Publications

Spear, M., Wallace, T., Wilson, D.E., Solano, J., Irumva, G., Esqueda, I.S., Barnaby, H.J., Clark, L., Brunhaver, J., Turowski, M., Mikkola, E., Hughart, D.R., Young, J.M., Manuel, J., Agarwal, S., Vaandrager, B.L., Vizkelethy, G., Gutierrez, A., Trippe, J., … Marinella, M. (2022). Single Event Upset and Total Ionizing Dose Response of 12LP FinFET Digital Circuits [Conference Poster]. 10.2172/2004078

Spear, M., Wallace, T., Wilson, D.E., Solano, J., Irumva, G., Esqueda, I.S., Barnaby, H.J., Clark, L., Brunhaver, J., Turowski, M., Mikkola, E., Hughart, D.R., Young, J.M., Manuel, J., Agarwal, S., Vaandrager, B.L., Vizkelethy, G., King, M.P., Marinella, M., & Marinella, M. (2022). Single Event Upset and Total Ionizing Dose Response of 12LP FinFET Digital Circuits [Conference Proceeding]. https://www.osti.gov/biblio/2004036

Neuendank, J.X., Wilson, D.X., Barnaby, H.J.X., Clark, L.X., Brunhaver, J.X., Manuel, J., Young, J.M., Vizkelethy, G., Bielejec, E.S., & Bielejec, E.S. (2022). Single Event Upset Response of 12L FinFET Digital Circuits [Conference Presentation]. 10.2172/2003206

Wilson, D.E., Spear, M., Wallace, T., Irumva, G., Neuendank, J., Sanchez, I., Barnaby, H., Privat, A., Turowski, M., Mikkola, E., Hughart, D.R., Manuel, J., Vizkelethy, G., King, M.P., Marinella, M., & Marinella, M. (2022). Total ionizing dose and single event effects on 12-nm bulk FinFETs [Conference Presentation]. 10.2172/2001871

Clark, L., Duvnjak, A., Brunhaver, J., Agarwal, S., Manuel, J., Cannon, M.J., Marinella, M., & Marinella, M. (2021). A Soft-Error Hardened by Design MicroprocessorImplemented in Bulk 12-nm FINFET CMOS [Conference Presentation]. 10.2172/1899521

Young, J.M., Manuel, J., Vizkelethy, G., Bielejec, E.S., & Bielejec, E.S. (2021). Exploration of synergistic behavior of operational amplifiers in combined ion and electron environments [Conference Poster]. 10.2172/1882325

Bennett, C., Xiao, T.P., Leonard, T., Alamdar, M., Manuel, J., Jacobs-Gedrim, R.B., Xue, L., Vizkelethy, G., Bielejec, E.S., Incorvia, J.A., Marinella, M., & Marinella, M. (2021). Investigation of Total Ionizing Dose on Domain-wall Magnetic Tunnel Junction Logic Devices (Presentation) [Conference Presentation]. 10.2172/1874876

Young, J.M., Manuel, J., Bielejec, E.S., Vizkelethy, G., Belianinov, A.A., & Belianinov, A.A. (2021). Exploration of synergistic behavior of operational amplifiers in combined ion and electron environment [Conference Poster]. 10.2172/1872306

Xiao, T.P., Bennett, C., Mancoff, F.B., Manuel, J., Hughart, D.R., Jacobs-Gedrim, R.B., Bielejec, E.S., Vizkelethy, G., Sun, J., Aggarwal, S., Arghavani, R., Marinella, M., & Marinella, M. (2021). Heavy-Ion-Induced Displacement Damage Effects in Magnetic Tunnel Junctions with Perpendicular Anisotropy. IEEE Transactions on Nuclear Science, 68(5), pp. 581-587. 10.1109/tns.2021.3057348

Montes, J., Patoary, N., Zhao, Y., Turowski, M., Young, J.M., Vaandrager, B.L., Manuel, J., Bielejec, E.S., Sanchez Esqueda, I., & Sanchez Esqueda, I. (2021). Proton-induced damage in β-Ga2O3 Schottky Barrier Diodes [Conference Paper]. https://www.osti.gov/biblio/1869231

Privat, A., Barnaby, H., Spear, M., Esposito, M.G., Manuel, J., Clark, L., Brunhaver, J., Duvnjak, A., Jokai, R., Holbert, K.E., McLain, M., Marinella, M., King, M.P., & King, M.P. (2020). Evidence of Interface Trap Build-up Irradiated 14nm Bulk FinFET Technologies [Conference Presentation]. 10.2172/1831025

Xiao, T.P., Bennett, C., Mancoff, F., Manuel, J., Hughart, D.R., Jacobs-Gedrim, R.B., Bielejec, E.S., Vizkelethy, G., Sun, J., Aggarwal, S., Arghavani, R., Marinella, M., & Marinella, M. (2020). Heavy-ion-induced displacement damage effects in magnetic tunnel junctions with perpendicular anisotropy [Conference Presentation]. 10.2172/1831024

Privat, A., Barnaby, H.J., Spear, M., Esposito, M.G., Manuel, J., Clark, L., Brunhaver, J.S., Duvnjak, A., Jokai, R., Holbert, K.E., McLain, M., Marinella, M., King, M.P., & King, M.P. (2020). Evidence of Interface trap build-up irradiated 14nm Bulk FinFET Technologies [Conference Paper]. https://www.osti.gov/biblio/1825615

Esposito, M.G., Manuel, J., Vizkelethy, G., Garland, D., Bielejec, E.S., Xiao, T.P., Dickerson, J., McLain, M., King, M.P., Marinella, M., Ashby, D.S., Talin, A.A., Brunhaver, J.S., Privat, A., Barnaby, H., & Barnaby, H. (2020). Investigating Heavy Ion Effects on 14nm-Process FinFETs: Displacement Damage Versus Total Ionizing Dose [Conference Paper]. https://www.osti.gov/biblio/1824924

Aguirre, B.A., King, J., Manuel, J., Vizkelethy, G., Bielejec, E.S., Griffin, P.J., & Griffin, P.J. (2020). Response of GaN-Based Semiconductor Devices to Ion and Gamma Irradiation. 10.2172/1668935

Esposito, M.G., Manuel, J., Bielejec, E.S., Dickerson, J., Kerber, P., King, M.P., Talin, A.A., Ashby, D.S., McLain, M., Marinella, M., & Marinella, M. (2020). Heavy Ion Displacement Damage Effects in 14nm-Process FinFETs [Conference Poster]. https://www.osti.gov/biblio/1765528

Vizkelethy, G., Bielejec, E.S., Aguirre, B.A., Manuel, J., Seidel, P.A., Persaud, A., Ji, Q., Geulig, L.D., Schenkel, T., & Schenkel, T. (2019). Effect of high/low flux He ion irradiation on defects in silicon photodiodes [Conference Poster]. https://www.osti.gov/biblio/1643005

Manuel, J., Vizkelethy, G., Doyle, B.L., Bielejec, E.S., & Bielejec, E.S. (2019). Ion irradiation and analysis of SiC Schottky diodes [Conference Poster]. https://www.osti.gov/biblio/1643638

Vizkelethy, G., Bielejec, E.S., Aguirre, B.A., Manuel, J., Seidel, P.A., Persaud, A., Ji, Q., Geulig, L.D., Schenkel, T., & Schenkel, T. (2019). Effect of high intensity ns length ion irradiation on defect creation in silicon photodiodes [Conference Poster]. https://www.osti.gov/biblio/1642718