Reaz, M., Tonigan, A.M., Li, K., Smith, M.B., Rony, M.W., Gorchichko, M., O'Hara, A., Linten, D., Mitard, J., Fang, J., Zhang, E.X., Alles, M.L., Weller, R., Fleetwood, D.M., Reed, R.S., Pantelides, S.T., Weeden-Wright, S.L., Schrimpf, R.D., & Schrimpf, R.D. (2021). 3-D Full-Band Monte Carlo Simulation of Hot-Electron Energy Distributions in Gate-All-Around Si Nanowire MOSFETs. IEEE Transactions on Electron Devices, 68(5). 10.1109/ted.2021.3068328