Publications

Journal of Verification, Validation and Uncertainty Quantification

Campione, Salvatore; Stephens, John A.; Martin, Nevin; Eckert, Aubrey C.; Warne, Larry K.; Huerta, Jose G.; Pfeiffer, Robert A.; Jones, Adam J.

High-quality factor resonant cavities are challenging structures to model in electromagnetics owing to their large sensitivity to minute parameter changes. Therefore, uncertainty quantification (UQ) strategies are pivotal to understanding key parameters affecting the cavity response. We discuss here some of these strategies focusing on shielding effectiveness (SE) properties of a canonical slotted cylindrical cavity that will be used to develop credibility evidence in support of predictions made using computational simulations for this application.

Jones, Adam J.; Campione, Salvatore; Stephens, John A.; Eckert, Aubrey C.; Warne, Larry K.; Huerta, Jose G.; Pfeiffer, Robert A.

Abstract not provided.

Campione, Salvatore; Stephens, John A.; Martin, Nevin S.; Eckert, Aubrey C.; Warne, Larry K.; Huerta, Jose G.; Pfeiffer, Robert A.; Jones, Adam J.

Abstract not provided.

Bauer, Todd B.; Jones, Adam J.; Lentine, Anthony L.; Mudrick, John M.; Okandan, Murat O.; Rodrigues, Arun

The last two decades have seen an explosion in worldwide R&D, enabling fundamentally new capabilities while at the same time changing the international technology landscape. The advent of technologies for continued miniaturization and electronics feature size reduction, and for architectural innovations, will have many technical, economic, and national security implications. It is important to anticipate possible microelectronics development directions and their implications on US national interests. This report forecasts and assesses trends and directions for several potentially disruptive microfabrication capabilities and device architectures that may emerge in the next 5-10 years.