Publications

Anderson, E.M., Campbell, D.M., Ivie, J.A., Schmucker, S.W., Lu, P., Gao, X., Tracy, L.A., Arghavani, R., Bussmann, E., Baczewski, A.D., Lu, T.M., Katzenmeyer, A.M., Scrymgeour, D., Misra, S., & Misra, S. (2021). Development of low thermal budget Si epitaxy and high-k/ metal gate stack for atomically precise electronic devices [Conference Presentation]. 10.2172/1894018

Schmucker, S.W., Frederick, E., Campbell, Q., Ivie, J.A., Anderson, E.M., Dwyer, K., Baczewski, A.D., Wang, G.T., Butera, R., Misra, S., & Misra, S. (2021). Atomic Precision Advanced Manufacturing and Lessons for Area-Selective Deposition [Conference Presentation]. 10.2172/1877517

Katzenmeyer, A.M., Dmitrovic, S., Baczewski, A.D., Campbell, Q., Bussmann, E., Lu, T.M., Anderson, E.M., Schmucker, S.W., Ivie, J.A., Campbell, D.M., Ward, D.R., Scrymgeour, D., Wang, G.T., Misra, S., & Misra, S. (2021). Photothermal alternative to device fabrication using atomic precision advanced manufacturing techniques. Journal of Micro/Nanopatterning, Materials and Metrology, 20(1). 10.1117/1.jmm.20.1.014901

Anderson, E.M., Campbell, D.M., Maurer, L.N., Baczewski, A.D., Marshall, M., Lu, T.M., Lu, P., Tracy, L.A., Schmucker, S.W., Ward, D.R., Misra, S., & Misra, S. (2020). Low thermal budget high-k/metal surface gate for buried donor-based devices. JPhys Materials, 3(3). https://doi.org/10.1088/2515-7639/ab953b

Kadlec, C.N., Goldflam, M., Bielejec, E.S., Kadlec, E., Webster, P., Anderson, E.M., Schultz, P.A., Hawkins, S.D., Klem, J.F., Kim, J.K., Shaner, E.A., & Shaner, E.A. (2019). Characterization of Induced Defects in InAsSb from Proton Irradiation using in-situ Lifetime measurements [Conference Poster]. https://www.osti.gov/biblio/1641689

Ward, D.R., Anderson, E.M., Maurer, L., Campbell, D.M., Marshall, M., Tracy, L.A., Baczewski, A.D., Lu, T.M., Misra, S., & Misra, S. (2019). Surface gated atomically precise single electron Islands [Conference Poster]. https://www.osti.gov/biblio/1641453

Shaner, E.A., Kadlec, C.N., Goldflam, M., Bielejec, E.S., Webster, P., Anderson, E.M., Hawkins, S.D., Olson, B., Kadlec, E., Kim, J.K., Schultz, P.A., Tauke-Pedretti, A., Coon, W., Fortune, T., Klem, J.F., & Klem, J.F. (2018). Microwave Based Lifetime Measurements and Analysis for Detector Materials [Conference Poster]. https://www.osti.gov/biblio/1592044

Kadlec, C.N., Bielejec, E.S., Goldflam, M., Kadlec, E.A., Anderson, E.M., Shaner, E.A., Kim, J.K., Schultz, P.A., Klem, J.F., Hawkins, S.D., & Hawkins, S.D. (2018). In-situ Annealing Studies of Radiation Induced Defects in InAs/InAsSb Type-II Superlattices under Ion Irradiation [Conference Poster]. https://www.osti.gov/biblio/1575172