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Microelectronics & microsystems

Zeiss ORION NanoFab

During 2015, Sandia was selected to receive four advanced analysis tools that came out of the Intelligence Advanced Research Projects Activity Circuit Analysis Tool (CAT) program. The semiconductor industry continues to scale with Moore’s law, producing components at the 22 nm technology node and below that challenge most commercial analysis capabilities. The CAT program enabled industry partnerships in advanced R&D in the area of failure analysis. The rapid planning, preparation, and successful installation of these tools at Sandia has already enabled new research in areas like silicon sample preparation and high-resolution imaging and is addressing a variety of mission area needs. DSA, Cyber