Publications

Dodds, N.A., Schwank, J.R., Shaneyfelt, M.R., Dodd, P., Doyle, B.L., Trinczek, M., Blackmore, E.W., Rodbell, K.P., Reed, R.A., Pellish, J.A., Label, K.A., Marshall, P.W., Swanson, S.E., Vizkelethy, G., van Deusen, S.B., Sexton, F.W., Martinez, M., & Martinez, M. (2014). Outstanding conference paper award 2014 IEEE nuclear and space radiation effects conference. IEEE Transactions on Nuclear Science, 61(6). 10.1109/TNS.2014.2372833

Dodds, N.A., Schwank, J.R., Shaneyfelt, M.R., Dodd, P., Doyle, B.L., Trinczek, M., Blackmore, E.W., Rodbell, K.P., Reed, R.A., Pellish, J.A., Label, K.A., Marshall, P.W., Swanson, S.E., Vizkelethy, G., van Deusen, S.B., Sexton, F.W., Martinez, M., & Martinez, M. (2014). Hardness assurance for proton direct ionization-induced SEEs using a high-energy proton beam. IEEE Transactions on Nuclear Science, 61(6). 10.1109/TNS.2014.2364953

Dodds, N.A., Schwank, J.R., Shaneyfelt, M.R., Dodd, P., Doyle, B.L., Trinczek, M., Blackmore, E.W., Rodbell, K.P., Reed, R.A., Pellish, J.A., Label, K.A., Marshall, P.W., Swanson, S.E., Vizkelethy, G., van Deusen, S.B., & van Deusen, S.B. (2014). Hardness assurance for proton direct ionization-induced SEEs using a high-energy proton beam [Conference Poster]. https://doi.org/10.1109/TNS.2014.2364953

Dodds, N.A., Schwank, J.R., Shaneyfelt, M.R., Dodd, P., Doyle, B.L., Trinczek, M.C., Blackmore, E.W., Rodbell, K.P., Reed, R.A., Pellish, J.A., Label, K.A., Marshall, P.W., Swanson, S.E., Vizkelethy, G., van Deusen, S.B., & van Deusen, S.B. (2014). Hardness assurance for proton direct ionization-induced SEEs using a high-energy proton beam [Presentation]. 10.1109/TNS.2014.2364953

Schwank, J.R., Shaneyfelt, M.R., Dodd, P., Doyle, B.L., Swanson, S.E., van Deusen, S.B., & van Deusen, S.B. (2014). Hardness assurance for proton direct ionization-induced SEEs using a high-energy proton beam [Conference]. https://doi.org/10.1109/TNS.2014.2364953

Schwank, J.R., Shaneyfelt, M.R., & Shaneyfelt, M.R. (2014). SEGR in SiO${}_2$ –Si$_3$ N$_4$ Stacks. IEEE Transactions on Nuclear Science, 61(4), pp. 1902-1908. https://doi.org/10.1109/TNS.2014.2303493

Schwank, J.R., Shaneyfelt, M.R., Dodd, P., & Dodd, P. (2013). Radiation hardness assurance testing of microelectronic devices and integrated circuits: Test guideline for proton and heavy ion single-event effects [Presentation]. IEEE Transactions on Nuclear Science. 10.1109/TNS.2013.2261317

Schwank, J.R., Shaneyfelt, M.R., Dodd, P., & Dodd, P. (2013). Radiation hardness assurance testing of microelectronic devices and integrated circuits: Radiation environments, physical mechanisms, and foundations for hardness assurance [Presentation]. IEEE Transactions on Nuclear Science. 10.1109/TNS.2013.2254722

Schwank, J.R. (2012). Statement of Work [Presentation]. https://www.osti.gov/biblio/1649741

Shaneyfelt, M.R., Schwank, J.R., Dodd, P., Stevens, J., Vizkelethy, G., Swanson, S.E., & Swanson, S.E. (2012). SOI substrate removal for SEE characterization: Techniques and applications [Conference]. IEEE Transactions on Nuclear Science. https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=84865375220&origin=inward

