Characterization of Induced Defects in InAsSb from Proton Irradiation using in-situ Lifetime measurements Kadlec, Clark N.; Goldflam, Michael G.; Bielejec, Edward S.; Kadlec, Emil A.; Webster, Preston T.; Anderson, Evan M.; Schultz, Peter A.; Hawkins, Samuel D.; Klem, John F.; Kim, Jin K.; Shaner, Eric A. Abstract not provided. More Details TYPE Conference Poster YEAR 2019 OSTI
Microwave Based Lifetime Measurements and Analysis for Detector Materials Shaner, Eric A.; Kadlec, Clark N.; Goldflam, Michael G.; Bielejec, Edward S.; Webster, Preston T.; Anderson, Evan M.; Hawkins, Samuel D.; Olson, Ben O.; Kadlec, Emil A.; Kim, Jin K.; Schultz, Peter A.; Tauke-Pedretti, Anna; Coon, Wesley T.; Fortune, Torben R.; Klem, John F. Abstract not provided. More Details TYPE Conference Poster YEAR 2018 OSTI