Abraham, J.B.S., Aguirre, B.A., Pacheco, J.L., Camacho, R., Bielejec, E.S., & Bielejec, E.S. (2015). Sub-surface single ion detection in diamond: A path for deterministic color center creation [Conference Poster]. https://www.osti.gov/biblio/1331934

Abraham, J.B.S., Sharma, P.A., Pacheco, J.L., Bielejec, E.S., Carroll, M.S., & Carroll, M.S. (2015). Optimization of avalanche photodiodes for the detection of subsurface single ion implants in Silicon [Conference Poster]. https://www.osti.gov/biblio/1328400

Aguirre, B.A., Abraham, J.B.S., Pacheco, J.L., Ward, D.R., Bielejec, E.S., Camacho, R., & Camacho, R. (2015). Fabrication of Single Ion Detector in Diamond [Conference Poster]. https://www.osti.gov/biblio/1328114

Auden, E.C., Pacheco, J.L., Doyle, B.L., Bielejec, E.S., Vizkelethy, G., Abraham, J.B.S., & Abraham, J.B.S. (2015). Sub-Micron Resolution of Localized Ion Beam Induced Charge Reduction in Silicon Detectors Damaged by Heavy Ions [Conference Poster]. 10.1109/TNS.2015.2495160

Auden, E.C., Doyle, B.L., Bielejec, E.S., Pacheco, J.L., Vizkelethy, G., Abraham, J.B.S., & Abraham, J.B.S. (2015). Charge Collection Imaging of Single Collision Cascades Using Nanobeam IBIC [Conference Poster]. https://www.osti.gov/biblio/1257156