Characterization of Induced Defects in InAsSb from Proton Irradiation using in-situ Lifetime measurements Kadlec, Clark N.; Goldflam, Michael G.; Bielejec, Edward S.; Kadlec, Emil A.; Webster, Preston T.; Anderson, Evan M.; Schultz, Peter A.; Hawkins, Samuel D.; Klem, John F.; Kim, Jin K.; Shaner, Eric A. Abstract not provided. More Details TYPE Conference Poster YEAR 2019 OSTI
Microwave Based Lifetime Measurements and Analysis for Detector Materials Shaner, Eric A.; Kadlec, Clark N.; Goldflam, Michael G.; Bielejec, Edward S.; Webster, Preston T.; Anderson, Evan M.; Hawkins, Samuel D.; Olson, Ben O.; Kadlec, Emil A.; Kim, Jin K.; Schultz, Peter A.; Tauke-Pedretti, Anna; Coon, Wesley T.; Fortune, Torben R.; Klem, John F. Abstract not provided. More Details TYPE Conference Poster YEAR 2018 OSTI
Radiation Induced Defects in InAs/InAsSb Type II Superlattices Characterized with Time-resolved Microwave Reflectance and DFT Schultz, Peter A.; Kadlec, Clark N.; Bielejec, Edward S.; Goldflam, Michael G.; Hawkins, Samuel D.; Kim, Jin K.; Klem, John F.; Moussa, Jonathan E.; Shaner, Eric A. Abstract not provided. More Details TYPE Conference Poster YEAR 2018 OSTI
In-situ Annealing Studies of Radiation Induced Defects in InAs/InAsSb Type-II Superlattices under Ion Irradiation Kadlec, Clark N.; Bielejec, Edward S.; Goldflam, Michael G.; Kadlec, Emil A.; Anderson, Evan M.; Shaner, Eric A.; Kim, Jin K.; Schultz, Peter A.; Klem, John F.; Hawkins, Samuel D. Abstract not provided. More Details TYPE Conference Poster YEAR 2018 OSTI
Effects of 4.5 MeV and 63 MeV Proton Irradiation on Carrier Lifetime of InAs/InAsSb Type-II Superlattices Kadlec, Clark N.; Kadlec, Emil A.; Goldflam, Michael G.; Bielejec, Edward S.; Kim, Jin K.; Olson, B.V.O.; Klem, John F.; Hawkins, Samuel D.; Moussa, Jonathan E.; Schultz, Peter A.; Morath, C.PM.; Jenkins, G.D.J.; Cowan, V.M.C.; Shaner, Eric A. Abstract not provided. More Details TYPE Conference Poster YEAR 2017 OSTIDOI