Ann Campbell
Director Champion
Director Champion
Biography
Dr. Ann Campbell is the Director for Cyber Strategy and Resource Coordination at Sandia National Laboratories in Albuquerque, New Mexico. She is responsible for ensuring coordination, maturation and implementation of the Labs’ Cyber Strategy, which includes advanced capability development as well as maturing our workforce, infrastructure and policies. Ann is leading development of the Digital Assurance for High Consequence Systems Mission Campaign, which focuses on creating the technical foundations needed to allow effective, efficient assessment and management of digital risk for national security systems and incorporating digital assurance into systems engineering workflows.
Prior to her current position, Ann was the Director of Weapons Design & Assurance with responsibility for engineering design and development of a wide range of non-nuclear components for US nuclear weapons systems, including nuclear surety devices, firing systems, interconnects, and high-reliability electronic products. Her organization also developed electrical testers, flight test subsystems, and telemetry systems.
Ann’s previous leadership assignments (all at Sandia) include: Director of National Security Programs (NSP) Program Management; Acting Director for Electronic Systems; Director of Systems Assessment & Research and the Proliferation Assessment Program; Director of Information Solutions and Services; Senior Manager Deputy for Cyber Research in the Chief Technology Office; Acting Director for the Labs’ Cyber Security Strategic Thrust; and Senior Manager for Assessment Technologies in the Information Systems and Analysis Center.
Ann has served on several National Academies committees focused on technology surprise, including the TIGER Standing Committee, the Committee on Science and Technology for Defense Warning, and the Committee on Capability Surprise on U.S. Naval Forces. She holds a B. S. degree in Materials Engineering from Rensselaer Polytechnic Institute and M. S. and Ph. D. degrees in Applied Physics from Harvard University and is an MIT Seminar XXI Fellow (2009 – 2010).
Publications
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Thornton, A.L., Meeks, K.D., Keese, D.L., Holswade, S.C., Peery, J.S., Chavez, J.M., Campbell, A.N., & Campbell, A.N. (2014). 810 Lobby Permanent Display Panels – Programmatic Review Completed [Presentation]. https://www.osti.gov/biblio/1682619 Publication ID: 36850
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Hart, W.E., Campbell, A.N., & Campbell, A.N. (2013). Sandia’s Data Science Research Challenge [Conference]. https://www.osti.gov/biblio/1083686 Publication ID: 34029
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Campbell, A.N. (2011). Cyber Innovation at Sandia [Conference]. https://www.osti.gov/biblio/1120303 Publication ID: 23112
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Adams, D.P., Vasile, M.J., Benavides, G.L., Campbell, A.N., & Campbell, A.N. (2001). Micromilling of metal alloys with focused ion beam-fabricated tools. Precision Engineering, 25(2), pp. 107-113. https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=0035311827&origin=inward Publication ID: 924
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Campbell, A.N., Hembree, C., Tangyunyong, P., Jessing, J.R., Soden, J., & Soden, J. (2000). Focused ion beam damage to MOS integrated circuits [Conference]. https://www.osti.gov/biblio/756102 Publication ID: 480
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Adams, D.P., Benavides, G.L., Campbell, A.N., & Campbell, A.N. (1999). Micromilling of Metal Alloys with Focused Ion Beam-Fabricated Tools. Journal of Microelectromechanical Systems. https://www.osti.gov/biblio/14823 Publication ID: 85148
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Campbell, A.N. (1999). Focused Ion Beam Induced Effects on MOS Transistor Parameters [Conference]. https://www.osti.gov/biblio/9677 Publication ID: 84248
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Campbell, A.N. (1999). Die Backside FIB Preparation for Identification and Characterization of Metal Voids [Conference]. https://www.osti.gov/biblio/9678 Publication ID: 84252
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Campbell, A.N. (1997). Electrical and chemical characterization of FIB-deposited insulators [Conference]. https://doi.org/10.2172/532558 Publication ID: 93152
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Campbell, A.N. (1995). Electrical biasing and voltage contrast imaging in a focused ion beam system [Conference]. https://www.osti.gov/biblio/106667 Publication ID: 87292
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Campbell, A.N. (1995). Non-invasive current and voltage imaging techniques for integrated circuits using scanning probe microscopy. Final report, LDRD Project FY93 and FY94. https://doi.org/10.2172/93674 Publication ID: 86696
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Campbell, A.N. (1993). Magnetic force microscopy/current contrast imaging: A new technique for internal current probing of ICs [Conference]. https://www.osti.gov/biblio/10186192 Publication ID: 143464
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Campbell, A.N. (1992). Internal current probing of integrated circuits using magnetic force microscopy [Conference]. https://www.osti.gov/biblio/10131700 Publication ID: 139520
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Campbell, A.N. (1991). Case history: Failure analysis of a CMOS SRAM with an intermittent open contact [Conference]. https://www.osti.gov/biblio/5335040 Publication ID: 132448