Micro-fabricated ion traps for Quantum Information Processing; Highlights and lessons learned Maunz, Peter L.; Blume-Kohout, Robin J.; Blain, Matthew G.; Benito, Francisco B.; Berry, Christopher W.; Clark, Craig R.; Clark, Susan M.; Colombo, Anthony P.; Dagel, Amber L.; Fortier, Kevin M.; Haltli, Raymond A.; Heller, Edwin J.; Lobser, Daniel L.; Mizrahi, Jonathan M.; Nielsen, Erik N.; Resnick, Paul J.; Rembetski, John F.; Rudinger, Kenneth M.; Scrymgeour, David S.; Sterk, Jonathan D.; Tabakov, Boyan T.; Tigges, Chris P.; Van Der Wall, Jay W.; Stick, Daniel L. Abstract not provided. More Details TYPE Conference Poster YEAR 2016 OSTI
Hyper-Accurate Gate Set Tomography Rudinger, Kenneth M.; Blume-Kohout, Robin J.; Nielsen, Erik N.; Mizrahi, Jonathan A.; Clark, Craig R.; Sterk, Jonathan D.; Maunz, Peter L. Abstract not provided. More Details TYPE Conference Poster YEAR 2015 OSTI
Hyper-accuracy and Error-Scaling in Gate Set Tomography Rudinger, Kenneth M.; Blume-Kohout, Robin J.; Gamble, John K.; Nielsen, Erik N.; Mizrahi, Jonathan A.; Clark, Craig R.; Sterk, Jonathan D.; Maunz, Peter L. Abstract not provided. More Details TYPE Conference Poster YEAR 2015 OSTI