Publications

Eydenberg, M.S., Batsch-Smith, L., Bice, C., Blakely, L., Bynum, M., Boukouvala, F., Castillo, A., Haddad, J., Hart, W.E., Jalving, J., Kilwein, Z., Laird, C., Skolfield, J.K., & Skolfield, J.K. (2022). Resilience Enhancements through Deep Learning Yields. https://doi.org/10.2172/1890044

Bice, C. (2020). Automatic CVE Scanner [Presentation]. https://www.osti.gov/biblio/1810040