Olsson, R.H., Schwank, J.R., & Schwank, J.R. (2012). Radiation Testing of Aluminum Nitride Microresonators [Conference]. https://www.osti.gov/biblio/1078817

Schwank, J.R., Shaneyfelt, M.R., Ferlet-Cavrois, V., Dodd, P., Blackmore, E.W., Pellish, J.A., Rodbell, K.P., Heidel, D.F., Marshall, P.W., LaBel, K.A., Gouker, P.M., Tam, N., Wong, R., Wen, S.-J., Reed, R.A., Dalton, S.M., Swanson, S.E., & Swanson, S.E. (2011). Hardness assurance testing for proton direct ionization effects [Conference]. Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS. https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=84860210709&origin=inward

Shaneyfelt, M.R., Schwank, J.R., Dodd, P., Stevens, J., Swanson, S.E., & Swanson, S.E. (2011). SOI Substrate Removal for SEE Characterization and Recent Results [Presentation]. https://www.osti.gov/biblio/1106398

Schwank, J.R. (2011). Influence of Beam Conditions and Energy for SEE Testing. IEEE Transactions on Nuclear Science (RADECS edition). https://www.osti.gov/biblio/1109389

Schwank, J.R., Shaneyfelt, M.R., Dodd, P., Swanson, S.E., & Swanson, S.E. (2011). Hardness assurance testing for proton direct ionization effects. European Space Agency, [Special Publication] ESA SP. https://doi.org/10.1109/RADECS.2011.6131454

Schwank, J.R., Shaneyfelt, M.R., & Shaneyfelt, M.R. (2011). Radiation Effects in 3D Integrated SOI SRAM Circuits. IEEE Transactions on Nuclear Science, Dec. 2011. https://www.osti.gov/biblio/1106916

Dodd, P., Shaneyfelt, M.R., Flores, R.S., Schwank, J.R., Hill, T.A., Swanson, S.E., & Swanson, S.E. (2011). Single-Event Upsets and Distributions in Radiation-Hardened CMOS Flip-Flop Logic Chains. IEEE Transactions on Nuclear Science, 58(6). https://doi.org/10.1109/TNS.2011.2169683

Schwank, J.R. (2011). 32 and 45 nm Radiation-Hardened-By-Design (RHBD) SOI Latches. IEEE Transactions on Nuclear Science, Dec. 2011. https://www.osti.gov/biblio/1106589

Dodd, P., Shaneyfelt, M.R., Schwank, J.R., & Schwank, J.R. (2011). Characterization of the Two-Photon Absorption Carrier Generation Region in Bulk Silicon Diodes. IEEE Transactions on Nuclear Science (Dec. 2011). https://www.osti.gov/biblio/1106707

Schwank, J.R., Shaneyfelt, M.R., Dodd, P., Swanson, S.E., & Swanson, S.E. (2011). Comparison of Single and Two-Photon Absorption for Laser Characterization of Single-Event Upsets in SOI SRAMs. IEEE Transactions on Nuclear Science, Dec. 2011, 58(6). https://doi.org/10.1109/TNS.2011.2171006

Schwank, J.R., Shaneyfelt, M.R., Dodd, P., & Dodd, P. (2011). Proton Irradiation Effects in Semiconductor Devices--S1328 [Presentation]. https://www.osti.gov/biblio/1661823

Schwank, J.R. (2011). Low-Energy Proton Testing Using Cyclotron Sources. IEEE Transactions on Nuclear Science, Dec. 2011. https://www.osti.gov/biblio/1109292

Schwank, J.R., Shaneyfelt, M.R., & Shaneyfelt, M.R. (2011). Proton-induced Upsets in 41-nm NAND Floating Gate Cells [Conference]. https://www.osti.gov/biblio/1109275

Schwank, J.R. (2011). Influence of beam conditions and energy for SEE testing [Conference]. https://www.osti.gov/biblio/1108232

Schwank, J.R. (2011). Low-Energy Proton Testing Using Cyclotron Sources [Conference]. https://www.osti.gov/biblio/1109300