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Hoekstra, R.J., Hennigan, G.L., Pawlowski, R., Phipps, E.T., Shadid, J.N., Musson, L.C., Smith, T.M., & Keiter, E.R. (2008). High Fidelity Simulation for Semiconductor Electrical Devices in Extreme Environments [Conference]. https://www.osti.gov/biblio/1142722

Results 8526–8550 of 9,998
Results 8526–8550 of 9,998